DBLP: Yashwant K. Malaiya

	2012
c37		Omar H. Alhazmi, Yashwant K. Malaiya: Assessing Disaster Recovery Alternatives: On-Site, Colocation or Cloud. ISSRE Workshops 2012: 19-20
	2011
j16		Sung-Whan Woo, HyunChul Joh, Omar H. Alhazmi, Yashwant K. Malaiya: Modeling vulnerability discovery process in Apache and IIS HTTP servers. Computers & Security 30(1): 50-62 (2011)
	2010
c36		Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird: Principal Component Analysis-based compensation for measurement errors due to mechanical misalignments in PCB testing. ITC 2010: 467-476
	2009
c35		HyunChul Joh, Yashwant K. Malaiya: Seasonal Variation in the Vulnerability Discovery Process. ICST 2009: 191-200
c34		Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird: An outlier detection based approach for PCB testing. ITC 2009: 1-10
	2008
j15		Omar H. Alhazmi, Yashwant K. Malaiya: Application of Vulnerability Discovery Models to Major Operating Systems. IEEE Transactions on Reliability 57(1): 14-22 (2008)
j14		Shen Hui Wu, Sridhar Jandhyala, Yashwant K. Malaiya, Anura P. Jayasumana: Antirandom Testing: A Distance-Based Approach. VLSI Design 2008 (2008)
c33		HyunChul Joh, Yashwant K. Malaiya: Seasonality in Vulnerability Discovery in Major Software Systems. ISSRE 2008: 297-298
c32		HyunChul Joh, Jinyoo Kim, Yashwant K. Malaiya: Vulnerability Discovery Modeling Using Weibull Distribution. ISSRE 2008: 299-300
	2007
j13		Omar H. Alhazmi, Yashwant K. Malaiya, Indrajit Ray: Measuring, analyzing and predicting security vulnerabilities in software systems. Computers & Security 26(3): 219-228 (2007)
c31		Jinyoo Kim, Yashwant K. Malaiya, Indrakshi Ray: Vulnerability Discovery in Multi-Version Software Systems. HASE 2007: 141-148
	2006
c30		Omar H. Alhazmi, Sung-Whan Woo, Yashwant K. Malaiya: Security vulnerability categories in major software systems. Communication, Network, and Information Security 2006: 138-143
c29		Sung-Whan Woo, Omar H. Alhazmi, Yashwant K. Malaiya: Assessing Vulnerabilities in Apache and IIS HTTP Servers. DASC 2006: 103-110
c28		Omar H. Alhazmi, Yashwant K. Malaiya: Measuring and Enhancing Prediction Capabilities of Vulnerability Discovery Models for Apache and IIS HTTP Servers. ISSRE 2006: 343-352
c27		Ashutosh Sharma, Anura P. Jayasumana, Yashwant K. Malaiya: X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data. VTS 2006: 180-185
	2005
c26		Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley, Yashwant K. Malaiya: Dynamic power minimization during combinational circuit testing as a traveling salesman problem. Congress on Evolutionary Computation 2005: 1088-1095
c25		Omar H. Alhazmi, Yashwant K. Malaiya, Indrajit Ray: Security Vulnerabilities in Software Systems: A Quantitative Perspective. DBSec 2005: 281-294
c24		Omar H. Alhazmi, Yashwant K. Malaiya: Modeling the Vulnerability Discovery Process. ISSRE 2005: 129-138
	2004
c23		Jiao Chen, Yashwant K. Malaiya: Augmenting Test Case Generation Using Statechart. Software Engineering Research and Practice 2004: 608-614
	2002
j12		Yashwant K. Malaiya, Michael Naixin Li, James M. Bieman, Rick Karcich: Software reliability growth with test coverage. IEEE Transactions on Reliability 51(4): 420-426 (2002)
	2000
c22		Yashwant K. Malaiya, Jason Denton: Module Size Distribution and Defect Density. ISSRE 2000: 62-71
	1998
c21		Yashwant K. Malaiya, Jason Denton: Estimating the Number of Residual Defects. HASE 1998: 98-
c20		Shen Hui Wu, Yashwant K. Malaiya, Anura P. Jayasumana: Antirandom vs. pseudorandom testing. ICCD 1998: 221-223
	1997
c19		Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana: Input Pattern Classification for Detection of Stuck-ON and Bridging Faults Using I/sub DDQ/ Testing in BiCMOS and CMOS Circuits. VLSI Design 1997: 545-546
	1996
c18		Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya: Input Pattern Classification for Transistor Level Testing of Bridging Faults in BiCMOS Circuits. Great Lakes Symposium on VLSI 1996: 214-219
	1995
c17		Anura P. Jayasumana, Yashwant K. Malaiya, Sankaran M. Menon: A Novel High-Speed BiCMOS Domino Logic Family. ISCAS 1995: 21-24
c16		Ramanagopal V. Vogety, Yashwant K. Malaiya, Anura P. Jayasumana: Interconnection of FDDI-II networks through an ATM backbone - An analysis. LCN 1995: 150-
	1994
c15		Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong: The Effect of Built-In Current Sensors (BICS) on Operational and Test Performance. VLSI Design 1994: 187-190
c14		Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya: Input pattern classification for transistor level testing of BiCMOS circuits. VTS 1994: 457-462
	1993
j11		Yashwant K. Malaiya, Anneliese von Mayrhauser, Pradip K. Srimani: An Examination of Fault Exposure Ratio. IEEE Trans. Software Eng. 19(11): 1087-1094 (1993)
j10		W. K. Al-Assadi, Yashwant K. Malaiya, Anura P. Jayasumana: Faulty behavior of storage elements and its effects on sequential circuits. IEEE Trans. VLSI Syst. 1(4): 446-452 (1993)
c13		Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya: Test Generation for BiCMOS Circuits. ISCAS 1993: 1987-1990
c12		W. K. Al-Assadi, Yashwant K. Malaiya, Anura P. Jayasumana: Use of Storage Elements as Primitives for Modelling Faults in Synchronous Sequential Circuits. VLSI Design 1993: 118-123
	1992
j9		Yashwant K. Malaiya: Guest Editor's Introduction: VLSI Design 92. IEEE Design & Test of Computers 9(4): 4-5 (1992)
j8		Pradip K. Srimani, Yashwant K. Malaiya: Steps to Practical Reliability Meassurement - Guest Editors' Introduction. IEEE Software 9(4): 10-12 (1992)
j7		Nachimuthu Karunanithi, Darrell Whitley, Yashwant K. Malaiya: Using Neural Networks in Reliability Prediction. IEEE Software 9(4): 53-59 (1992)
j6		Nachimuthu Karunanithi, Darrell Whitley, Yashwant K. Malaiya: Prediction of Software Reliability Using Connectionist Models. IEEE Trans. Software Eng. 18(7): 563-574 (1992)
	1991
j5		Yinghua Min, Yashwant K. Malaiya, Boping Jin: Analysis of Detection Capability of Parallel Signature Analyzers. IEEE Trans. Computers 40(9): 1075-1081 (1991)
c11		Yashwant K. Malaiya, Pradip K. Srimani: An Introduction to Software Reliability Models. Int. CMG Conference 1991: 1237-1239
	1990
c10		S. Hwang, Rochit Rajsuman, Yashwant K. Malaiya: On the testing of microprogrammed processor. MICRO 1990: 260-266
	1989
j4		Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana: Limitations of switch level analysis for bridging faults. IEEE Trans. on CAD of Integrated Circuits and Systems 8(7): 807-811 (1989)
c9		Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya: CMOS Stuck-open Fault Detection Using Single Test Patterns. DAC 1989: 714-717
c8		Yashwant K. Malaiya: On inherent untestability of unaugmented microprogrammed control. MICRO 1989: 88-96
	1988
c7		Yashwant K. Malaiya, S. Feng: Design of a testable RISC-to-CISC control architecture. MICRO 1988: 57-59
	1987
c6		Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana: On Accuracy of Switch-Level Modeling of Bridging Faults in Complex Gates. DAC 1987: 244-250
	1985
c5		Yashwant K. Malaiya: Faults in Microprogrammed and Hardwired Control. ITC 1985: 732
	1984
c4		Yashwant K. Malaiya, Shoubao Yang: The Coverage Problem for Random Testing. ITC 1984: 237-245
	1983
c3		Yashwant K. Malaiya, Ramesh Narayanaswamy: Testing for Timing Faults in Synchronous Sequential Integrated Circuits. ITC 1983: 560-573
	1982
c2		Yashwant K. Malaiya, Stephen Y. H. Su: A New Fault Model and Testing Technique for CMOS Devices. ITC 1982: 25-34
	1981
j3		Yashwant K. Malaiya, Stephen Y. H. Su: Reliability Measure of Hardware Redundancy Fault-Tolerant Digital Systems with Intermittent Faults. IEEE Trans. Computers 30(8): 600-604 (1981)
j2		Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya: Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits. IEEE Trans. Computers 30(12): 989-995 (1981)
c1		Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya: State Diagram Approach for Functional Testing of Control Section. ITC 1981: 433-446
	1978
j1		Stephen Y. H. Su, Israel Koren, Yashwant K. Malaiya: A Continous-Parameter Markov Model and Detection Procedures for Intermittent Faults. IEEE Trans. Computers 27(6): 567-570 (1978)

2012

c37

Omar H. Alhazmi, Yashwant K. Malaiya: Assessing Disaster Recovery Alternatives: On-Site, Colocation or Cloud. ISSRE Workshops 2012: 19-20

2011

j16

Sung-Whan Woo, HyunChul Joh, Omar H. Alhazmi, Yashwant K. Malaiya: Modeling vulnerability discovery process in Apache and IIS HTTP servers. Computers & Security 30(1): 50-62 (2011)

2010

c36

Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird: Principal Component Analysis-based compensation for measurement errors due to mechanical misalignments in PCB testing. ITC 2010: 467-476

2009

c35

HyunChul Joh, Yashwant K. Malaiya: Seasonal Variation in the Vulnerability Discovery Process. ICST 2009: 191-200

c34

Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird: An outlier detection based approach for PCB testing. ITC 2009: 1-10

2008

j15

Omar H. Alhazmi, Yashwant K. Malaiya: Application of Vulnerability Discovery Models to Major Operating Systems. IEEE Transactions on Reliability 57(1): 14-22 (2008)

j14

Shen Hui Wu, Sridhar Jandhyala, Yashwant K. Malaiya, Anura P. Jayasumana: Antirandom Testing: A Distance-Based Approach. VLSI Design 2008 (2008)

c33

HyunChul Joh, Yashwant K. Malaiya: Seasonality in Vulnerability Discovery in Major Software Systems. ISSRE 2008: 297-298

c32

HyunChul Joh, Jinyoo Kim, Yashwant K. Malaiya: Vulnerability Discovery Modeling Using Weibull Distribution. ISSRE 2008: 299-300

2007

j13

Omar H. Alhazmi, Yashwant K. Malaiya, Indrajit Ray: Measuring, analyzing and predicting security vulnerabilities in software systems. Computers & Security 26(3): 219-228 (2007)

c31

Jinyoo Kim, Yashwant K. Malaiya, Indrakshi Ray: Vulnerability Discovery in Multi-Version Software Systems. HASE 2007: 141-148

2006

c30

Omar H. Alhazmi, Sung-Whan Woo, Yashwant K. Malaiya: Security vulnerability categories in major software systems. Communication, Network, and Information Security 2006: 138-143

c29

Sung-Whan Woo, Omar H. Alhazmi, Yashwant K. Malaiya: Assessing Vulnerabilities in Apache and IIS HTTP Servers. DASC 2006: 103-110

c28

Omar H. Alhazmi, Yashwant K. Malaiya: Measuring and Enhancing Prediction Capabilities of Vulnerability Discovery Models for Apache and IIS HTTP Servers. ISSRE 2006: 343-352

c27

Ashutosh Sharma, Anura P. Jayasumana, Yashwant K. Malaiya: X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data. VTS 2006: 180-185

2005

c26

Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley, Yashwant K. Malaiya: Dynamic power minimization during combinational circuit testing as a traveling salesman problem. Congress on Evolutionary Computation 2005: 1088-1095

c25

Omar H. Alhazmi, Yashwant K. Malaiya, Indrajit Ray: Security Vulnerabilities in Software Systems: A Quantitative Perspective. DBSec 2005: 281-294

c24

Omar H. Alhazmi, Yashwant K. Malaiya: Modeling the Vulnerability Discovery Process. ISSRE 2005: 129-138

2004

c23

Jiao Chen, Yashwant K. Malaiya: Augmenting Test Case Generation Using Statechart. Software Engineering Research and Practice 2004: 608-614

2002

j12

Yashwant K. Malaiya, Michael Naixin Li, James M. Bieman, Rick Karcich: Software reliability growth with test coverage. IEEE Transactions on Reliability 51(4): 420-426 (2002)

2000

c22

Yashwant K. Malaiya, Jason Denton: Module Size Distribution and Defect Density. ISSRE 2000: 62-71

1998

c21

Yashwant K. Malaiya, Jason Denton: Estimating the Number of Residual Defects. HASE 1998: 98-

c20

Shen Hui Wu, Yashwant K. Malaiya, Anura P. Jayasumana: Antirandom vs. pseudorandom testing. ICCD 1998: 221-223

1997

c19

Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana: Input Pattern Classification for Detection of Stuck-ON and Bridging Faults Using I/sub DDQ/ Testing in BiCMOS and CMOS Circuits. VLSI Design 1997: 545-546

1996

c18

Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya: Input Pattern Classification for Transistor Level Testing of Bridging Faults in BiCMOS Circuits. Great Lakes Symposium on VLSI 1996: 214-219

1995

c17

Anura P. Jayasumana, Yashwant K. Malaiya, Sankaran M. Menon: A Novel High-Speed BiCMOS Domino Logic Family. ISCAS 1995: 21-24

c16

Ramanagopal V. Vogety, Yashwant K. Malaiya, Anura P. Jayasumana: Interconnection of FDDI-II networks through an ATM backbone - An analysis. LCN 1995: 150-

1994

c15

Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong: The Effect of Built-In Current Sensors (BICS) on Operational and Test Performance. VLSI Design 1994: 187-190

c14

Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya: Input pattern classification for transistor level testing of BiCMOS circuits. VTS 1994: 457-462

1993

j11

Yashwant K. Malaiya, Anneliese von Mayrhauser, Pradip K. Srimani: An Examination of Fault Exposure Ratio. IEEE Trans. Software Eng. 19(11): 1087-1094 (1993)

j10

W. K. Al-Assadi, Yashwant K. Malaiya, Anura P. Jayasumana: Faulty behavior of storage elements and its effects on sequential circuits. IEEE Trans. VLSI Syst. 1(4): 446-452 (1993)

c13

Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya: Test Generation for BiCMOS Circuits. ISCAS 1993: 1987-1990

c12

W. K. Al-Assadi, Yashwant K. Malaiya, Anura P. Jayasumana: Use of Storage Elements as Primitives for Modelling Faults in Synchronous Sequential Circuits. VLSI Design 1993: 118-123

1992

Yashwant K. Malaiya: Guest Editor's Introduction: VLSI Design 92. IEEE Design & Test of Computers 9(4): 4-5 (1992)

Pradip K. Srimani, Yashwant K. Malaiya: Steps to Practical Reliability Meassurement - Guest Editors' Introduction. IEEE Software 9(4): 10-12 (1992)

Nachimuthu Karunanithi, Darrell Whitley, Yashwant K. Malaiya: Using Neural Networks in Reliability Prediction. IEEE Software 9(4): 53-59 (1992)

Nachimuthu Karunanithi, Darrell Whitley, Yashwant K. Malaiya: Prediction of Software Reliability Using Connectionist Models. IEEE Trans. Software Eng. 18(7): 563-574 (1992)

1991

Yinghua Min, Yashwant K. Malaiya, Boping Jin: Analysis of Detection Capability of Parallel Signature Analyzers. IEEE Trans. Computers 40(9): 1075-1081 (1991)

c11

Yashwant K. Malaiya, Pradip K. Srimani: An Introduction to Software Reliability Models. Int. CMG Conference 1991: 1237-1239

1990

c10

S. Hwang, Rochit Rajsuman, Yashwant K. Malaiya: On the testing of microprogrammed processor. MICRO 1990: 260-266

1989

Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana: Limitations of switch level analysis for bridging faults. IEEE Trans. on CAD of Integrated Circuits and Systems 8(7): 807-811 (1989)

Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya: CMOS Stuck-open Fault Detection Using Single Test Patterns. DAC 1989: 714-717

Yashwant K. Malaiya: On inherent untestability of unaugmented microprogrammed control. MICRO 1989: 88-96

1988

Yashwant K. Malaiya, S. Feng: Design of a testable RISC-to-CISC control architecture. MICRO 1988: 57-59

1987

Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana: On Accuracy of Switch-Level Modeling of Bridging Faults in Complex Gates. DAC 1987: 244-250

1985

Yashwant K. Malaiya: Faults in Microprogrammed and Hardwired Control. ITC 1985: 732

1984

Yashwant K. Malaiya, Shoubao Yang: The Coverage Problem for Random Testing. ITC 1984: 237-245

1983

Yashwant K. Malaiya, Ramesh Narayanaswamy: Testing for Timing Faults in Synchronous Sequential Integrated Circuits. ITC 1983: 560-573

1982

Yashwant K. Malaiya, Stephen Y. H. Su: A New Fault Model and Testing Technique for CMOS Devices. ITC 1982: 25-34

1981

Yashwant K. Malaiya, Stephen Y. H. Su: Reliability Measure of Hardware Redundancy Fault-Tolerant Digital Systems with Intermittent Faults. IEEE Trans. Computers 30(8): 600-604 (1981)

Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya: Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits. IEEE Trans. Computers 30(12): 989-995 (1981)

Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya: State Diagram Approach for Functional Testing of Control Section. ITC 1981: 433-446

1978

Stephen Y. H. Su, Israel Koren, Yashwant K. Malaiya: A Continous-Parameter Markov Model and Detection Procedures for Intermittent Faults. IEEE Trans. Computers 27(6): 567-570 (1978)

1	W. K. Al-Assadi	[j10] [c12]
2	Omar H. Alhazmi	[c37] [j16] [j15] [j13] [c30] [c29] [c28] [c25] [c24]
3	Anneliese Amschler Andrews (Anneliese von Mayrhauser)	[j11]
4	James M. Bieman	[j12]
5	Jiao Chen	[c23]
6	Jason Denton	[c22] [c21]
7	S. Feng	[c7]
8	Xin He	[c36] [c34]
9	Stephen Hird	[c36] [c34]
10	S. Hwang	[c10]
11	Sri Jandhyala (Sridhar Jandhyala)	[j14]
12	Anura P. Jayasumana	[c36] [c34] [j14] [c27] [c20] [c19] [c18] [c17] [c16] [c15] [c14] [j10] [c13] [c12] [j4] [c9] [c6]
13	Boping Jin	[j5]
14	HyunChul Joh	[j16] [c35] [c33] [c32]
15	Rick Karcich	[j12]
16	Nachimuthu Karunanithi	[j7] [j6]
17	Jinyoo Kim	[c32] [c31]
18	Israel Koren	[j1]
19	Michael Naixin Li	[j12]
20	Chi-Chang Liaw	[j2] [c1]
21	Sankaran M. Menon	[c19] [c18] [c17] [c15] [c14] [c13]
22	Yinghua Min	[j5]
23	Ramesh Narayanaswamy	[c3]
24	Kenneth P. Parker	[c36] [c34]
25	Rochit Rajsuman	[c10] [j4] [c9] [c6]
26	Indrajit Ray	[j13] [c25]
27	Indrakshi Ray	[c31]
28	Alodeep Sanyal	[c26]
29	Ashutosh Sharma	[c27]
30	Artem Sokolov	[c26]
31	Pradip K. Srimani	[j11] [j8] [c11]
32	Stephen Y. H. Su	[c2] [j3] [j2] [c1] [j1]
33	Carol Q. Tong	[c15]
34	Ramanagopal V. Vogety	[c16]
35	L. Darrell Whitley (Darrell Whitley)	[c26] [j7] [j6]
36	Sung-Whan Woo	[j16] [c30] [c29]
37	Shen Hui Wu	[j14] [c20]
38	Shoubao Yang	[c4]

Yashwant K. Malaiya

Coauthor Index