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Baozhen Li
2000 – 2009
- 2008
[c2]Shengnan Xu, Baozhen Li, Yanhua Shao: Neural Network Approach Based on Agent to Predict Stock Performance. CSSE (1) 2008: 1223-1225- 2006
[j3]Baozhen Li, Emmanuel Yashchin, Cathryn Christiansen, Jason Gill, Ronald Filippi, Timothy D. Sullivan: Application of three-parameter lognormal distribution in EM data analysis. Microelectronics Reliability 46(12): 2049-2055 (2006)- 2004
[j2]Baozhen Li, Timothy D. Sullivan, Tom C. Lee, Dinesh Badami: Reliability challenges for copper interconnects. Microelectronics Reliability 44(3): 365-380 (2004)
[c1]Baozhen Li, Nana Li, Xianfeng Liu: Transformation & Countermeasures on Business Operation Models in Uncertain Environment. ICEB 2004: 1001-1003- 2002
[j1]Fen Chen, Rolf-Peter Vollertsen, Baozhen Li, Dave Harmon, Wing L. Lai: A new empirical extrapolation method for time-dependent dielectric breakdown reliability projections of thin SiO2 and nitride-oxide dielectrics. Microelectronics Reliability 42(3): 335-341 (2002)
Coauthor Index
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last updated on 2012-12-02 21:37 CET by the dblp team



