- CSB - MetaPress - Google - Bing - Yahoo
 | 2005 | |
|---|---|---|
| c3 |      | |
| 2004 | ||
| c2 | | Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski: Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. ITC 2004: 1285-1294 |
| 2003 | ||
| c1 | | Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski: Impact of Multiple-Detect Test Patterns on Product Quality. ITC 2003: 1031-1040 |
| 1 | Brady Benware | |
| 2 | Mark Kassab | |
| 3 | Martin Keim | |
| 4 | Cam Lu | |
| 5 | Robert Madge | |
| 6 | Janusz Rajski | |
| 7 | Sreenevasan Ranganathan | |
| 8 | Chris Schuermyer | |
| 9 | John Van Slyke | |
| 10 | Nagesh Tamarapalli | |
| 11 | Kun-Han Tsai |
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