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Farzin Karimi
2000 – 2009
- 2008
[c8]Farzin Karimi: Applications of decorator and observer design patterns in functional verification. HLDVT 2008: 18-22- 2004
- [j3]Farzin Karimi, Zainalabedin Navabi, Waleed Meleis, Fabrizio Lombardi: Using data compression in automatic test equipment for system-on-chip testing. IEEE T. Instrumentation and Measurement 53(2): 308-317 (2004)
- 2003
- [j2]Farzin Karimi, V. Swamy Irrinki, T. Crosby, Nohpill Park, Fabrizio Lombardi: Parallel testing of multi-port static random access memories. Microelectronics Journal 34(1): 3-21 (2003)
- [c7]Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi: Hybrid Multisite Testing at Manufacturing. ITC 2003: 927-936
- 2002
- [c6]Farzin Karimi, Waleed Meleis, Zainalabedin Navabi, Fabrizio Lombardi: Data Compression for System-on-Chip Testing Using ATE. DFT 2002: 166-176
- [c5]Farzin Karimi, Fabrizio Lombardi: A Scan-Bist Environment for Testing Embedded Memories. IOLTW 2002: 211-
- [c4]Farzin Karimi, Fabrizio Lombardi: A Scan-Bist Environment for Testing Embedded Memories. MTDT 2002: 17-
- [c3]Farzin Karimi, Fred J. Meyer, Fabrizio Lombardi: Random Testing of Multi-Port Static Random Access Memories. MTDT 2002: 101-108
- 2001
- [j1]Wenyi Feng, Farzin Karimi, Fabrizio Lombardi: Fault Detection in a Tristate System Environment. IEEE Micro 21(5): 77-85 (2001)
- [c2]Farzin Karimi, Fabrizio Lombardi: Parallel Testing of Multi-port Static Random Access Memories for BIST. DFT 2001: 271-279
- [c1]Farzin Karimi, Fabrizio Lombardi, V. Swamy Irrinki, T. Crosby: A Parallel Approach for Testing Multi-Port Static Random Access Memories. MTDT 2001: 73-
Coauthor Index
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last updated on 2012-12-02 21:59 CET by the dblp team