F. van Keulen

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	2008
j2		Q. Li, J. F. L. Goosen, J. T. M. van Beek, F. van Keulen, K. L. Phan, G. Q. Zhang: Failure analysis of a thin-film nitride MEMS package. Microelectronics Reliability 48(8-9): 1557-1561 (2008)
	2006
j1		C. Yuan, W. D. van Driel, Richard B. R. van Silfhout, Olaf van der Sluis, R. A. B. Engelen, Leo J. Ernst, F. van Keulen, G. Q. Zhang: Delamination analysis of Cu/low-k technology subjected to chemical-mechanical polishing process conditions. Microelectronics Reliability 46(9-11): 1679-1684 (2006)

Coauthor Index

1	J. T. M. van Beek	[j2]
2	Willem D. van Driel (W. D. van Driel)	[j1]
3	R. A. B. Engelen (Roy Engelen)	[j1]
4	Leo J. Ernst (L. J. Ernst)	[j1]
5	J. F. L. Goosen	[j2]
6	Q. Li	[j2]
7	K. L. Phan	[j2]
8	Richard B. R. van Silfhout	[j1]
9	Olaf van der Sluis	[j1]
10	C. Yuan	[j1]
11	G. Q. Zhang (G. Q. (Kouchi) Zhang)	[j2] [j1]

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