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Steven B. Leeb

2010 – today

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What is the meaning of the colors in the publication list?

2012
[j7]
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  dblp key:
  - journals/tie/AvestruzCVPL12
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Al-Thaddeus Avestruz, John J. Cooley, Daniel Vickery, James Paris, Steven B. Leeb: Dimmable Solid State Ballast With Integral Capacitive Occupancy Sensor. IEEE Transactions on Industrial Electronics 59(4): 1739-1750 (2012)
[j6]
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  - journals/tie/CooleyAL12
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John J. Cooley, Al-Thaddeus Avestruz, Steven B. Leeb: A Retrofit Capacitive Sensing Occupancy Detector Using Fluorescent Lamps. IEEE Transactions on Industrial Electronics 59(4): 1898-1911 (2012)
2011
[j5]
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  - journals/iet-cds/CooleyAL11
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John J. Cooley, Al-Thaddeus Avestruz, Steven B. Leeb: Small-signal analysis of fully-differential closed-loop op-amp circuits with arbitrary external impedance elements. IET Circuits, Devices & Systems 5(5): 371-383 (2011)
2010
[j4]
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  - journals/tie/RodriguezL10
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John I. Rodriguez, Steven B. Leeb: Nonresonant and Resonant Frequency-Selectable Induction-Heating Targets. IEEE Transactions on Industrial Electronics 57(9): 3095-3108 (2010)

2000 – 2009

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What is the meaning of the colors in the publication list?

2008
[j3]
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  - journals/tim/ShawLNC08
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Steven R. Shaw, Steven B. Leeb, L. K. Norford, Robert W. Cox: Nonintrusive Load Monitoring and Diagnostics in Power Systems. IEEE T. Instrumentation and Measurement 57(7): 1445-1454 (2008)
2004
[j2]
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  dblp key:
  - journals/pervasive/CuddihyHALLRLCHVLKKQWASHKALBSAMC04
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Paul Cuddihy, Roderick T. Hinman, Al-Thaddeus Avestruz, Elmer C. Lupton, Gary Livshin, John I. Rodriguez, Steven B. Leeb, Corinne M. Clark, Kathy J. Horvath, Ladislav Volicer, Björn Landfeldt, Judy Kay, Robert Kummerfeld, Aaron J. Quigley, David West, Trent Apted, Gavin Sinclair, David J. Haniff, Roy Kalawsky, David Atkins, Martin Lewin, Steve J. Brown, Nahid Shahmehri, Johan Aberg, Dennis Maciuszek, Ioan Chisalita: Successful Aging. IEEE Pervasive Computing 3(2): 48-50 (2004)
[j1]
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Steven R. Shaw, Marc Keppler, Steven B. Leeb: Pre-estimation for better initial guesses. IEEE T. Instrumentation and Measurement 53(3): 762-769 (2004)