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Fabrizio Lombardi
2010 – today
- 2013
[j119]Silvia Scarpetta, Ferdinando Giacco, Fabrizio Lombardi, Antonio de Candia: Effects of Poisson noise in a IF model with STDP and spontaneous replay of periodic spatiotemporal patterns, in absence of cue stimulation. Biosystems 112(3): 258-264 (2013)- [j118]T. Nandha Kumar, Fabrizio Lombardi: A Novel Heuristic Method for Application-Dependent Testing of a SRAM-Based FPGA Interconnect. IEEE Trans. Computers 62(1): 163-172 (2013)
- [c176]Geunho Cho, Fabrizio Lombardi: A novel and improved design of a ternary CNTFET-based cell. ACM Great Lakes Symposium on VLSI 2013: 131-136
- 2012
- [c175]Yang Lu, Fabrizio Lombardi, Salvatore Pontarelli, Marco Ottavi: On the design of two single event tolerant slave latches for scan delay testing. DFT 2012: 67-72
- [c174]Jianping Gong, Yong-Bin Kim, Fabrizio Lombardi, Jie Han: Hardening a memory cell for low power operation by gate leakage reduction. DFT 2012: 73-78
- [c173]Fabrizio Lombardi, Nohpill Park, Haider A. F. Almurib, T. Nandha Kumar: On the multiple fault detection of a nano crossbar. DFT 2012: 134-139
- [c172]Martin Omaña, Daniele Rossi, G. Collepalumbo, Cecilia Metra, Fabrizio Lombardi: Faults affecting the control blocks of PV arrays and techniques for their concurrent detection. DFT 2012: 199-204
- [c171]Fabrizio Lombardi, Wei Wei, Jie Han: Modeling a single electron turnstile in HSPICE. ACM Great Lakes Symposium on VLSI 2012: 221-226
- [c170]Pilin Junsangsri, Fabrizio Lombardi: A memristor-based TCAM (ternary content addressable memory) cell: design and evaluation. ACM Great Lakes Symposium on VLSI 2012: 311-314
- [c169]T. Nandha Kumar, Haider A. F. Almurib, Fabrizio Lombardi: Locating faults in application-dependent interconnects of SRAM based FPGAs. ICCD 2012: 453-459
- 2011
- [j117]
- [j116]Sheng Lin, Yong-Bin Kim, Fabrizio Lombardi: A 11-Transistor Nanoscale CMOS Memory Cell for Hardening to Soft Errors. IEEE Trans. VLSI Syst. 19(5): 900-904 (2011)
- [c168]Haider A. F. Almurib, T. Nandha Kumar, Fabrizio Lombardi: A Single-Configuration Method for Application-Dependent Testing of SRAM-based FPGA Interconnects. Asian Test Symposium 2011: 444-450
- [c167]Jinghang Liang, Jie Han, Fabrizio Lombardi: On the Reliable Performance of Sequential Adders for Soft Computing. DFT 2011: 3-10
- [c166]
- [c165]Masoud Zamani, Hossein Pedram, Fabrizio Lombardi: Templated-Based Asynchronous Design for Testable and Fail-Safe Operation. DFT 2011: 146-152
- [c164]Nachiket Rajderkar, Marco Ottavi, Salvatore Pontarelli, Jie Han, Fabrizio Lombardi: On the Effects of Intra-gate Resistive Open Defects in Gates at Nanoscaled CMOS. DFT 2011: 309-315
- [c163]Geunho Cho, Fabrizio Lombardi: On the Delay Analysis of Defective CNTFETs with Undeposited CNTs. DFT 2011: 419-425
- [c162]Pilin Junsangsri, Fabrizio Lombardi: A memristor-based memory cell using ambipolar operation. ICCD 2011: 148-153
- [c161]Sheng Lin, Yong-Bin Kim, Fabrizio Lombardi: Modeling and design of a nanoscale memory cell for hardening to a single event with multiple node upset. ICCD 2011: 320-325
- 2010
- [j115]Sheng Lin, Yong-Bin Kim, Fabrizio Lombardi: Design and analysis of a 32 nm PVT tolerant CMOS SRAM cell for low leakage and high stability. Integration 43(2): 176-187 (2010)
- [j114]Jianwei Dai, Lei Wang, Fabrizio Lombardi: An information-theoretic analysis of quantum-dot cellular automata for defect tolerance. JETC 6(3) (2010)
- [j113]
- [j112]Masoud Hashempour, Zahra Mashreghian Arani, Fabrizio Lombardi: Multiple Error Detection in DNA Self-Assembly Using Coded Tiles. IEEE Trans. on Circuits and Systems 57-II(9): 725-729 (2010)
- [c160]Young Bok Kim, Yong-Bin Kim, Fabrizio Lombardi: 8Gb/s capacitive low power and high speed 4-PWAM transceiver design. ACM Great Lakes Symposium on VLSI 2010: 33-38
- [c159]Sheng Lin, Yong-Bin Kim, Fabrizio Lombardi: Read-out schemes for a CNTFET-based crossbar memory. ACM Great Lakes Symposium on VLSI 2010: 167-170
- [c158]Xiaojun Ma, Masoud Hashempour, Lei Wang, Fabrizio Lombardi: Manufacturing yield of QCA circuits by synthesized DNA self-assembled templates. ACM Great Lakes Symposium on VLSI 2010: 275-280
- [e3]R. Iris Bahar, Fabrizio Lombardi, David Atienza, Erik Brunvand (Eds.): Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, Providence, Rhode Island, USA, May 16-18 2010. ACM 2010, ISBN 978-1-4503-0012-4
2000 – 2009
- 2009
- [j111]Masaru Fukushi, Susumu Horiguchi, Luke Demoracski, Fabrizio Lombardi: An Efficient Framework for Scalable Defect Isolation in Large Scale Networks of DNA Self-Assembly. J. Electronic Testing 25(1): 11-23 (2009)
- [j110]Masoud Hashempour, Zahra Mashreghian Arani, Fabrizio Lombardi: Healing DNA Self-Assemblies Using Punctures. J. Electronic Testing 25(1): 25-37 (2009)
- [j109]Xiaojun Ma, Jing Huang, Cecilia Metra, Fabrizio Lombardi: Detecting Multiple Faults in One-Dimensional Arrays of Reversible QCA Gates. J. Electronic Testing 25(1): 39-54 (2009)
- [j108]Faizal Karim, Marco Ottavi, Hamidreza Hashempour, Vamsi Vankamamidi, Konrad Walus, André Ivanov, Fabrizio Lombardi: Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits. J. Electronic Testing 25(1): 55-66 (2009)
- [j107]Weiguo Tang, Lei Wang, Fabrizio Lombardi: A defect/error-tolerant nanosystem architecture for DSP. JETC 5(4) (2009)
- [j106]Xiaojun Ma, Fabrizio Lombardi: On the Computational Complexity of Tile Set Synthesis for DNA Self-Assembly. IEEE Trans. on Circuits and Systems 56-II(1): 31-35 (2009)
- [j105]Kyung Ki Kim, Yong-Bin Kim, Fabrizio Lombardi: A Novel Statistical Timing and Leakage Power Characterization of Partially Depleted Silicon-on-Insulator Gates. IEEE T. Instrumentation and Measurement 58(2): 401-410 (2009)
- [j104]Minsu Choi, Fabrizio Lombardi, Nohpill Park: Introduction to the Special Section on Nanocircuits and Systems. IEEE Trans. VLSI Syst. 17(4): 470-472 (2009)
- [c157]Sheng Lin, Yong-Bin Kim, Fabrizio Lombardi: A Novel Hardened Design of a CMOS Memory Cell at 32nm. DFT 2009: 58-64
- [c156]Zahra Mashreghian Arani, Masoud Hashempour, Fabrizio Lombardi: Coded DNA Self-Assembly for Error Detection/Location. DFT 2009: 103-111
- [c155]Xiaojun Ma, Masoud Hashempour, Yong-Bin Kim, Fabrizio Lombardi: Errors in DNA Self-Assembly by Synthesized Tile Sets. DFT 2009: 112-120
- [c154]Sheng Lin, Yong-Bin Kim, Fabrizio Lombardi: Soft-Error Hardening Designs of Nanoscale CMOS Latches. VTS 2009: 41-46
- [e2]Fabrizio Lombardi, Sanjukta Bhanja, Yehia Massoud, R. Iris Bahar (Eds.): Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, Boston Area, MA, USA, May 10-12 2009. ACM 2009, ISBN 978-1-60558-522-2
- 2008
- [j103]Hamidreza Hashempour, Fabrizio Lombardi: Device Model for Ballistic CNFETs Using the First Conducting Band. IEEE Design & Test of Computers 25(2): 178-186 (2008)
- [j102]Salvatore Pontarelli, Marco Ottavi, Vamsi Vankamamidi, Gian-Carlo Cardarilli, Fabrizio Lombardi, Adelio Salsano: Analysis and Evaluations of Reliability of Reconfigurable FPGAs. J. Electronic Testing 24(1-3): 105-116 (2008)
- [j101]Xiaojun Ma, Fabrizio Lombardi: Substrate Testing on a Multi-Site/Multi-Probe ATE. J. Electronic Testing 24(1-3): 193-201 (2008)
- [j100]Byunghyun Jang, Yong-Bin Kim, Fabrizio Lombardi: Monomer Control for Error Tolerance in DNA Self-Assembly. J. Electronic Testing 24(1-3): 271-284 (2008)
- [j99]Xiaojun Ma, Jing Huang, Cecilia Metra, Fabrizio Lombardi: Reversible Gates and Testability of One Dimensional Arrays of Molecular QCA. J. Electronic Testing 24(1-3): 297-311 (2008)
- [j98]Xiaojun Ma, Jing Huang, Fabrizio Lombardi: A model for computing and energy dissipation of molecular QCA devices and circuits. JETC 3(4) (2008)
- [j97]
- [j96]Mohammad Hosseinabady, Shervin Sharifi, Fabrizio Lombardi, Zainalabedin Navabi: A Selective Trigger Scan Architecture for VLSI Testing. IEEE Trans. Computers 57(3): 316-328 (2008)
- [j95]Vamsi Vankamamidi, Marco Ottavi, Fabrizio Lombardi: A Serial Memory by Quantum-Dot Cellular Automata (QCA). IEEE Trans. Computers 57(5): 606-618 (2008)
- [j94]Vamsi Vankamamidi, Marco Ottavi, Fabrizio Lombardi: Two-Dimensional Schemes for Clocking/Timing of QCA Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 27(1): 34-44 (2008)
- [j93]Xiaojun Ma, Fabrizio Lombardi: Synthesis of Tile Sets for DNA Self-Assembly. IEEE Trans. on CAD of Integrated Circuits and Systems 27(5): 963-967 (2008)
- [j92]Kyung Ki Kim, Jing Huang, Yong-Bin Kim, Fabrizio Lombardi: Analysis and Simulation of Jitter Sequences for Testing Serial Data Channels. IEEE Trans. Industrial Informatics 4(2): 134-143 (2008)
- [j91]Hamidreza Hashempour, Fabrizio Lombardi: Evaluation and Analysis of Heuristic Techniques for Vector Ordering of VLSI Test Sets. IEEE T. Instrumentation and Measurement 57(9): 1998-2004 (2008)
- [c153]Stephen Frechette, Fabrizio Lombardi: Error Detection/Correction in DNA Algorithmic Self-Assembly. DATE 2008: 1079-1082
- [c152]
- [c151]Masoud Hashempour, Zahra Mashreghian Arani, Fabrizio Lombardi: A Tile-Based Error Model for Forward Growth of DNA Self-Assembly. DFT 2008: 516-524
- [c150]Stephen Frechette, Yong-Bin Kim, Fabrizio Lombardi: Checkpointing of Rectilinear Growth in DNA Self-Assembly. DFT 2008: 525-533
- [c149]Sheng Lin, Yong-Bin Kim, Fabrizio Lombardi: A low leakage 9t sram cell for ultra-low power operation. ACM Great Lakes Symposium on VLSI 2008: 123-126
- [c148]Vamsi Vankamamidi, Fabrizio Lombardi: Design of defect tolerant tile-based QCA circuits. ACM Great Lakes Symposium on VLSI 2008: 237-242
- [c147]Young Bok Kim, Yong-Bin Kim, Fabrizio Lombardi: Low power 8T SRAM using 32nm independent gate FinFET technology. SoCC 2008: 247-250
- [c146]Masoud Hashempour, Zahra Mashreghian Arani, Fabrizio Lombardi: A Metric for Assessing the Error Tolerance of Tile Sets for Punctured DNA Self-Assemblies. VTS 2008: 275-282
- 2007
- [j90]Fabrizio Lombardi, Cecilia Metra: Guest Editors' Introduction: The State of the Art in Nanoscale CAD. IEEE Design & Test of Computers 24(4): 302-303 (2007)
- [j89]Jing Huang, Mariam Momenzadeh, Fabrizio Lombardi: An Overview of Nanoscale Devices and Circuits. IEEE Design & Test of Computers 24(4): 304-311 (2007)
- [j88]Jing Huang, Mariam Momenzadeh, Fabrizio Lombardi: On the Tolerance to Manufacturing Defects in Molecular QCA Tiles for Processing-by-wire. J. Electronic Testing 23(2-3): 163-174 (2007)
- [j87]Sanjukta Bhanja, Marco Ottavi, Fabrizio Lombardi, Salvatore Pontarelli: QCA Circuits for Robust Coplanar Crossing. J. Electronic Testing 23(2-3): 193-210 (2007)
- [j86]Mohammad Hosseinabady, Pejman Lotfi-Kamran, Fabrizio Lombardi, Zainalabedin Navabi: Low overhead DFT using CDFG by modifying controller. IET Computers & Digital Techniques 1(4): 322-333 (2007)
- [j85]Jing Huang, Mariam Momenzadeh, Fabrizio Lombardi: Analysis of missing and additional cell defects in sequential quantum-dot cellular automata. Integration 40(4): 503-515 (2007)
- [j84]Jing Huang, Mariam Momenzadeh, Fabrizio Lombardi: Design of sequential circuits by quantum-dot cellular automata. Microelectronics Journal 38(4-5): 525-537 (2007)
- [j83]André DeHon, Craig S. Lent, Fabrizio Lombardi: Introduction to the Special Section on Nano Systems and Computing. IEEE Trans. Computers 56(2): 145-146 (2007)
- [j82]
- [j81]Shanrui Zhang, Minsu Choi, Nohpill Park, Fabrizio Lombardi: Cost-Driven Optimization of Coverage of Combined Built-In Self-Test/Automated Test Equipment Testing. IEEE T. Instrumentation and Measurement 56(3): 1094-1100 (2007)
- [j80]Hamidreza Hashempour, Fabrizio Lombardi, Warren Necoechea, R. Mehta, T. Alton: An Integrated Environment for Design Verification of ATE Systems. IEEE T. Instrumentation and Measurement 56(5): 1734-1743 (2007)
- [c145]Hamidreza Hashempour, Fabrizio Lombardi: Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube FETs. DATE 2007: 841-846
- [c144]Masaru Fukushi, Susumu Horiguchi, Luke Demoracski, Fabrizio Lombardi: A Scalable Framework for Defect Isolation of DNA Self-assemlbled Networks. DFT 2007: 391-399
- [c143]Masoud Hashempour, Zahra Mashreghian Arani, Fabrizio Lombardi: Error Tolerance of DNA Self-Healing Assemblies by Puncturing. DFT 2007: 400-408
- [c142]Jing Huang, Xiaojun Ma, Cecilia Metra, Fabrizio Lombardi: Testing Reversible One-Dimensional QCA Arrays for Multiple Faults. DFT 2007: 469-477
- [c141]Naghmeh Karimi, Shahrzad Mirkhani, Zainalabedin Navabi, Fabrizio Lombardi: RT level reliability enhancement by constructing dynamic TMRS. ACM Great Lakes Symposium on VLSI 2007: 172-175
- [c140]Xiaojun Ma, Jing Huang, Fabrizio Lombardi: Modeling facet roughening errors in self-assembly by snake tile sets. ITC 2007: 1-10
- [c139]Xiaojun Ma, Jing Huang, Fabrizio Lombardi: Error Tolerance in DNA Self-Assembly by (2k-1) x (2k-1) Snake Tile Sets. VTS 2007: 131-140
- [i1]Luca Schiano, Marco Ottavi, Fabrizio Lombardi, Salvatore Pontarelli, Adelio Salsano: On the Analysis of Reed Solomon Coding for Resilience to Transient/Permanent Faults in Highly Reliable Memories. CoRR abs/0710.4750 (2007)
- 2006
- [j79]Marco Ottavi, Luca Schiano, Fabrizio Lombardi, Douglas Tougaw: HDLQ: A HDL environment for QCA design. JETC 2(4): 243-261 (2006)
- [j78]
- [j77]Jien-Chung Lo, Cecilia Metra, Fabrizio Lombardi: Guest Editors' Introduction: Special Section on Design and Test of Systems-on-Chip (SoC). IEEE Trans. Computers 55(2): 97-98 (2006)
- [j76]Luca Schiano, Mariam Momenzadeh, Fengming Zhang, Young-Jun Lee, Thomas Kane, Solomon Max, Philip Perkins, Yong-Bin Kim, Fabrizio Lombardi, Fred J. Meyer: Measuring the timing jitter of ATE in the frequency domain. IEEE T. Instrumentation and Measurement 55(1): 280-289 (2006)
- [j75]Francesco Amigoni, Arnaldo Brandolini, Vincenzo Caglioti, Vincenzo Di Lecce, Andrea Guerriero, Massimo Lazzaroni, Fabrizio Lombardi, Roberto Ottoboni, Eros Pasero, Vincenzo Piuri, Olga Scotti, Damiano Marino Somenzi: Agencies for perception in environmental monitoring. IEEE T. Instrumentation and Measurement 55(4): 1038-1050 (2006)
- [j74]Marco Ottavi, Luca Schiano, Xiaopeng Wang, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi: Evaluating the Yield of Repairable SRAMs for ATE. IEEE T. Instrumentation and Measurement 55(5): 1704-1712 (2006)
- [c138]
- [c137]Sanjukta Bhanja, Marco Ottavi, Fabrizio Lombardi, Salvatore Pontarelli: Novel designs for thermally robust coplanar crossing in QCA. DATE 2006: 786-791
- [c136]Xiaojun Ma, Jing Huang, Cecilia Metra, Fabrizio Lombardi: Testing Reversible 1D Arrays for Molecular QCA. DFT 2006: 71-79
- [c135]Byunghyun Jang, Yong-Bin Kim, Fabrizio Lombardi: Error Tolerance of DNA Self-Assembly by Monomer Concentration Control. DFT 2006: 89-97
- [c134]Hamidreza Hashempour, Fabrizio Lombardi: A Novel Methodology for Functional Test Data Compression. DFT 2006: 128-135
- [c133]Salvatore Pontarelli, Marco Ottavi, Vamsi Vankamamidi, Adelio Salsano, Fabrizio Lombardi: Reliability Evaluation of Repairable/Reconfigurable FPGAs. DFT 2006: 227-235
- [c132]Fengming Zhang, Warren Necoechea, Peter Reiter, Yong-Bin Kim, Fabrizio Lombardi: Load Board Designs Using Compound Dot Technique and Phase Detector for Hierarchical ATE Calibrations. DFT 2006: 486-494
- [c131]Xiaojun Ma, Fabrizio Lombardi: Multi-Site and Multi-Probe Substrate Testing on an ATE. DFT 2006: 495-506
- 2005
- [j73]R. Iris Bahar, Mehdi Baradaran Tahoori, Sandeep K. Shukla, Fabrizio Lombardi: Guest Editors' Introduction: Challenges for Reliable Design at the Nanoscale. IEEE Design & Test of Computers 22(4): 295-297 (2005)
- [j72]Gian-Carlo Cardarilli, Fabrizio Lombardi, Marco Ottavi, Salvatore Pontarelli, Marco Re, Adelio Salsano: A Comparative Evaluation of Designs for Reliable Memory Systems. J. Electronic Testing 21(4): 429-444 (2005)
- [j71]Jing Huang, Mehdi Baradaran Tahoori, Fabrizio Lombardi: A probabilistic analysis of fault tolerance for switch block array in FPGAs. IJES 1(3/4): 250-262 (2005)
- [j70]Jing Huang, Mariam Momenzadeh, Luca Schiano, Marco Ottavi, Fabrizio Lombardi: Tile-based QCA design using majority-like logic primitives. JETC 1(3): 163-185 (2005)
- [j69]
- [j68]Hamidreza Hashempour, Fabrizio Lombardi: Application of Arithmetic Coding to Compression of VLSI Test Data. IEEE Trans. Computers 54(9): 1166-1177 (2005)
- [j67]Mariam Momenzadeh, Jing Huang, Mehdi Baradaran Tahoori, Fabrizio Lombardi: Characterization, test, and logic synthesis of and-or-inverter (AOI) gate design for QCA implementation. IEEE Trans. on CAD of Integrated Circuits and Systems 24(12): 1881-1893 (2005)
- [j66]Noh-Jin Park, K. M. George, Nohpill Park, Minsu Choi, Yong-Bin Kim, Fabrizio Lombardi: Environmental-based characterization of SoC-based instrumentation systems for stratified testing. IEEE T. Instrumentation and Measurement 54(3): 1241-1248 (2005)
- [j65]Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi: Evaluation, analysis, and enhancement of error resilience for reliable compression of VLSI test data. IEEE T. Instrumentation and Measurement 54(5): 1761-1769 (2005)
- [j64]Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi: Analysis and evaluation of multisite testing for VLSI. IEEE T. Instrumentation and Measurement 54(5): 1770-1778 (2005)
- [j63]Minsu Choi, Nohpill Park, Vincenzo Piuri, Fabrizio Lombardi: Reliability measurement of mass storage system for onboard instrumentation. IEEE T. Instrumentation and Measurement 54(6): 2297-2304 (2005)
- [j62]Jing Huang, Mehdi Baradaran Tahoori, Fabrizio Lombardi: Fault Tolerance of Switch Blocks and Switch Block Arrays in FPGA. IEEE Trans. VLSI Syst. 13(7): 794-807 (2005)
- [c130]Luca Schiano, Marco Ottavi, Fabrizio Lombardi, Salvatore Pontarelli, Adelio Salsano: On the Analysis of Reed Solomon Coding for Resilience to Transient/Permanent Faults in Highly Reliable Memories. DATE 2005: 580-585
- [c129]Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi: Evaluation of Error-Resilience for Reliable Compression of Test Data. DATE 2005: 1284-1289
- [c128]Mariam Momenzadeh, Jing Huang, Fabrizio Lombardi: Defect Characterization and Tolerance of QCA Sequential Devices and Circuits. DFT 2005: 199-207
- [c127]Mariam Momenzadeh, Marco Ottavi, Fabrizio Lombardi: Modeling QCA Defects at Molecular-level in Combinational Circuits. DFT 2005: 208-216
- [c126]Kyung Ki Kim, Jing Huang, Yong-Bin Kim, Fabrizio Lombardi: On the Modeling and Analysis of Jitter in ATE Using Matlab. DFT 2005: 285-293
- [c125]Kyung Ki Kim, Yong-Bin Kim, Fabrizio Lombardi: Data Dependent Jitter (DDJ) Characterization Methodology. DFT 2005: 294-304
- [c124]Pedram A. Riahi, Zainalabedin Navabi, Fabrizio Lombardi: Simulating Faults of Combinational IP Core-based SOCs in a PLI Environment. DFT 2005: 389-397
- [c123]Hamidreza Hashempour, Fabrizio Lombardi: Two dimensional reordering of functional test data for compression by ATE. ACM Great Lakes Symposium on VLSI 2005: 188-192
- [c122]Vamsi Vankamamidi, Marco Ottavi, Fabrizio Lombardi: Tile-based design of a serial memory in QCA. ACM Great Lakes Symposium on VLSI 2005: 201-206
- [c121]Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi: Enhancing error resilience for reliable compression of VLSI test data. ACM Great Lakes Symposium on VLSI 2005: 371-376
- [c120]Marco Ottavi, Luca Schiano, Fabrizio Lombardi, Salvatore Pontarelli, Gian-Carlo Cardarilli: Evaluating the Data Integrity of Memory Systems by Configurable Markov Models. ISVLSI 2005: 257-259
- [c119]Marco Ottavi, Vamsi Vankamamidi, Fabrizio Lombardi, Salvatore Pontarelli, Adelio Salsano: Design of a QCA Memory with Parallel Read/Serial Write. ISVLSI 2005: 292-294
- [c118]Mohammad Hosseinabady, Pejman Lotfi-Kamran, Pedram A. Riahi, Fabrizio Lombardi, Zainalabedin Navabi: A Flow Graph Technique for DFT Controller Modification. SoCC 2005: 55-60
- [c117]Hamidreza Hashempour, Fabrizio Lombardi: Improving Error Resilience for Compressed Test Sets by Don't Care Assignment. SoCC 2005: 65-68
- 2004
- [j61]André Ivanov, Fabrizio Lombardi, Cecilia Metra: Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates. IEEE Design & Test of Computers 21(4): 274-276 (2004)
- [j60]Zainalabedin Navabi, Shahrzad Mirkhani, Meisam Lavasani, Fabrizio Lombardi: Using RT Level Component Descriptions for Single Stuck-at Hierarchical Fault Simulation. J. Electronic Testing 20(6): 575-589 (2004)
- [j59]Minsu Choi, Nohpill Park, Vincenzo Piuri, Yong-Bin Kim, Fabrizio Lombardi: Balanced dual-stage repair for dependable embedded memory cores. Journal of Systems Architecture 50(5): 281-285 (2004)
- [j58]Bin Liu, Fabrizio Lombardi, Nohpill Park, Minsu Choi: Testing Layered Interconnection Networks. IEEE Trans. Computers 53(6): 710-722 (2004)
- [j57]Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi: Analysis and measurement of fault coverage in a combined ATE and BIST environment. IEEE T. Instrumentation and Measurement 53(2): 300-307 (2004)
- [j56]Farzin Karimi, Zainalabedin Navabi, Waleed Meleis, Fabrizio Lombardi: Using data compression in automatic test equipment for system-on-chip testing. IEEE T. Instrumentation and Measurement 53(2): 308-317 (2004)
- [j55]Minsu Choi, Nohpill Park, Vincenzo Piuri, Fabrizio Lombardi: Evaluating the repair of system-on-chip (SoC) using connectivity. IEEE T. Instrumentation and Measurement 53(6): 1464-1472 (2004)
- [j54]Jun Zhao, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi: Sequential diagnosis of processor array systems. IEEE Transactions on Reliability 53(4): 487-498 (2004)
- [c116]T. Feng, Byoungjae Jin, J. Wang, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi: Fault tolerant clockless wave pipeline design. Conf. Computing Frontiers 2004: 350-356
- [c115]Jing Huang, Mehdi Baradaran Tahoori, Fabrizio Lombardi: Fault Tolerance of Programmable Switch Blocks. DATE 2004: 1358-1359
- [c114]Mehdi Baradaran Tahoori, Fabrizio Lombardi: Testing of Quantum Dot Cellular Automata Based Designs. DATE 2004: 1408-1409
- [c113]Luca Schiano, Yong-Bin Kim, Fabrizio Lombardi: Scan Test of IP Cores in an ATE Environment. DELTA 2004: 281-286
- [c112]Xiaopeng Wang, Marco Ottavi, Fred J. Meyer, Fabrizio Lombardi: On The Yield of Compiler-Based eSRAMs. DFT 2004: 11-19
- [c111]Jing Huang, Mariam Momenzadeh, Mehdi Baradaran Tahoori, Fabrizio Lombardi: Defect Characterization for Scaling of QCA Devices. DFT 2004: 30-38
- [c110]Shanrui Zhang, Minsu Choi, Nohpill Park, Fabrizio Lombardi: Probabilistic Balancing of Fault Coverage and Test Cost in Combined Built-In Self-Test/Automated Test Equipment Testing Environment. DFT 2004: 48-56
- [c109]Jing Huang, Mehdi Baradaran Tahoori, Fabrizio Lombardi: On the Defect Tolerance of Nano-Scale Two-Dimensional Crossbars. DFT 2004: 96-104
- [c108]Xiaopeng Wang, Marco Ottavi, Fabrizio Lombardi: Testing of Inter-Word Coupling Faults in Word-Oriented SRAMs. DFT 2004: 111-119
- [c107]Hamidreza Hashempour, Fabrizio Lombardi: Compression of VLSI Test Data by Arithmetic Coding. DFT 2004: 150-157
- [c106]Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi: Error-Resilient Test Data Compression Using Tunstall Codes. DFT 2004: 316-323
- [c105]T. Feng, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi, Fred J. Meyer: Reliability Modeling and Assurance of Clockless Wave Pipeline. DFT 2004: 442-450
- [c104]Hamidreza Hashempour, Fabrizio Lombardi: Evaluation of heuristic techniques for test vector ordering. ACM Great Lakes Symposium on VLSI 2004: 96-99
- [c103]Marco Ottavi, Xiaopeng Wang, Fred J. Meyer, Fabrizio Lombardi: Simulation of reconfigurable memory core yield. ACM Great Lakes Symposium on VLSI 2004: 136-140
- [c102]Jing Huang, Mariam Momenzadeh, Mehdi Baradaran Tahoori, Fabrizio Lombardi: Design and characterization of an and-or-inverter (AOI) gate for QCA implementation. ACM Great Lakes Symposium on VLSI 2004: 426-429
- [c101]Jing Huang, Mehdi Baradaran Tahoori, Fabrizio Lombardi: Probabilistic Analysis of Fault Tolerance of FPGA Switch Block Array. IPDPS 2004
- [c100]Mariam Momenzadeh, Mehdi Baradaran Tahoori, Jing Huang, Fabrizio Lombardi: Quantum Cellular Automata: New Defects and Faults for New Devices. IPDPS 2004
- [c99]Jing Huang, Mehdi Baradaran Tahoori, Fabrizio Lombardi: Routability and Fault Tolerance of FPGA Interconnect Architectures. ITC 2004: 479-488
- [c98]Luca Schiano, Marco Ottavi, Fabrizio Lombardi: Markov Models of Fault-Tolerant Memory Systems under SEU. MTDT 2004: 38-43
- [c97]Mehdi Baradaran Tahoori, Mariam Momenzadeh, Jing Huang, Fabrizio Lombardi: Defects and Faults in Quantum Cellular Automata at Nano Scale. VTS 2004: 291-296
- 2003
- [j53]Soha Hassoun, Yong-Bin Kim, Fabrizio Lombardi: Guest Editors' Introduction: Clockless VLSI Systems. IEEE Design & Test of Computers 20(6): 5-8 (2003)
- [j52]Farzin Karimi, V. Swamy Irrinki, T. Crosby, Nohpill Park, Fabrizio Lombardi: Parallel testing of multi-port static random access memories. Microelectronics Journal 34(1): 3-21 (2003)
- [j51]Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi: Adaptive Algorithms for Maximal Diagnosis of Wiring Interconnects. IEEE Trans. Computers 52(10): 1259-1270 (2003)
- [j50]Minsu Choi, Nohpill Park, Fabrizio Lombardi: Modeling and analysis of fault tolerant multistage interconnection networks. IEEE T. Instrumentation and Measurement 52(5): 1509-1519 (2003)
- [j49]Nohpill Park, Fabrizio Lombardi: Guest Editorial. IEEE T. Instrumentation and Measurement 52(6): 1694-1695 (2003)
- [j48]Young-Jun Lee, Thomas Kane, Jong-Jin Lim, Young Jun Schiano, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max: Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment. IEEE T. Instrumentation and Measurement 52(6): 1749-1755 (2003)
- [j47]Jun Zhao, Fred J. Meyer, Fabrizio Lombardi, Nohpill Park: Maximal diagnosis of interconnects of random access memories. IEEE Transactions on Reliability 52(4): 423-434 (2003)
- [c96]Pedram A. Riahi, Zainalabedin Navabi, Fabrizio Lombardi: The VPI-Based Combinational IP Core Module-Based Mixed Level Serial Fault Simulation and Test Generation Methodology. Asian Test Symposium 2003: 274-277
- [c95]Pedram A. Riahi, Zainalabedin Navabi, Fabrizio Lombardi: Using Verilog VPI for Mixed Level Serial Fault Simulation in a Test Generation Environment. Embedded Systems and Applications 2003: 139-143
- [c94]Xiaopeng Wang, Marco Ottavi, Fabrizio Lombardi: Yield Analysis of Compiler-Based Arrays of Embedded SRAMs. DFT 2003: 3-10
- [c93]
- [c92]Hamidreza Hashempour, Fabrizio Lombardi: ATE-Amenable Test Data Compression with No Cyclic Scan. DFT 2003: 151-158
- [c91]Fengming Zhang, Young-Jun Lee, Thomas Kane, Luca Schiano, Mariam Momenzadeh, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max, Phil Perkinson: A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment. DFT 2003: 159-166
- [c90]Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi: Hybrid Multisite Testing at Manufacturing. ITC 2003: 927-936
- [c89]Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-Bin Kim, Vincenzo Piuri: Optimal Spare Utilization in Repairable and Reliable Memory Cores. MTDT 2003: 64-71
- [c88]Minsu Choi, Noh-Jin Park, K. M. George, Byoungjae Jin, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi: Fault Tolerant Memory Design for HW/SW Co-Reliability in Massively Parallel Computing Systems. NCA 2003: 341-
- 2002
- [j46]Jun Zhao, Fred J. Meyer, Fabrizio Lombardi: Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems. IEEE Design & Test of Computers 19(1): 54-64 (2002)
- [j45]Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Quality-effective repair of multichip module systems. Journal of Systems Architecture 47(10): 883-900 (2002)
- [j44]Dimiter R. Avresky, Barry W. Johnson, Fabrizio Lombardi: Guest Editors' Introduction. IEEE Trans. Computers 51(2): 97-99 (2002)
- [j43]Minsu Choi, Nohpill Park, Fabrizio Lombardi, Vincenzo Piuri: Quality enhancement of reconfigurable multichip module systems by redundancy utilization. IEEE T. Instrumentation and Measurement 51(4): 740-749 (2002)
- [j42]Nohpill Park, Fabrizio Lombardi: Analysis of stratified testing for multichip module systems. IEEE Transactions on Reliability 51(1): 100-110 (2002)
- [c87]Farzin Karimi, Waleed Meleis, Zainalabedin Navabi, Fabrizio Lombardi: Data Compression for System-on-Chip Testing Using ATE. DFT 2002: 166-176
- [c86]Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi: Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE. DFT 2002: 186-194
- [c85]
- [c84]Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-Bin Kim, Vincenzo Piuri: Balanced Redundancy Utilization in Embedded Memory Cores for Dependable Systems. DFT 2002: 419-427
- [c83]Y. Chang, Minsu Choi, Nohpill Park, Fabrizio Lombardi: Repairability Evaluation of Embedded Multiple Region DRAMs. DFT 2002: 428-436
- [c82]Farzin Karimi, Fabrizio Lombardi: A Scan-Bist Environment for Testing Embedded Memories. IOLTW 2002: 211-
- [c81]Minsu Choi, Nohpill Park, Fabrizio Lombardi: Hardware-Software Co-Reliability in Field Reconfigurable Multi-Processor-Memory Systems. IPDPS 2002
- [c80]Farzin Karimi, Fabrizio Lombardi: A Scan-Bist Environment for Testing Embedded Memories. MTDT 2002: 17-
- [c79]Farzin Karimi, Fred J. Meyer, Fabrizio Lombardi: Random Testing of Multi-Port Static Random Access Memories. MTDT 2002: 101-108
- [c78]Minsu Choi, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi: Hardware/Software Co-Reliability of Configurable Digital Systems. PRDC 2002: 67-74
- 2001
- [j41]Fabrizio Lombardi, Cecilia Metra: Guest Editors' Introduction: Defect-Oriented Diagnosis for Very Deep-Submicron Systems. IEEE Design & Test of Computers 18(1): 8-9 (2001)
- [j40]Dimiter R. Avresky, Fabrizio Lombardi, Karl-Erwin Großpietsch, Barry W. Johnson: Guest Editors' Introduction: Fault-Tolerant Embedded Systems. IEEE Micro 21(5): 12-15 (2001)
- [j39]Wenyi Feng, Farzin Karimi, Fabrizio Lombardi: Fault Detection in a Tristate System Environment. IEEE Micro 21(5): 77-85 (2001)
- [j38]Haldun Hadimioglu, David R. Kaeli, Fabrizio Lombardi: Introduction to the Special Section on High Performance Memory Systems. IEEE Trans. Computers 50(11): 1103-1104 (2001)
- [j37]Nohpill Park, Fabrizio Lombardi, Vincenzo Piuri: Testing and evaluating the quality-level of stratified multichip module instrumentation. IEEE T. Instrumentation and Measurement 50(6): 1615-1624 (2001)
- [c77]Xiao-Tao Chen, Wei-Kang Huang, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Novel Approaches for Fault Detection in Two-Dimensional Combinational Arrays. DFT 2001: 161-169
- [c76]Farzin Karimi, Fabrizio Lombardi: Parallel Testing of Multi-port Static Random Access Memories for BIST. DFT 2001: 271-279
- [c75]Farzin Karimi, Fabrizio Lombardi, V. Swamy Irrinki, T. Crosby: A Parallel Approach for Testing Multi-Port Static Random Access Memories. MTDT 2001: 73-
- [c74]Mohammad A. Al-Hashimi, Huay-min H. Pu, Nohpill Park, Fabrizio Lombardi: Dependability under Malicious Agreement in N-modular Redundancy-on-Demand Systems. NCA 2001: 80-93
- [c73]Minsu Choi, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Connectivity-Based Multichip Module Repair. PRDC 2001: 19-26
- [c72]Fabrizio Lombardi, Nohpill Park, Mohammad A. Al-Hashimi, Huay-min H. Pu: Modeling the Dependability of N-Modular Redundancy on Demand under Malicious Agreement. PRDC 2001: 68-75
- 2000
- [j36]Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi: An Approach for Detecting Multiple Faulty FPGA Logic Blocks. IEEE Trans. Computers 49(1): 48-54 (2000)
- [j35]Fabrizio Lombardi, Mariagiovanna Sami: Guest Editors' Introduction. IEEE Trans. Computers 49(6): 529-531 (2000)
- [j34]Jun Zhao, V. Swamy Irrinki, Mukesh Puri, Fabrizio Lombardi: Testing SRAM-Based Content Addressable Memories. IEEE Trans. Computers 49(10): 1054-1063 (2000)
- [j33]Tong Liu, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi: Testing and testable designs for one-time programmable FPGAs. IEEE Trans. on CAD of Integrated Circuits and Systems 19(11): 1370-1375 (2000)
- [c71]Bin Liu, Fabrizio Lombardi, Wei-Kang Huang: Testing programmable interconnect systems: an algorithmic approach. Asian Test Symposium 2000: 311-316
- [c70]Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Quality-Effective Repair of Multichip Module Systems. DFT 2000: 47-55
- [c69]
- [c68]Nohpill Park, S. J. Ruiwale, Fabrizio Lombardi: Testing the Configurability of Dynamic FPGAs. DFT 2000: 311-319
- [c67]Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi: Complexity Bounds for Lookup Table Implementation of Factored Forms in FPGA Technology Mapping. IPDPS Workshops 2000: 951-958
- [c66]Jun Zhao, Fred J. Meyer, Fabrizio Lombardi: Diagnosing the Interconnect of Bus-Connected Multi-RAM Systems under Restricted and General Fault Models. MTDT 2000: 14-19
- [c65]Jun Zhao, V. Swamy Irrinki, Mukesh Puri, Fabrizio Lombardi: Detection of Inter-Port Faults in Multi-Port Static RAMs. VTS 2000: 297-304
1990 – 1999
- 1999
- [j32]Bruce F. Cockburn, Fabrizio Lombardi, Fred J. Meyer: Guest Editors' Introduction: DRAM Architecture and Testing. IEEE Design & Test of Computers 16(1): 19-21 (1999)
- [j31]Xiao-Tao Chen, Wei-Kang Huang, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Design Verification of FPGA Implementations. IEEE Design & Test of Computers 16(2): 66-73 (1999)
- [j30]Jun Zhao, Fred J. Meyer, Fabrizio Lombardi: Adaptive Fault Detection and Diagnosis of RAM Interconnects. J. Electronic Testing 15(1-2): 157-171 (1999)
- [j29]Tong Liu, Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi: Test generation and scheduling for layout-based detection of bridge faults in interconnects. IEEE Trans. VLSI Syst. 7(1): 48-55 (1999)
- [c64]Yinlei Yu, Jian Xu, Wei-Kang Huang, Fabrizio Lombardi: Diagnosing Single Faults for Interconnects in SRAM Based FPGAs. ASP-DAC 1999: 283-286
- [c63]Wenyi Feng, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi: A BIST TPG Approach for Interconnect Testing With the IEEE 1149.1 STD. Asian Test Symposium 1999: 95-100
- [c62]Yinlei Yu, Jian Xu, Wei-Kang Huang, Fabrizio Lombardi: Minimizing the Number of Programming Steps for Diagnosis of Interconnect Faults in FPGAs. Asian Test Symposium 1999: 357-362
- [c61]Lan Zhao, D. M. H. Walker, Fabrizio Lombardi: IDDQ Testing of Input/Output Resources of SRAM-Based FPGAs. Asian Test Symposium 1999: 375-
- [c60]Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi: Novel Control Pattern Generators for Interconnect Testing with Boundary Scan. DFT 1999: 112-120
- [c59]Nohpill Park, Fabrizio Lombardi: Stratified Testing of Multichip Module Systems under Uneven Known-Good-Yield. DFT 1999: 192-200
- [c58]Fred J. Meyer, Fabrizio Lombardi, Jun Zhao: Good Processor Identification in Two-Dimensional Grids. DFT 1999: 348-356
- [c57]Wenyi Feng, Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi: Reconfiguration of One-Time Programmable FPGAs with Faulty Logic Resources. DFT 1999: 368-376
- [c56]Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi: Two-Step Algorithms for Maximal Diagnosis of Wiring Interconnects. FTCS 1999: 130-137
- [c55]Jun Zhao, Fred J. Meyer, Fabrizio Lombardi: Interconnect Diagnosis of Bus-Connected Multi-RAM Systems. MTDT 1999: 40-47
- [c54]Jian Xu, Paifa Si, Wei-Kang Huang, Fabrizio Lombardi: A Novel Fault Tolerant Approach for SRAM-Based FPGAs. PRDC 1999: 40-44
- [c53]Jun Zhao, Fred J. Meyer, Fabrizio Lombardi: Maximal Diagnosis of Interconnects of Random Access Memories. VTS 1999: 378-383
- 1998
- [j28]Fabrizio Lombardi: Field-Programmable Gate Arrays. IEEE Design & Test of Computers 15(1): 8-9 (1998)
- [j27]Lan Zhao, D. M. H. Walker, Fabrizio Lombardi: IDDQ Testing of Bridging Faults in Logic Resources of Reconfigurable Field Programmable Gate Arrays. IEEE Trans. Computers 47(10): 1136-1152 (1998)
- [j26]Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi: Structural diagnosis of interconnects by coloring. ACM Trans. Design Autom. Electr. Syst. 3(2): 249-271 (1998)
- [j25]Wei-Kang Huang, Fred J. Meyer, Xiao-Tao Chen, Fabrizio Lombardi: Testing configurable LUT-based FPGA's. IEEE Trans. VLSI Syst. 6(2): 276-283 (1998)
- [c52]Wenyi Feng, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi: Fault Detection in a Tristate System Environment. Asian Test Symposium 1998: 253-258
- [c51]Yinlei Yu, Jian Xu, Wei-Kang Huang, Fabrizio Lombardi: A Diagnosis Method for Interconnects in SRAM Based FPGAs. Asian Test Symposium 1998: 278-282
- [c50]Y. Bellan, Mario Costa, Giancarlo Ferrigno, Fabrizio Lombardi, Luca Macchiarulo, Alfonso Montuori, Eros Pasero, Camilla Rigotti: Artificial Neural Networks for Motion Emulation in Virtual Environments. CAPTECH 1998: 83-99
- [c49]Avinash Munshi, Fred J. Meyer, Fabrizio Lombardi: A New Method for Testing EEPLA's. DFT 1998: 146-154
- [c48]Wenyi Feng, Fred J. Meyer, Wei-Kang Huang, Fabrizio Lombardi: On the Complexity of Sequential Testing in Configurable FPGAs. DFT 1998: 164-
- [c47]Lan Zhao, D. M. H. Walker, Fabrizio Lombardi: Bridging Fault Detection in FPGA Interconnects Using IDDQ. FPGA 1998: 95-104
- [c46]Lan Zhao, D. M. H. Walker, Fabrizio Lombardi: Detection of bridging faults in logic resources of configurable FPGAs using I_DDQ. ITC 1998: 1037-1046
- [c45]Jun Zhao, Fred J. Meyer, Fabrizio Lombardi: Fault Detection and Diagnosis of Interconnects of Random Access Memories. VTS 1998: 42-47
- 1997
- [c44]Wei-Kang Huang, M. Y. Zhang, Fred J. Meyer, Fabrizio Lombardi: A XOR-Tree Based Technique for Constant Testability of Configurable FPGAs. Asian Test Symposium 1997: 248-253
- [c43]David Ashen, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi: Testing of programmable logic devices (PLD) with faulty resources. DFT 1997: 76-84
- [c42]Wei Liang Huang, Fred J. Meyer, Fabrizio Lombardi: Multiple fault detection in logic resources of FPGAs. DFT 1997: 186-194
- [c41]Fred J. Meyer, Xiao-Tao Chen, Wei-Kang Huang, Fabrizio Lombardi: Using Virtual Links for Reliable Information Retrieval Across Point-to-Point Networks. FTCS 1997: 216-225
- [c40]X. Tan, J. Tong, P. Tan, Nohpill Park, Fabrizio Lombardi: An Efficient Multi-Way Algorithm for Balanced Partitioning of VLSI Circuits. ICCD 1997: 608-613
- [c39]Yinan N. Shen, Xiao-Tao Chen, Susumu Horiguchi, Fabrizio Lombardi: On the multiple fault diagnosis of multistage interconnection networks: the lower bound and the CMOS fault model. ICPP 1997: 350-
- [c38]Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi: On the Fault Coverage of Interconnect Diagnosis. VTS 1997: 101-109
- 1996
- [j24]G. Buonannoa, Franco Fummi, Donatella Sciuto, Fabrizio Lombardi: FsmTest: Functional test generation for sequential circuits. Integration 20(3): 303-325 (1996)
- [j23]Yinan N. Shen, Fabrizio Lombardi: Graph Algorithms for Conformance Testing Using the Rural Chinese Postman Tour. SIAM J. Discrete Math. 9(4): 511-528 (1996)
- [j22]José Salinas, Yinan N. Shen, Fabrizio Lombardi: A Sweeping Line Approach to Interconnect Testing. IEEE Trans. Computers 45(8): 917-929 (1996)
- [j21]Chao Feng, Laxmi N. Bhuyan, Fabrizio Lombardi: Adaptive System-Level Diagnosis for Hypercube Multiprocessors. IEEE Trans. Computers 45(10): 1157-1170 (1996)
- [c37]Fabrizio Lombardi, David Ashen, Xiao-Tao Chen, Wei-Kang Huang: Diagnosing Programmable Interconnect Systems for FPGAs. FPGA 1996: 100-106
- [c36]Xiao-Tao Chen, Fabrizio Lombardi: A coloring approach to the structural diagnosis of interconnects. ICCAD 1996: 676-680
- [c35]Yinan N. Shen, Nohpill Park, Fabrizio Lombardi: Space Cutting Approaches for Repairing Memories. ICCD 1996: 106-111
- [c34]José Salinas, Nohpill Park, U. Arunkumar, Fabrizio Lombardi: Conformance Testing of Time-Dependent Protocols. ICECCS 1996: 257-264
- [c33]Wei-Kang Huang, Xiao-Tao Chen, Fabrizio Lombardi: On the diagnosis of programmable interconnect systems: Theory and application. VTS 1996: 204-211
- [c32]Wei-Kang Huang, Fabrizio Lombardi: An approach for testing programmable/configurable field programmable gate arrays. VTS 1996: 450-455
- 1995
- [j20]Tong Liu, Fabrizio Lombardi: Diagnosis of interconnects using a structured walking-1 approach. Integration 19(3): 181-198 (1995)
- [c31]Tong Liu, Wei-Kang Huang, Fabrizio Lombardi: Testing of Uncustomized Segmented Channel Field Programmable Gate Arrays. FPGA 1995: 125-131
- [c30]Chao Feng, Wei-Kang Huang, Fabrizio Lombardi: A New Diagnosis Approach for Short Faults in Interconnects. FTCS 1995: 331-339
- [c29]V. Purohit, Fabrizio Lombardi, Susumu Horiguchi, J. H. Kim: Diagnosing Multiple Bridge Faults in Baseline Multistage Interconnection Networks. ICPP (1) 1995: 131-135
- [c28]Tong Liu, Wei-Kang Huang, Fabrizio Lombardi, Laxmi N. Bhuyan: A Submesh Allocation Scheme for Mesh-Connected Multiprocessor Systems. ICPP (2) 1995: 159-163
- [c27]Amitabh Mishra, Yeimkuan Chang, Laxmi N. Bhuyan, Fabrizio Lombardi: Fault-tolerant sorting in SIMD hypercubes. IPPS 1995: 312-318
- [c26]Tong Liu, Fabrizio Lombardi, José Salinas: Diagnosis of interconnects and FPICs using a structured walking-1 approach. VTS 1995: 256-261
- 1994
- [j19]Hannu Kari, José Salinas, Fabrizio Lombardi: Generating non-standard random distributions for discrete event simulation systems. Simul. Pr. Theory 1(4): 173-193 (1994)
- [c25]Yinan N. Shen, Hannu Kari, S. S. Kim, Fabrizio Lombardi: Scheduling Policies for Fault Tolerance in a VLSI Processor. DFT 1994: 1-9
- [c24]
- [c23]José Salinas, Fabrizio Lombardi: Rank Order Filtering on an Array With Faulty Processors. ICPP (1) 1994: 236-240
- [c22]D. Schin, Yinan N. Shen, Fabrizio Lombardi: An Approach for UIO Generation for FSM Verification and Validation. ISCAS 1994: 303-306
- [c21]Hannu Kari, Heikki Saikkonen, Fabrizio Lombardi: Detecting Latent Sector Faults in Modern SCSI Disks. MASCOTS 1994: 403-404
- 1993
- [j18]Chao Feng, Jon C. Muzio, Fabrizio Lombardi: On the testability of array structures for FFT computation. J. Electronic Testing 4(3): 215-224 (1993)
- [j17]H. Lin, Fabrizio Lombardi, M. Lu: On the optimal reconfiguration of multipipeline arrays in the presence of faulty processing and switching elements. IEEE Trans. VLSI Syst. 1(1): 76-79 (1993)
- [c20]Hannu Kari, Heikki Saikkonen, Fabrizio Lombardi: Detection of Defective Media in Disks. DFT 1993: 49-55
- [c19]José Salinas, Fabrizio Lombardi: On the Reconfigurable Operation of Arrays with Defects for Image Processing. DFT 1993: 88-95
- [c18]José Salinas, Fabrizio Lombardi: Emulating Reconfigurable Arrays for Image Processing Using the MasPar Architecture. ICPP 1993: 141-148
- [c17]Chao Feng, Laxmi N. Bhuyan, Fabrizio Lombardi: An Adaptive System-Level Diagnosis Approach for Mesh Connected Multiprocessors. ICPP 1993: 153-157
- [c16]Hannu Kari, Heikki Saikkonen, Fabrizio Lombardi: On the Methods to Detect Sector Faults of a Disk Subsystem. MASCOTS 1993: 317-322
- [c15]Chao Feng, Laxmi N. Bhuyan, Fabrizio Lombardi: An Adaptive System-Level Diagnosis Approach for Hypercube Multiprocessors. SPDP 1993: 460-469
- [e1]Fabrizio Lombardi, Mariagiovanna Sami, Yvon Savaria, Renato Stefanelli (Eds.): The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy, Proceedings. IEEE Computer Society 1993, ISBN 0-8186-3502-9
- 1992
- [j16]Fabrizio Lombardi, Donatella Sciuto: Constant testability of combinational cellular tree structures. J. Electronic Testing 3(2): 139-148 (1992)
- [j15]Fabrizio Lombardi, Chao Feng, Wei-Kang Huang: Detection and Location of Multiple Faults in Baseline Interconnection Networks. IEEE Trans. Computers 41(10): 1340-1344 (1992)
- [j14]Yinan N. Shen, Fabrizio Lombardi, Anton T. Dahbura: Protocol conformance testing using multiple UIO sequences. IEEE Transactions on Communications 40(8): 1282-1287 (1992)
- [j13]Fabrizio Lombardi, Yinan N. Shen: Evaluation and improvement of fault coverage of conformance testing by UIO sequences. IEEE Transactions on Communications 40(8): 1288-1293 (1992)
- [c14]X. Sun, Yinan N. Shen, Fabrizio Lombardi: On the Verification and Validation of Protocols with High Fault Coverage Using UIO Sequences. SRDS 1992: 196-203
- 1991
- [c13]X. Sun, Yinan N. Shen, Fabrizio Lombardi, Donatella Sciuto: Protocol Conformance Testing by Discriminating UIO Sequences. PSTV 1991: 349-364
- [c12]Fabrizio Lombardi, Yinan N. Shen, Hannu Kari: On a new approach for enhancing the fault coverage of conformance testing of protocols. SPDP 1991: 428-435
- 1990
- [j12]Yinan N. Shen, Fabrizio Lombardi: Yield enhancement and manufacturing throughput of redundant memories by repairability/unrepairability detection. J. Electronic Testing 1(1): 43-57 (1990)
- [j11]Fabrizio Lombardi, Wei-Kang Huang: Fault Detection and Design Complextity in C-Testable VLSI Arrays. IEEE Trans. Computers 39(12): 1477-1481 (1990)
- [j10]Wei-Kang Huang, Fabrizio Lombardi: On the Constant Diagnosability of Baseline Interconnection Networks. IEEE Trans. Computers 39(12): 1485-1488 (1990)
- [j9]Wei-Kang Huang, Yinan N. Shen, Fabrizio Lombardi: New approaches for the repairs of memories with redundancy by row/column deletion for yield enhancement. IEEE Trans. on CAD of Integrated Circuits and Systems 9(3): 323-328 (1990)
- [c11]Peter Koo, Fabrizio Lombardi, Donatella Sciuto: A Routing Algorithm for Harvesting Multipipeline Arrays with Small Intercell and Pipeline Delays. ICCAD 1990: 2-5
- [c10]Yinan N. Shen, Fabrizio Lombardi, Donatella Sciuto: Evaluation and improvement of fault coverage for verification and validation of protocols. SPDP 1990: 200-207
- [c9]Fabrizio Lombardi, Yinan N. Shen, Jon C. Muzio: On the testability of array structures for FFT computation. SPDP 1990: 519-522
1980 – 1989
- 1989
- [j8]Fabrizio Lombardi, Mariagiovanna Sami, Renato Stefanelli: Reconfiguration of VLSI arrays by covering. IEEE Trans. on CAD of Integrated Circuits and Systems 8(9): 952-965 (1989)
- [c8]Aqil M. Azmi, Fabrizio Lombardi: On a tapered floating point system. IEEE Symposium on Computer Arithmetic 1989: 2-9
- [c7]Yinan N. Shen, Fabrizio Lombardi: Location and Identification for Single and Multiple Faults in Testable Redundant PLAs for Yield Enhancement. ITC 1989: 670-678
- [c6]Yinan N. Shen, Fabrizio Lombardi, Anton T. Dahbura: Protocol Conformance Testing Using Multiple UIO Sequences. PSTV 1989: 131-143
- 1988
- [j7]Fabrizio Lombardi: Analysis of Comparison-Based Diagnosable Systems Using Temporal Criteria. Comput. J. 31(3): 201-208 (1988)
- [j6]Donatella Sciuto, Fabrizio Lombardi: On Functional Testing of Array Processors. IEEE Trans. Computers 37(11): 1480-1484 (1988)
- [j5]Wei-Kang Huang, Fabrizio Lombardi: On an improved design approach for C-testable orthogonal iterative arrays. IEEE Trans. on CAD of Integrated Circuits and Systems 7(5): 609-615 (1988)
- [j4]Fabrizio Lombardi, Donatella Sciuto, Renato Stefanelli: An algorithm for functional reconfiguration of fixed-size arrays. IEEE Trans. on CAD of Integrated Circuits and Systems 7(10): 1114-1118 (1988)
- [c5]Fabrizio Lombardi, Wei-Kang Huang: Approaches for the repair of VLSI/WSI RRAMs by row/column deletion. FTCS 1988: 342-347
- [c4]Salih Yurttas, Fabrizio Lombardi: New Approaches for the Reconfiguration of Two-Dimensional VLSI Arrays Using Time-Redundancy. RTSS 1988: 212-221
- 1987
- [j3]Chin-Long Wey, Fabrizio Lombardi: On a Novel Self-Test Approach to Digital Testing. Comput. J. 30(3): 258-267 (1987)
- [j2]A. Kovaleski, S. Ratheal, Fabrizio Lombardi: An Architecture and an Interconnection Scheme for Time-Sliced Buses. J. Parallel Distrib. Comput. 4(2): 209-229 (1987)
- [j1]Chin-Long Wey, Fabrizio Lombardi: On the Repair of Redundant RAM's. IEEE Trans. on CAD of Integrated Circuits and Systems 6(2): 222-231 (1987)
- [c3]Fabrizio Lombardi, Donatella Sciuto, Renato Stefanelli: A Technique for Reconfiguring Two Dimensional VLSI Arrays. RTSS 1987: 44-53
- 1986
- [c2]A. Kovaleski, S. Ratheal, Fabrizio Lombardi: An Architecture and an Interconnection Scheme for Time-Sliced Buses in Real-Time Processing. RTSS 1986: 20-27
- 1985
- [c1]Fabrizio Lombardi, Chin-Long Wey: On a Multiprocessor System with Dynamic Redundancy. RTSS 1985: 3-12
Coauthor Index
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last updated on 2013-06-07 21:36 CEST by the dblp team