Bozena Kaminska

Clinton K. Landrock, Bozena Kaminska, Yindar Chuo, Badr Omrane, Jeydmer Aristizabal: Thin Flexible Polymer-based Energy Systems for Low-power Wireless Monitoring Devices. BIODEVICES 2012: 239-244

Yindar Chuo, Badr Omrane, Clinton K. Landrock, Jeydmer Aristizabal, Donna Hohertz, Sasan Vosoogh-Grayli, Bozena Kaminska: Powering the Future: Organic Solar Cells with Polymer Energy Storage. IEEE Design & Test of Computers 28(6): 32-40 (2011)

Jeydmer Aristizabal, Badr Omrane, Clinton K. Landrock, Sasan Vosoogh-Grayli, Yindar Chuo, Jasbir N. Patel, Bozena Kaminska, Carlo Menon: Tungsten Lamps as an Affordable Light Source for Testing of Photovoltaic Cells. J. Electronic Testing 27(3): 403-410 (2011)

Yindar Chuo, Kouhyar Tavakolian, Bozena Kaminska: Evaluation of a Novel Integrated Sensor System for Synchronous Measurement of Cardiac Vibrations and Cardiac Potentials. J. Medical Systems 35(4): 445-455 (2011)

Farzad Khosrow-Khavar, Marcin Marzencki, Kouhyar Tavakolian, Behrad Kajbafzadeh, Bozena Kaminska, Carlo Menon: Diastolic Timed Vibrator: Applying Direct Vibration in Diastole to Patients with Acute Coronary Ischemia during the Pre-hospitalization Phase. AIS 2011: 355-365

Marcin Marzencki, Farzad Khosrow-Khavar, Syed Ammar Zaidi, Carlo Menon, Bozena Kaminska: Diastolic Timed Vibrations for Pre-hospitalization Treatment of Myocardial Infarction. BIOSIGNALS 2011: 405-408

Clinton K. Landrock, Badr Omrane, Yindar Chuo, Bozena Kaminska, Jeydmer Aristizabal: 2D and 3D integration with organic and silicon electronics. DATE 2011: 899-904

Camille Jaggernauth, Benny Hung, Philip Lin, Yindar Chuo, Bozena Kaminska: Test firmware architecture for a flexible wireless physiological multi-sensor. SMC 2011: 1140-1144

Michal Dabrowski, Jakub Mieczkowski, Jakub Lenart, Bozena Kaminska: From Global Expression Patterns to Gene Co-regulation in Brain Pathologies. ERCIM News 2010(82): 28-29 (2010)

Yindar Chuo, Bozena Kaminska: Testing Multilayer Flexible Wireless Multisensor Platforms. J. Electronic Testing 26(1): 127-138 (2010)

Yindar Chuo, Marcin Marzencki, Benny Hung, Camille Jaggernauth, Kouhyar Tavakolian, Philip Lin, Bozena Kaminska: Mechanically Flexible Wireless Multisensor Platform for Human Physical Activity and Vitals Monitoring. IEEE Trans. Biomed. Circuits and Systems 4(5): 281-294 (2010)

Clinton K. Landrock, Bozena Kaminska: High temperature polymer capacitors for aerospace applications. DATE 2010: 1349-1352

Bozena Kaminska, I. L. McWalter: Special session 9B: New topic test facilities and infrastructure in Canada. VTS 2010: 281

Pawel Gburzynski, Bozena Kaminska, Ashikur Rahman: On Reliable Transmission of Data over Simple Wireless Channels. Journal Comp. Netw. and Communic. 2009 (2009)

Bozena Kaminska, Krishnendu Chakrabarty: Guest Editorial - Selected Papers from the IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW), 2008. IEEE Trans. Biomed. Circuits and Systems 3(4): 193-194 (2009)

Yindar Chuo, Bozena Kaminska: Sensor Layer of a Multiparameter Single-Point Integrated System. IEEE Trans. Biomed. Circuits and Systems 3(4): 229-240 (2009)

Martin Omaña, Marcin Marzencki, Roberto Specchia, Cecilia Metra, Bozena Kaminska: Concurrent Detection of Faults Affecting Energy Harvesting Circuits of Self-Powered Wearable Sensors. DFT 2009: 127-135

Shahrzad Jalali Mazlouman, Alireza Mahanfar, Bozena Kaminska: Mid-range wireless energy transfer using inductive resonance for wireless sensors. ICCD 2009: 517-522

Bozena Kaminska, Marcelo Lubaszewski, José Machado da Silva: Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop. VLSI Design 2008 (2008)

Yindar Chuo, Bozena Kaminska: Multiparameter Single Locus Integrated Multilayer Polymer Microsensor System. BIODEVICES (1) 2008: 36-43

Pawel Gburzynski, Bozena Kaminska: Testing Real-Time Properties of Embedded Systems. ESA 2008: 179-185

Pawel Gburzynski, Bozena Kaminska, Ashikur Rahman: Reliable Data Transmission over Simple Wireless Channels: A Case Study. DSD 2008: 817-824

Pawel Gburzynski, Bozena Kaminska, Wladek Olesinski: A tiny and efficient wireless ad-hoc protocol for low-cost sensor networks. DATE 2007: 1557-1562

Ashikur Rahman, Pawel Gburzynski, Bozena Kaminska: Enhanced Dominant Pruning-based Broadcasting in Untrusted Ad-hoc Wireless Networks. ICC 2007: 3389-3394

Michal Dabrowski, Stein Aerts, Bozena Kaminska: Prediction of a key role of motifs binding E2F and NR2F in down-regulation of numerous genes during the development of the mouse hippocampus. BMC Bioinformatics 7: 367 (2006)

Jasbir N. Patel, Abdul Haseeb Ma, Takaya Ueda, Bonnie Gray, Ash Parameswaran, Bozena Kaminska: A Novel 3-Way Cell Sorter using Power Efficient Electrolysis-Based Actuator. CCECE 2006: 348-351

Abraham O. Fapojuwo, Bozena Kaminska (Eds.): Sixth IASTED International Multi-Conference on Wireless and Optical Communications: Conference on Communication Systems and Applications, Conference on Optical Communication Systems and Networks, Conference on Wireless Networks and Emerging Technologies, Conference on Wireless SENSOR Networks, Banff, Alberta, Canada, July 3-5, 2006. IASTED/ACTA Press 2006, isbn 0-88986-565-5

Bozena Kaminska, Stephen K. Sunter, Salvador Mir: Analog and mixed signal test techniques for SOC development. Microelectronics Journal 36(12): 1063 (2005)

Ewa Sokolowska, M. Barszcz, Bozena Kaminska: TED Thermo Electrical Designer: A New Physical Design Verification Tool. ISQED 2005: 164-168

Hans G. Kerkhoff, Bozena Kaminska: Analog and mixed signal test techniques for SoCs. Microelectronics Journal 34(10): 887-888 (2003)

Bozena Kaminska, Karim Arabi: Mixed Signal DFT: A Concise Overview. ICCAD 2003: 672-680

Bozena Kaminska: Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines. ITC 2002: 23

Iboun Taimiya Sylla, Mustapha Slamani, Bozena Kaminska: A Unity Gain High Speed Buffer to Improve Signal Integrity in High Frequency Test Interface. J. Electronic Testing 17(1): 53-61 (2001)

Khaled Saab, Naim Ben Hamida, Bozena Kaminska: Closing the gap between analog and digital testing. IEEE Trans. on CAD of Integrated Circuits and Systems 20(2): 307-314 (2001)

Khaled Saab, Naim Ben Hamida, Bozena Kaminska: Closing the gap between analog and digital. DAC 2000: 774-779

Khaled Saab, Naim Ben Hamida, Bozena Kaminska: Parametric Fault Simulation and Test Vector Generation. DATE 2000: 650-656

Abdessatar Abderrahman, Eduard Cerny, Bozena Kaminska: Worst case tolerance analysis and CLP-based multifrequency test generation for analog circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 18(3): 332-345 (1999)

Samir Boubezari, Eduard Cerny, Bozena Kaminska, Benoit Nadeau-Dostie: Testability analysis and test-point insertion in RTL VHDL specifications for scan-based BIST. IEEE Trans. on CAD of Integrated Circuits and Systems 18(9): 1327-1340 (1999)

Bozena Kaminska: Is Analog Fault Simulation a Key to Product Quality? Practical Considerations. ITC 1999: 648

Karim Arabi, Bozena Kaminska: Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronic Structures. J. Electronic Testing 12(1-2): 93-99 (1998)

Karim Arabi, Bozena Kaminska, Mohamad Sawan: On chip testing data converters using static parameters. IEEE Trans. VLSI Syst. 6(3): 409-419 (1998)

Hassan Ihs, Karim Arabi, Bozena Kaminska: Testing digital to analog converters based on oscillation-test strategy using sigma-delta modulation. ICCD 1998: 40-46

Karim Arabi, Hassan Ihs, Christian Dufaza, Bozena Kaminska: Digital oscillation-test method for delay and stuck-at fault testing of digital circuits. ITC 1998: 91-100

Iboun Taimiya Sylla, Mustapha Slamani, Bozena Kaminska, Fartoumi M. Hossein, Patrick Vincent: Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing. VTS 1998: 239-244

Karim Arabi, Bozena Kaminska: Testing analog and mixed-signal integrated circuits using oscillation-test method. IEEE Trans. on CAD of Integrated Circuits and Systems 16(7): 745-753 (1997)

Naim Ben Hamida, Khaled Saab, David Marche, Bozena Kaminska: A perturbation based fault modeling and simulation for mixed-signal circuits. Asian Test Symposium 1997: 182-187

Karim Arabi, Bozena Kaminska: Efficient and accurate testing of analog-to-digital converters using oscillation-test method. ED&TC 1997: 348-352

Karim Arabi, Bozena Kaminska: Built-In Temperature Sensors for On-line Thermal Monitoring of Microelectronic Structures. ICCD 1997: 462-467

Bozena Kaminska, Karim Arabi, I. Bell, José L. Huertas, B. Kim, Adoración Rueda, Mani Soma, Prashant Goteti: Analog and Mixed-Signal Benchmark Circuits-First Release. ITC 1997: 183-190

Karim Arabi, Bozena Kaminska: Design and Realization of an Accurate Built-In Current Sensor for On-Line Power Dissipation Measurement and I_DDQ Testing. ITC 1997: 578-586

Mathieu Gagnon, Bozena Kaminska: Optical Communication Channel Test Using BIST Approaches. ITC 1997: 626-635

Karim Arabi, Bozena Kaminska: Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits. ITC 1997: 786-795

Abdessatar Abderrahman, Eduard Cerny, Bozena Kaminska: CLP-based Multifrequency Test Generation for Analog Circuits. VTS 1997: 158-165

Karim Arabi, Bozena Kaminska: Parametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test Methodology. VTS 1997: 166-171

Melvin A. Breuer, Bozena Kaminska, J. McDermid, V. Rayapathi, Donald L. Wheater: Will 0.1um Digital Circuits Require Mixed-Signal Testing. VTS 1997: 186-187

Bozena Kaminska, Bernard Courtois: Guest Editors' Introduction: Mixed Analog and Digital Systems. IEEE Design & Test of Computers 13(2): 8-9 (1996)

Gil Philips, Yervant Zorian, Charles W. Rosenthal, Bozena Kaminska: Conference Reports. IEEE Design & Test of Computers 13(3): 8, 113-144 (1996)

Karim Arabi, Bozena Kaminska, Janusz Rzeszut: BIST for D/A and A/D Converters. IEEE Design & Test of Computers 13(4): 40-49 (1996)

Samir Boubezari, Bozena Kaminska: A new reconfigurable Test Vector Generator for built-in self-test applications. J. Electronic Testing 8(2): 153-164 (1996)

Bozena Kaminska, Bernard Courtois: Guest editorial. J. Electronic Testing 9(1-2): 7-8 (1996)

Abdessatar Abderrahman, Bozena Kaminska, Eduard Cerny: Optimization-based multifrequency test generation for analog circuits. J. Electronic Testing 9(1-2): 59-73 (1996)

Adel Belhaouane, Yvon Savaria, Bozena Kaminska, Daniel Massicotte: Reconstruction method for jitter tolerant data acquisition system. J. Electronic Testing 9(1-2): 177-185 (1996)

Karim Arabi, Bozena Kaminska, Stephen K. Sunter: Design for testability of integrated operational amplifiers using oscillation-test strategy. ICCD 1996: 40-45

Naim Ben Hamida, Bechir Ayari, Bozena Kaminska: Testing of embedded A/D converters in mixed-signal circuit. ICCD 1996: 135-136

Naim Ben Hamida, Khaled Saab, David Marche, Bozena Kaminska, Guy Quesnel: LIMSoft: Automated Tool for Design and Test Integration of Analog Circuits. ITC 1996: 571-580

Mehdi Ehsanian, Bozena Kaminska, Karim Arabi: A new digital test approach for analog-to-digital converter testing. VTS 1996: 60-65

Bozena Kaminska, Tad A. Kwasniewski, Linda S. Milor, G. Roberts, P. Flahive, Jérôme Wojcik: Is High Frequency Analog DFT Possible? VTS 1996: 214-215

Mohamed Soufi, Steve Rochon, Yvon Savaria, Bozena Kaminska: Design and performance of CMOS TSPC cells for high speed pseudo random testing. VTS 1996: 368-373

Karim Arabi, Bozena Kaminska: Oscillation-test strategy for analog and mixed-signal integrated circuits. VTS 1996: 476-482

Mustapha Slamani, Bozena Kaminska: Multifrequency Analysis of Faults in Analog Circuits. IEEE Design & Test of Computers 12(2): 70-80 (1995)

Sreejit Chakravarty, Ramalingam Sridhar, Shambhu J. Upadhyaya, Yervant Zorian, Gil Philips, Bozena Kaminska, Bernard Courtois: Conference Reports. IEEE Design & Test of Computers 12(4): 95-97 (1995)

Samir Boubezari, Bozena Kaminska: A Deterministic Built-In-Self-Test Generator Based on Cellular Automata Structures. IEEE Trans. Computers 44(6): 805-816 (1995)

Mohamed Soufi, Yvon Savaria, F. Darlay, Bozena Kaminska: Producing Reliable Initialization and Test of Sequential Circuits with Pseudorandom Vectors. IEEE Trans. Computers 44(10): 1251-1256 (1995)

Mounir Fares, Bozena Kaminska: FPAD: a fuzzy nonlinear programming approach to analog circuit design. IEEE Trans. on CAD of Integrated Circuits and Systems 14(7): 785-793 (1995)

Janusz Rzeszut, Bozena Kaminska, Yvon Savaria: A new method for testing mixed analog and digital circuits. Asian Test Symposium 1995: 127-132

Ali Assi, Bozena Kaminska: Modeling of communication protocols in VHDL. Great Lakes Symposium on VLSI 1995: 168-171

Mohamed Soufi, Yvon Savaria, Bozena Kaminska: On Using Partial Reset for Pseudo-Random Testing. ISCAS 1995: 949-952

Samir Lejmi, Bozena Kaminska, Bechir Ayari: Retiming for BIST-Sequential Circuits. ISCAS 1995: 1740-1743

Samir Boubezari, Bozena Kaminska: Mixed Deterministic and Pseudorandom Test Vector Generator Based on Cellular Automata Structures. ISCAS 1995: 1928-1931

Bechir Ayari, Bozena Kaminska: BDD-FTEST: Fast, Backtrack-Free Test Generator Based on Binary Decision Diagram Representation. ISCAS 1995: 2132-2135

Samir Lejmi, Bozena Kaminska, Bechir Ayari: Synthesis and Retiming for the Pseudo-Exhaustive BIST of Synchronous Sequential Circuits. ITC 1995: 683-692

Khaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski: Frequency-based BIST for analog circuit testin. VTS 1995: 54-59

Mohamed Soufi, Yvon Savaria, Bozena Kaminska: On the design of at-speed testable VLSI circuits. VTS 1995: 290-295

Samir Lejmi, Bozena Kaminska, Bechir Ayari: Retiming, resynthesis, and partitioning for the pseudo-exhaustive testing of sequential circuits. VTS 1995: 434-439

Mounir Fares, Bozena Kaminska: Exploring Test Space with Fuzzy Decision Making. IEEE Design & Test of Computers 11(3): 17-27 (1994)

Mounir Fares, Bozena Kaminska: Fuzzy optimization models for analog test decisions. J. Electronic Testing 5(2-3): 299-305 (1994)

Farid Mheir-El-Saadi, Bozena Kaminska: An automatic hierarchical delay analysis tool. J. Comput. Sci. Technol. 9(4): 349-364 (1994)

Bechir Ayari, Bozena Kaminska: A new dynamic test vector compaction for automatic test pattern generation. IEEE Trans. on CAD of Integrated Circuits and Systems 13(3): 353-358 (1994)

Said Amellal, Bozena Kaminska: Functional synthesis of digital systems with TASS. IEEE Trans. on CAD of Integrated Circuits and Systems 13(5): 537-552 (1994)

Mohamed Jamoussi, Bozena Kaminska: M-Testability: An Approach for Data-Path Testability Evaluation. EDAC-ETC-EUROASIC 1994: 449-455

Abdessatar Abderrahman, Bozena Kaminska, Yvon Savaria: Estimation of Simultaneous Switching Power and Ground Noise of Static CMOS Combinational Circuits. EDAC-ETC-EUROASIC 1994: 658

Karim Arabi, Bozena Kaminska, Janusz Rzeszut: A new built-in self-test approach for digital-to-analog and analog-to-digital converters. ICCAD 1994: 491-494

Samir Lejmi, Bozena Kaminska, Edouard Wagneur: Retiming for the Global Optimization of Synchronous Sequential Circuits. ICCD 1994: 398-403

Naim Ben Hamida, Bozena Kaminska, Yvon Savaria: Pseudo-Random Vector Compaction for Sequential Testability. ISCAS 1994: 63-66

Naim Ben Hamida, Bozena Kaminska: High Level Synthesis with Testability Constraints. ISCAS 1994: 65-68

Mustapha Slamani, Bozena Kaminska, Guy Quesnel: An Integrated Approach for Analog Ciruit Testing with a Minmum Number of Detected Parameters. ITC 1994: 631-640

Ewa Sokolowska, Bozena Kaminska: Application of Optoelectronic Techniques to High Speed Testing. ITC 1994: 710-719

Naim Ben Hamida, Bozena Kaminska: Multiple Fault Testing in Analog Circuits. VLSI Design 1994: 61-66

Mohamed Jamoussi, Bozena Kaminska: Data Path Testability Evaluation via Functional Testability Measures. VLSI Design 1994: 301-306

Mustapha Slamani, Bozena Kaminska: Multifrequency testability analysis for analog circuits. VTS 1994: 54-59

Naim Ben Hamida, Bozena Kaminska: Multiple fault analog circuit testing by sensitivity analysis. J. Electronic Testing 4(4): 331-343 (1993)

Mohamed Jamoussi, Bozena Kaminska: A Functional-level Testability Evaluation Using a New M-Testability. ISCAS 1993: 1611-1614

Naim Ben Hamida, Bozena Kaminska, Yvon Savaria: Initiability: A Measure of Sequential Testability. ISCAS 1993: 1619-1622

Said Amellal, Bozena Kaminska: Scheduling of a Control and Data Flow Graph. ISCAS 1993: 1666-1669

Samir Lejmi, Bozena Kaminska, Edouard Wagneur: Resynthesis and Retiming of Synchronous Sequential Cirucits. ISCAS 1993: 1674-1677

Naim Ben Hamida, Bozena Kaminska: Analog Circuit Testing Based on Sensitivity Computation and New Circuit Modeling. ITC 1993: 652-661

Mustapha Slamani, Bozena Kaminska: Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing. IEEE Design & Test of Computers 9(1): 30-39 (1992)

Yvon Savaria, Bruno Laguë, Bozena Kaminska: A Pragmatic Approach to the Design of Self-Testing Circuits. ITC 1989: 745-754

Bozena Kaminska, Yvon Savaria: Design-for-Testability Using Test Design Yield and Decision Theory. ITC 1989: 884-892

David Stannard, Bozena Kaminska: Detection of Hard Faults in a Combinational Circuit Using Budget Constraints. ITC 1988: 999