Jean-Baptiste Kammerer Coauthor index pubzone.org

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DBLP keys2009
j1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Benoit Dubois, Jean-Baptiste Kammerer, Luc Hebrard, Francis Braun: Modelling of hot-carrier degradation and its application for analog design for reliability. Microelectronics Journal 40(9): 1274-1280 (2009)
2007
c1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Benoit Dubois, Jean-Baptiste Kammerer, Luc Hebrard, Francis Braun: Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor for Analog Design for Reliability. ISQED 2007: 53-58

Coauthor Index

1Francis Braun
[j1] [c1]
2Benoit Dubois
[j1] [c1]
3Luc Hebrard
[j1] [c1]
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