Sungho Kang

Incheol Kim, Ingeol Lee, Sungho Kang: Built-In Self-Test for Static ADC Testing with a Triangle-Wave. IEICE Transactions 96-C(2): 292-294 (2013)

Hyejeong Hong, Sungho Kang: Acceleration of Deep Packet Inspection Using a Multi-Byte Processing Prefilter. IEICE Transactions 96-B(2): 643-646 (2013)

Hyuntae Park, Hyejeong Hong, Sungho Kang: An efficient IP address lookup algorithm based on a small balanced tree using entry reduction. Computer Networks 56(1): 231-243 (2012)

HyeonUk Son, Incheol Kim, Sang-Goog Lee, Jin-Ho Ahn, Jeong-Do Kim, Sungho Kang: Noise-Tolerant DAC BIST Scheme Using Integral Calculus Approach. IEICE Transactions 94-C(8): 1344-1347 (2011)

Hyuntae Park, Hyejeong Hong, Sungho Kang: An Efficient IP Address Lookup Scheme Using Balanced Binary Search with Minimal Entry and Optimal Prefix Vector. IEICE Transactions 94-B(11): 3128-3131 (2011)

Hyunjin Kim, Sungho Kang: Communication-aware task scheduling and voltage selection for total energy minimization in a multiprocessor system using Ant Colony Optimization. Inf. Sci. 181(18): 3995-4008 (2011)

Hong-Sik Kim, Joohong Lee, Hyunjin Kim, Sungho Kang, Woo-Chan Park: A Lossless Color Image Compression Architecture Using a Parallel Golomb-Rice Hardware CODEC. IEEE Trans. Circuits Syst. Video Techn. 21(11): 1581-1587 (2011)

Hyunjin Kim, Hong-Sik Kim, Sungho Kang: A Memory-Efficient Bit-Split Parallel String Matching Using Pattern Dividing for Intrusion Detection Systems. IEEE Trans. Parallel Distrib. Syst. 22(11): 1904-1911 (2011)

Jaewon Cha, Ilwoong Kim, Sungho Kang: New Fault Detection Algorithm for Multi-level Cell Flash Memroies. Asian Test Symposium 2011: 341-346

Hyunjin Kim, Sungho Kang: A Pattern Group Partitioning for Parallel String Matching using a Pattern Grouping Metric. IEEE Communications Letters 14(9): 878-880 (2010)

YongJoon Kim, Jaeseok Park, Sungho Kang: A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption. IEICE Transactions 93-D(1): 193-196 (2010)

YongJoon Kim, Jaeseok Park, Sungho Kang: Selective Scan Slice Grouping Technique for Efficient Test Data Compression. IEICE Transactions 93-D(2): 380-383 (2010)

Hyunjin Kim, Hong-Sik Kim, Jung-Hee Lee, Jin-Ho Ahn, Sungho Kang: A Memory-Efficient Pattern Matching with Hardware-Based Bit-Split String Matchers for Deep Packet Inspection. IEICE Transactions 93-B(2): 396-398 (2010)

Youbean Kim, Jaewon Jang, Hyunwook Son, Sungho Kang: Pattern Mapping Method for Low Power BIST Based on Transition Freezing Method. IEICE Transactions 93-D(3): 643-646 (2010)

Hyuntae Park, Hyunjin Kim, Hong-Sik Kim, Sungho Kang: A Fast IP Address Lookup Algorithm Based on Search Space Reduction. IEICE Transactions 93-B(4): 1009-1012 (2010)

Hyunjin Kim, Hyejeong Hong, Dongmyong Baek, Sungho Kang: A Pattern Partitioning Algorithm for Memory-Efficient Parallel String Matching in Deep Packet Inspection. IEICE Transactions 93-B(6): 1612-1614 (2010)

Seongyong Ahn, Hyejeong Hong, Hyunjin Kim, Jin-Ho Ahn, Dongmyong Baek, Sungho Kang: A Hardware-Efficient Pattern Matching Architecture Using Process Element Tree for Deep Packet Inspection. IEICE Transactions 93-B(9): 2440-2442 (2010)

Myung-Hoon Yang, Hyungjun Cho, Wooheon Kang, Sungho Kang: EOF: Efficient Built-In Redundancy Analysis Methodology With Optimal Repair Rate. IEEE Trans. on CAD of Integrated Circuits and Systems 29(7): 1130-1135 (2010)

Woosik Jeong, Joohwan Lee, Taewoo Han, Kaangchil Lee, Sungho Kang: An Advanced BIRA for Memories With an Optimal Repair Rate and Fast Analysis Speed by Using a Branch Analyzer. IEEE Trans. on CAD of Integrated Circuits and Systems 29(12): 2014-2026 (2010)

Hyunjin Kim, Hyejeong Hong, Hong-Sik Kim, Sungho Kang: A memory-efficient parallel string matching for intrusion detection systems. IEEE Communications Letters 13(12): 1004-1006 (2009)

YongJoon Kim, Myung-Hoon Yang, Jaeseok Park, Eunsei Park, Sungho Kang: Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time. IEICE Transactions 92-D(7): 1462-1465 (2009)

Youngkyu Park, Jaeseok Park, Taewoo Han, Sungho Kang: An Effective Programmable Memory BIST for Embedded Memory. IEICE Transactions 92-D(12): 2508-2511 (2009)

Sunghoon Chun, Taejin Kim, Sungho Kang: ATPG-XP: Test Generation for Maximal Crosstalk-Induced Faults. IEEE Trans. on CAD of Integrated Circuits and Systems 28(9): 1401-1413 (2009)

Woosik Jeong, Ilkwon Kang, Kyowon Jin, Sungho Kang: A Fast Built-in Redundancy Analysis for Memories With Optimal Repair Rate Using a Line-Based Search Tree. IEEE Trans. VLSI Syst. 17(12): 1665-1678 (2009)

Seung Ho Ok, Woo-Jin Seo, Jin-Ho Ahn, Sungho Kang, Byung In Moon: An Ant Colony Optimization Approach for the Preference-Based Shortest Path Search. FGIT-FGCN 2009: 539-546

Woo-Jin Seo, Seung Ho Ok, Jin-Ho Ahn, Sungho Kang, Byung In Moon: An Efficient Hardware Architecture of the A-star Algorithm for the Shortest Path Search Engine. NCM 2009: 1499-1502

YounSun Kim, Hong-Sik Kim, R. Lee, Sungho Kang: FPGA-based verification methodology of SoC-type CMOS image signal processor. SoCC 2009: 231-234

Sunghoon Chun, YongJoon Kim, Taejin Kim, Sungho Kang: A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections. VTS 2009: 152-157

Hong-Sik Kim, Sungho Kang, Michael S. Hsiao: A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment. J. Electronic Testing 24(4): 365-378 (2008)

Myung-Hoon Yang, YongJoon Kim, Sunghoon Chun, Sungho Kang: An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR. J. Electronic Testing 24(6): 591-595 (2008)

Kicheol Kim, Youbean Kim, Incheol Kim, HyeonUk Son, Sungho Kang: A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters. IEICE Transactions 91-C(4): 670-672 (2008)

Youbean Kim, Kicheol Kim, Incheol Kim, Hyunwook Son, Sungho Kang: A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST. IEICE Transactions 91-D(4): 1185-1188 (2008)

DongSup Song, Jin-Ho Ahn, Taejin Kim, Sungho Kang: MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs. IEICE Transactions 91-D(4): 1197-1200 (2008)

Youbean Kim, Kicheol Kim, Incheol Kim, Sungho Kang: A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals. IEICE Transactions 91-C(10): 1713-1716 (2008)

Hyunjin Kim, Hyejeong Hong, Hong-Sik Kim, Jin-Ho Ahn, Sungho Kang: Total Energy Minimization of Real-Time Tasks in an On-Chip Multiprocessor Using Dynamic Voltage Scaling Efficiency Metric. IEEE Trans. on CAD of Integrated Circuits and Systems 27(11): 2088-2092 (2008)

Sunghoon Chun, Taejin Kim, Sungho Kang: A new low energy BIST using a statistical code. ASP-DAC 2008: 647-652

Jongsoo Yim, Gunbae Kim, Incheol Nam, Sangki Son, Jonghyoung Lim, Hwacheol Lee, Sangseok Kang, Byungheon Kwak, Jinseok Lee, Sungho Kang: A Prevenient Voltage Stress Test Method for High Density Memory. DELTA 2008: 516-520

Junghyun Nam, Sunghoon Chun, Gibum Koo, Yanggi Kim, Byungsoo Moon, Jonghyoung Lim, Jaehoon Joo, Sangseok Kang, Hoonjung Kim, Kyeongseon Shin, Kisang Kang, Sungho Kang: A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method. ITC 2008: 1-10

Sunghoon Chun, Taejin Kim, YongJoon Kim, Sungho Kang: An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation. VTS 2008: 73-78

Sunghoon Chun, YongJoon Kim, Sungho Kang: MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs. J. Electronic Testing 23(4): 357-362 (2007)

Incheol Kim, Kicheol Kim, Youbean Kim, HyeonUk Son, Sungho Kang: A New Analog-to-Digital Converter BIST Considering a Transient Zone. IEICE Transactions 90-C(11): 2161-2163 (2007)

Myung-Hoon Yang, Youbean Kim, Youngkyu Park, D. Lee, Sungho Kang: Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing. IET Computers & Digital Techniques 1(4): 369-376 (2007)

Sunghoon Chun, Sangwook Kim, Hong-Sik Kim, Sungho Kang: An Efficient Dictionary Organization for Maximum Diagnosis. J. Electronic Testing 22(1): 37-48 (2006)

DongSup Song, Sungho Kang: A Clustered RIN BIST Based on Signal Probabilities of Deterministic Test Sets. IEICE Transactions 89-D(1): 354-357 (2006)

Hong-Sik Kim, Sungho Kang: Increasing encoding efficiency of LFSR reseeding-based test compression. IEEE Trans. on CAD of Integrated Circuits and Systems 25(5): 913-917 (2006)

Sunghoon Chun, YongJoon Kim, Jung-Been Im, Sungho Kang: MICRO: a new hybrid test data compression/decompression scheme. IEEE Trans. VLSI Syst. 14(6): 649-654 (2006)

Jin-Ho Ahn, Hyunjin Kim, Byung In Moon, Sungho Kang: System on a Chip Implementation of Social Insect Behavior for Adaptive Network Routing. ICIC (2) 2006: 530-535

Jin-Ho Ahn, Sungho Kang: SoC Test Scheduling Algorithm Using ACO-Based Rectangle Packing. ICIC (2) 2006: 655-660

Hyuntae Park, Byung In Moon, Sungho Kang: Improved Reinforcement Computing to Implement AntNet-Based Routing Using General NPs for Ubiquitous Environments. ICUCT 2006: 242-251

Junseok Han, DongSup Song, Hagbae Kim, Youngyong Kim, Sungho Kang: An Effective Built-In Self-Test for Chargepump PLL. IEICE Transactions 88-C(8): 1731-1733 (2005)

Kicheol Kim, DongSub Song, Incheol Kim, Sungho Kang: A New Low Power Test Pattern Generator for BIST Architecture. IEICE Transactions 88-C(10): 2037-2038 (2005)

DongSup Song, Sungho Kang: Increasing Embedding Probabilities of RPRPs in RIN Based BIST. Asia-Pacific Computer Systems Architecture Conference 2005: 600-613

Jin-Ho Ahn, Byung In Moon, Sungho Kang: A Practical Test Scheduling Using Network-Based TAM in Network on Chip Architecture. Asia-Pacific Computer Systems Architecture Conference 2005: 614-624

Youbean Kim, Myung-Hoon Yang, Yong Lee, Sungho Kang: A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture. Asian Test Symposium 2005: 230-235

Cheong Ghil Kim, Hong-Sik Kim, Sungho Kang, Shin Dug Kim, Gunhee Han: An Acceleration Processor for Data Intensive Scientific Computing. IEICE Transactions 87-D(7): 1766-1773 (2004)

YongJoon Kim, Hyun-Don Kim, Sungho Kang: A new maximal diagnosis algorithm for interconnect test. IEEE Trans. VLSI Syst. 12(5): 532-537 (2004)

Jung-Been Im, Sunghoon Chun, Geunbae Kim, Jin-Ho Ahn, Sungho Kang: RAIN (RAndom Insertion) Scheduling Algorithm for SoC Test. Asian Test Symposium 2004: 242-247

Jae Seuk Oh, Sung-il Bae, Jin-Ho Ahn, Sungho Kang: Route Reinforcement for Efficient QoS Routing Based on Ant Algorithm. ICOIN 2004: 342-349

Byung In Moon, Hongil Yoon, Ilgun Yun, Sungho Kang: An In-Order SMT Architecture with Static Resource Partitioning for Consumer Applications. PDCAT 2004: 539-544

Sungho Kang, Stephen A. Szygenda: Accurate Logic Simulation by Overcoming the Unknown Value Propagation Problem. Simulation 79(2): 59-68 (2003)

Hong-Sik Kim, YongJoon Kim, Sungho Kang: Test-decompression mechanism using a variable-length multiple-polynomial LFSR. IEEE Trans. VLSI Syst. 11(4): 687-690 (2003)

YongJoon Kim, DongSub Song, YongSeung Shin, Sunghoon Chun, Sungho Kang: A New Maximal Diagnosis Algorithm for Bus-structured Systems. ITC 2003: 349-357

Sung-il Bae, Daesik Seo, Gilyoung Kang, Sungho Kang: A New Survival Architecture for Network Processors. AISA 2002: 1-10

Sungchul Yoon, Sangwook Kim, Jae Seuk Oh, Sungho Kang: A New DSP Architecture for Correcting Errors Using Viterbi Algorithm. AISA 2002: 95-102

Sangmin Bae, DongSup Song, Jihye Kim, Sungho Kang: An Efficient On-Line Monitoring BIST for Remote Service System. AISA 2002: 205-214

Hong-Sik Kim, Sungho Kang: DPSC SRAM Transparent Test Algorithm. Asian Test Symposium 2002: 145-150

Song Chong, Sangho Lee, Sungho Kang: A simple, scalable, and stable explicit rate allocation algorithm for MAX-MIN flow control with minimum rate guarantee. IEEE/ACM Trans. Netw. 9(3): 322-335 (2001)

Hong-Sik Kim, Jin-kyue Lee, Sungho Kang: A Heuristic for Multiple Weight Set Generation. ICCD 2001: 513-514

Hong-Sik Kim, Jin-kyue Lee, Sungho Kang: A new multiple weight set calculation algorithm. ITC 2001: 878-884

Jongchul Shin, Hyunjin Kim, Sungho Kang: At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks. DATE 1999: 473-

Hangkyu Lee, Sungho Kang: A New Weight Set Generation Algorithm for Weighted Random Pattern Generation. ICCD 1999: 160-165

Hyunjin Kim, Jongchul Shin, Sungho Kang: An Efficient Interconnect Test Using BIST Module in a Boundary-Scan Environment. ICCD 1999: 328-329

Yong Seok Kang, Jong Cheol Lee, Sungho Kang: Built-in Self Test for Contect Addressable Memories. ICCD 1997: 48-53

Jae-Wook Lee, Sungho Kang: Efficient Simulation Model Generation Using Automatic Programming Techniques. Winter Simulation Conference 1996: 708-713

Youngmin Hur, Stephen A. Szygenda, E. Scott Fehr, Granville E. Ott, Sungho Kang: Massively Parallel Array Processor for Logic, Fault, and Design Error Simulation. HPCA 1995: 340-347

Sungho Kang, Stephen A. Szygenda: Design Validation: Comparing Theoretical and Empirical Results of Design Error Modeling. IEEE Design & Test of Computers 11(1): 18-26 (1994)

Sungho Kang, Stephen A. Szygenda: The simulation automation system (SAS); concepts, implementation, and results. IEEE Trans. VLSI Syst. 2(1): 89-99 (1994)

Sungho Kang, Wai-On Law, Bill Underwood: Path-Delay Fault Simulation for a Standard Scan Design Methodology. ICCD 1994: 359-362

Bill Underwood, Wai-On Law, Sungho Kang, Haluk Konuk: Fastpath: A Path-Delay Test Generator for Standard Scan Designs. ITC 1994: 154-163

Sungho Kang, Stephen A. Szygenda: Automatic VHDL Model Generation System. CHDL 1993: 353-360

Sungho Kang, Stephen A. Szygenda: Modeling and Simulation of Design Errors. ICCD 1992: 443-446

Sungho Kang: Linear ordering and application to placement. DAC 1983: 457-464

Sungho Kang, William M. van Cleemput: Automatic PLA synthesis from a DDL-P description. DAC 1981: 391-397