| 2011 | ||
|---|---|---|
| j2 | Chizu Matsumoto, Yuichi Hamamura, Yoshiyuki Tsunoda, Hiroshi Uozaki, Isao Miyazaki, Shiro Kamohara, Yoshiyuki Kaneko, Kenji Kanamitsu: A New Critical Area Simulation Algorithm and Its Application for Failing Bit Analysis. IEICE Transactions 94-C(3): 353-360 (2011) | |
| 2009 | ||
| j1 | Yuichi Hamamura, Chizu Matsumoto, Yoshiyuki Tsunoda, Koji Kamoda, Yoshio Iwata, Kenji Kanamitsu, Daisuke Fujiki, Fujihiko Kojika, Hiromi Fujita, Yasuo Nakagawa, Shun'ichi Kaneko: Development of an Enterprise-Wide Yield Management System Using Critical Area Analysis for High-Product-Mix Semiconductor Manufacturing. IEICE Transactions 92-C(1): 144-152 (2009) | |
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