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 | 1999 | |
|---|---|---|
| c7 |      | K. Liateni, D. Moulinier, B. Affour, A. Delpoux, Jean-Michel Karam: Moving MEMS into Mainstream Applications: The MEMSCAP Solution. VLSI 1999: 544-556 |
| c6 | | Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: Design and Test of MEMs. VLSI Design 1999: 270- |
| 1998 | ||
| j2 |  | Vladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring of Self-Checking Systems. J. Electronic Testing 12(1-2): 81-92 (1998) |
| c5 | | A. Castillejo, D. Veychard, Salvador Mir, Jean-Michel Karam, Bernard Courtois: Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems. ITC 1998: 541-550 |
| c4 | | Jean-Michel Karam, Marcelo Lubaszewski, S. Blanton, Andrew Richardson: Testing MEMS. VTS 1998: 320-321 |
| 1997 | ||
| j1 | | Jean-Michel Karam, Bernard Courtois, Hicham Boutamine: CAD Tools for Bridging Microsystems and Foundries. IEEE Design & Test of Computers 14(2): 34-39 (1997) |
| c3 | | Jean-Michel Karam, Bernard Courtois, Hicham Boutamine, P. Drake, András Poppe, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: CAD and Foundries for Microsystems. DAC 1997: 674-679 |
| c2 | | Klaus Hofmann, Manfred Glesner, Nicu Sebe, A. Manolescu, Santiago Marco, Josep Samitier, Jean-Michel Karam, Bernard Courtois: Generation of the HDL-A-model of a micromembrane from its finite-element-description. ED&TC 1997: 108-112 |
| 1996 | ||
| c1 | | Vladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium 1996: 282-288 |
Colors in the list of coauthors
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