Zahava Koren

Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren: Relating digital imager defect rates to pixel size, sensor area and ISO. DFT 2012: 164-169

Abhinna Jain, C. M. Krishna, Israel Koren, Zahava Koren: Cost Functions for Scheduling Tasks in Cyber-physical Systems. ICINCO (1) 2012: 412-421

Glenn H. Chapman, Israel Koren, Zahava Koren: Do more camera pixels result in a better picture? IOLTS 2012: 73-78

Glenn H. Chapman, Jenny Leung, Ana Namburete, Israel Koren, Zahava Koren: Predicting Pixel Defect Rates Based on Image Sensor Parameters. DFT 2011: 408-416

Srikanth Sundaresan, Israel Koren, Zahava Koren, C. Mani Krishna: Event-driven adaptive duty-cycling in sensor networks. IJSNet 6(2): 89-100 (2009)

Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren: Characterization of Gain Enhanced In-Field Defects in Digital Imagers. DFT 2009: 155-163

Jenny Leung, Glenn H. Chapman, Zahava Koren, Israel Koren: Statistical identification and analysis of defect development in digital imagers. Digital Photography 2009: 72500

Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren: Automatic Detection of In-field eld Defect Growth in Image Sensors. DFT 2008: 305-313

Jenny Leung, Jozsef Dudas, Glenn H. Chapman, Israel Koren, Zahava Koren: Quantitative Analysis of In-Field Defects in Image Sensor Arrays. DFT 2007: 526-534

Jozsef Dudas, Cory Jung, Linda Wu, Glenn H. Chapman, Israel Koren, Zahava Koren: On-Line Mapping of In-Field Defects in Image Sensor Arrays. DFT 2006: 439-447

Glenn H. Chapman, Israel Koren, Zahava Koren, Jozsef Dudas, Cory Jung: On-Line Identification of Faults in Fault-Tolerant Imagers. DFT 2005: 149-157

Glenn H. Chapman, Sunjaya Djaja, Desmond Y. H. Cheung, Yves Audet, Israel Koren, Zahava Koren: A Self-Correcting Active Pixel Sensor Using Hardware and Software Correction. IEEE Design & Test of Computers 21(6): 544-551 (2004)

E. Ciocca, Israel Koren, Zahava Koren, C. Mani Krishna, Daniel S. Katz: Application-Level Fault Tolerance in the Orbital Thermal Imaging Spectrometer. PRDC 2004: 43-48

Jayakrishnan Nair, Zahava Koren, Israel Koren, C. Mani Krishna: Pre-Processing Input Data to Augment Fault Tolerance in Space Applications. DSN 2003: 491-500

Zahava Koren, J. Rajagopal, C. Mani Krishna, Israel Koren, W. Wang, J. Loman: Using Rational Approximations for Evaluating the Reliablity of Highly Reliable Systems. IPDPS 2002

Israel Koren, Zahava Koren, Glenn H. Chapman: Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip. DFT 2001: 3-10

Israel Koren, Zahava Koren: Incorporating Yield Enhancement into the Floorplanning Process. IEEE Trans. Computers 49(6): 532-541 (2000)

Israel Koren, Zahava Koren, Glenn H. Chapman: A Self-Correcting Active Pixel Camera. DFT 2000: 56-

Vijay Lakamraju, Zahava Koren, C. Mani Krishna: Synthesis of Interconnection Networks: A Novel Approach. DSN 2000: 501-509

Israel Koren, Zahava Koren: Yield and Routing Objectives in Floorplanning. DFT 1998: 28-36

Vijay Lakamraju, Zahava Koren, Israel Koren, C. Mani Krishna: Measuring the Vulnerability of Interconnection Networks in Embedded Systems. IPPS/SPDP Workshops 1998: 919-924

Zahava Koren, Israel Koren, C. Mani Krishna: Surge Handling as a Measure of Real-Time System Dependability. IPPS/SPDP Workshops 1998: 1106-1116

Zahava Koren, Israel Koren: On the effect of floorplanning on the yield of large area integrated circuits. IEEE Trans. VLSI Syst. 5(1): 3-14 (1997)

Israel Koren, Zahava Koren: Analysis of a Hybrid Defect-Tolerance Scheme for High-Density Memory ICs. DFT 1997: 166-174

Régis Leveugle, Zahava Koren, Israel Koren, Gabriele Saucier, Norbert Wehn: The Hyeti Defect Tolerant Microprocessor: A Practical Experiment and its Cost-Effectiveness Analysis. IEEE Trans. Computers 43(12): 1398-1406 (1994)

Israel Koren, Zahava Koren, Charles H. Stapper: A statistical study of defect maps of large area VLSI IC's. IEEE Trans. VLSI Syst. 2(2): 249-256 (1994)

Israel Koren, Zahava Koren, Charles H. Stapper: A Unified Negative-Binomial Distribution for Yield Analysis of Defect-Tolerant Circuits. IEEE Trans. Computers 42(6): 724-734 (1993)

Zahava Koren, Israel Koren: Does the Floorplan of a Chip Affect Its Yield? DFT 1993: 159-166

Israel Koren, Zahava Koren: Discrete and Continuous Models for the Performance of Reconfigurable Multistage Systems. IEEE Trans. Computers 40(9): 1024-1033 (1991)

Aura Ganz, Zahava Koren: WDM Passive Star-Protocols and Performance Analysis. INFOCOM 1991: 991-1000

Israel Koren, Zahava Koren: On the Bandwidth of a Multi-Stage Network in the Presence of Faulty Components. ICDCS 1988: 26-32

Israel Koren, Zahava Koren, Stephen Y. H. Su: Analysis of a Class of Recovery Procedures. IEEE Trans. Computers 35(8): 703-712 (1986)

Zahava Koren, Imrich Chlamtac, Aura Ganz: A model for evaluating demand assignment protocols with arbitrary workloads. SIGCOMM 1986: 40-44