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 | 1997 | |
|---|---|---|
| j17 |      | Danial J. Neebel, Charles R. Kime: Cellular Automata for Weighted Random Pattern Generation. IEEE Trans. Computers 46(11): 1219-1229 (1997) |
| 1996 | ||
| c15 | | Mohammed F. AlShaibi, Charles R. Kime: MFBIST: A BIST Method for Random Pattern Resistant Circuits. ITC 1996: 176-185 |
| 1995 | ||
| j16 | | Kee Sup Kim, Charles R. Kime: Partial scan flip-flop selection by use of empirical testability. J. Electronic Testing 7(1-2): 47-59 (1995) |
| 1994 | ||
| c14 | | Mohammed F. AlShaibi, Charles R. Kime: Fixed-Biased Pseudorandom Built-In Self-Test for Random-Pattern-Resistant Circuits. ITC 1994: 929-938 |
| c13 | | |
| c12 | | |
| 1993 | ||
| j15 | | Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja: A Tutorial on Built-in Self-Test. I. Principles. IEEE Design & Test of Computers 10(1): 73-82 (1993) |
| j14 | | Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja: A Tutorial on Built-In Self-Test, Part 2: Applications. IEEE Design & Test of Computers 10(2): 69-77 (1993) |
| j13 | | Byung S. So, Charles R. Kime: A fault simulation method: Parallel pattern critical path tracing. J. Electronic Testing 4(3): 255-265 (1993) |
| c11 | | Kee Sup Kim, Charles R. Kime: Partial Scan Using Reverse Direction Empirical Testability. ITC 1993: 498-506 |
| c10 | | Danial J. Neebel, Charles R. Kime: Inhomogeneous Cellular Automata for Weighted-Random-Pattern Generation. ITC 1993: 1013-1022 |
| 1992 | ||
| j12 | | John Y. Sayah, Charles R. Kime: Test Scheduling in High Performance VLSI System Implementations. IEEE Trans. Computers 41(1): 52-67 (1992) |
| 1990 | ||
| c9 |  | |
| c8 | | Chau-Chin Su, Charles R. Kime: Multiple path sensitization for hierarchical circuit testing. ITC 1990: 152-161 |
| c7 | | Chau-Chin Su, Charles R. Kime: Computer-aided design of pseudoexhaustive BIST for semiregular circuits. ITC 1990: 680-689 |
| 1988 | ||
| j11 | | Gary L. Craig, Charles R. Kime, Kewal K. Saluja: Test Scheduling and Control for VLSI Built-In Self-Test. IEEE Trans. Computers 37(9): 1099-1109 (1988) |
| j10 | | Kewal K. Saluja, Rajiv Sharma, Charles R. Kime: A concurrent testing technique for digital circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 7(12): 1250-1260 (1988) |
| c6 | | Charles R. Kime: Impact of Testability Standards on University Research and Instruction. ITC 1988: 199-200 |
| c5 | | John Y. Sayah, Charles R. Kime: : Test Scheduling for High Performance VLSI System Implementations. ITC 1988: 421-430 |
| c4 | | Leon J. Sigal, Charles R. Kime: Concurrent Off-Phase Built-in Self-Test of Dormant Logic. ITC 1988: 934-941 |
| 1985 | ||
| c3 | | Gary L. Craig, Charles R. Kime: Pseudo-Exhaustive Adjacency Testing: A BIST Approach for Stuck-Open Faults. ITC 1985: 126-139 |
| 1984 | ||
| j9 | | John A. McPherson, Charles R. Kime: Diagnosis in the Presence of Known Faults. IEEE Trans. Computers 33(10): 943-947 (1984) |
| c2 | | Charles R. Kime, H. H. Kwan, J. K. Lemke, Gerald B. Williams: A Built-In Test Methodology for VLSI Data Paths. ITC 1984: 327-337 |
| 1982 | ||
| c1 | | Vincent C. Rideout, J. Eastman, Adel Said Elmaghraby, Raphael A. Finkel, A. A. Frank, T. J. Kaminsky, Charles R. Kime, John A. McPherson, Michael Jon Redmond, S. Diane Smith: WISPAC: A Parallel Array Computer for Simulation Applications. IMACS World Congress 1982: 159-169 |
| 1979 | ||
| j8 | | John A. McPherson, Charles R. Kime: A Two-Level Diagnostic Model for Digital Systems. IEEE Trans. Computers 28(1): 16-27 (1979) |
| j7 | | Charles R. Kime: An Abstract Model for Digital System Fault Diagnosis. IEEE Trans. Computers 28(10): 754-767 (1979) |
| 1976 | ||
| j6 | | Ramachendra P. Batni, Charles R. Kime: A Module-Level Testing Approach for Combinational Networks. IEEE Trans. Computers 25(6): 594-604 (1976) |
| 1975 | ||
| j5 | | Gernot Metze, Donald R. Schertz, Kilin To, Gordon Whitney, Charles R. Kime, Jeffrey D. Russell: Comments on ``Derivation of Minimal Complete Sets of Test-Input Sequences Using Boolean Differences. IEEE Trans. Computers 24(1): 108 (1975) |
| j4 | | Charles R. Kime: Fault Tolerant Computing: An Introduction and a Perspective. IEEE Trans. Computers 24(5): 457-460 (1975) |
| j3 | | Jeffrey D. Russell, Charles R. Kime: System Fault Diagnosis: Closure and Diagnosability with Repair. IEEE Trans. Computers 24(11): 1078-1089 (1975) |
| j2 | | Jeffrey D. Russell, Charles R. Kime: System Fault Diagnosis: Masking, Exposure, and Diagnosability Without Repair. IEEE Trans. Computers 24(12): 1155-1161 (1975) |
| 1974 | ||
| j1 | | Ramachendra P. Batni, Jeffrey D. Russell, Charles R. Kime: An Efficient Algorithm for Finding an Irredundant Set Cover. J. ACM 21(3): 351-355 (1974) |
Colors in the list of coauthors
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