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Kun-Lun Luo

2010 – today

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2011
[j1]
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  - electronic edition via DOI
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  dblp key:
  - journals/tvlsi/SuHWLW11
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Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Kun-Lun Luo, Wen Ching Wu: A Built-in Self-Diagnosis and Repair Design With Fail Pattern Identification for Memories. IEEE Trans. VLSI Syst. 19(12): 2184-2194 (2011)

2000 – 2009

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2006
[c2]
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  dblp key:
  - conf/itc/LinLCCLW06
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Shih Ping Lin, Chung-Len Lee, Jwu E. Chen, Ji-Jan Chen, Kun-Lun Luo, Wen Ching Wu: A Multilayer Data Copy Scheme for Low Cost Test with Controlled Scan-In Power for Multiple Scan Chain Designs. ITC 2006: 1-8
2004
[c1]
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  - electronic edition @ ieeecomputersociety.org
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  dblp key:
  - conf/ats/HuangSWLLC04
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Rei-Fu Huang, Chin-Lung Su, Cheng-Wen Wu, Shen-Tien Lin, Kun-Lun Luo, Yeong-Jar Chang: Fail Pattern Identification for Memory Built-In Self-Repair. Asian Test Symposium 2004: 366-371

Coauthor Index

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What is the meaning of the colors in the coauthor index?