| 2000 | ||
|---|---|---|
| j1 | Eric Wolbrecht, Bruce D'Ambrosio, Robert Paasch, Doug Kirby: Monitoring and diagnosis of a multistage manufacturing process using Bayesian networks. AI EDAM 14(1): 53-67 (2000) | |
| 1 | Bruce D'Ambrosio | |
| 2 | Robert Paasch | |
| 3 | Eric Wolbrecht |
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