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Yunsung Kim
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2010 – today
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2012
[j1]
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Yunsung Kim
,
Hyelim Choi
,
Hyoungjoo Lee
,
Dongjun Shin
,
Jinhan Cho
,
Heeman Choe
:
Improved reliability of copper-cored solder joints under a harsh thermal cycling condition.
Microelectronics Reliability 52
(7): 1441-1444 (2012)
Coauthor Index
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1
Jinhan Cho
[j1]
2
Heeman Choe
[j1]
3
Hyelim Choi
[j1]
4
Hyoungjoo Lee
[j1]
5
Dongjun Shin
[j1]