Kee Sup Kim

Kee Sup Kim: Holistic low power solutions for the new world. ISLPED 2011: 65-66

Kee Sup Kim, Rob Roy: Apprentice - VTS edition: Season 4. VTS 2011: 113

Kee Sup Kim: Panel 4A: Apprentice - VTS edition: Season 3. VTS 2010: 129

Kee Sup Kim: Panel 12C: Apprentice - VTS edition judging session. VTS 2010: 355

A. Hakan Baba, Kee Sup Kim: Framework for massively parallel testing at wafer and package test. ICCD 2009: 328-334

Kee Sup Kim: Panel: Apprentice - VTS Edition: Season 2. VTS 2009: 119

Kee Sup Kim, Ming Zhang: Hierarchical Test Compression for SoC Designs. IEEE Design & Test of Computers 25(2): 142-148 (2008)

Ming Zhang, T. M. Mak, James Tschanz, Kee Sup Kim, Norbert Seifert, Davia Lu: Design for Resilience to Soft Errors and Variations. IOLTS 2007: 23-28

Subhasish Mitra, Kee Sup Kim: XPAND: An Efficient Test Stimulus Compression Technique. IEEE Trans. Computers 55(2): 163-173 (2006)

Ming Zhang, Subhasish Mitra, T. M. Mak, Norbert Seifert, Nicholas J. Wang, Quan Shi, Kee Sup Kim, Naresh R. Shanbhag, Sanjay J. Patel: Sequential Element Design With Built-In Soft Error Resilience. IEEE Trans. VLSI Syst. 14(12): 1368-1378 (2006)

Bruce Cory, Rohit Kapur, Mick Tegethoff, Mark Kassab, Brion L. Keller, Kee Sup Kim, Dwayne Burek, Steven F. Oakland, Benoit Nadeau-Dostie: OCI: Open Compression Interface. ITC 2006: 1-4

Subhasish Mitra, Ming Zhang, Saad Waqas, Norbert Seifert, Balkaran S. Gill, Kee Sup Kim: Combinational Logic Soft Error Correction. ITC 2006: 1-9

Subhasish Mitra, Ming Zhang, Norbert Seifert, T. M. Mak, Kee Sup Kim: Soft Error Resilient System Design through Error Correction. VLSI-SoC 2006: 332-337

Kee Sup Kim, Mohammad Tehranipoor: Session Abstract. VTS 2006: 292-293

Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim: Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim. IEEE Computer 38(2): 43-52 (2005)

Nic Mokhoff, Yervant Zorian, Kamalesh N. Ruparel, Hao Nham, Francesco Pessolano, Kee Sup Kim: How to determine the necessity for emerging solutions. DAC 2005: 274-275

Kee Sup Kim: XMAX: a practical and efficient compression architecture. ITC 2005: 2

Subhasish Mitra, Ming Zhang, T. M. Mak, Norbert Seifert, Victor Zia, Kee Sup Kim: Logic soft errors: a major barrier to robust platform design. ITC 2005: 10

Subhasish Mitra, Kee Sup Kim: X-compact: an efficient response compaction technique. IEEE Trans. on CAD of Integrated Circuits and Systems 23(3): 421-432 (2004)

Kee Sup Kim, Subhasish Mitra, Paul G. Ryan: Delay Defect Characteristics and Testing Strategies. IEEE Design & Test of Computers 20(5): 8-16 (2003)

Subhasish Mitra, Kee Sup Kim: XMAX: X-Tolerant Architecture for MAXimal Test Compression. ICCD 2003: 326-330

David M. Wu, Mike Lin, Subhasish Mitra, Kee Sup Kim, Anil Sabbavarapu, Talal Jaber, Pete Johnson, Dale March, Greg Parrish: H-DFT: A Hybrid DFT Architecture For Low-Cost High Quality Structural Testing. ITC 2003: 1229-1238

Subhasish Mitra, Kee Sup Kim: X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction. ITC 2002: 311-320

Kee Sup Kim, Rathish Jayabharathi, Craig Carstens: SpeedGrade: An RTL Path Delay Fault Simulator. Asian Test Symposium 2001: 239-243

Kee Sup Kim, Rathish Jayabharathi, Craig Carstens, Praveen Vishakantaiah, Derek Feltham, Adrian Carbine: DPDAT: data path direct access testing. ITC 2001: 188-195

Kee Sup Kim, Charles R. Kime: Partial scan flip-flop selection by use of empirical testability. J. Electronic Testing 7(1-2): 47-59 (1995)

Kee Sup Kim, Len Schultz: Multi-Frequency, Multi-Phase Scan Chain. ITC 1994: 323-330

Kee Sup Kim, Charles R. Kime: Partial Scan Using Reverse Direction Empirical Testability. ITC 1993: 498-506

Kee Sup Kim, Charles R. Kime: Partial Scan by Use of Empirical Testability. ICCAD 1990: 314-317