Vezio Malandruccolo

Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, Wolfgang Fichtner: A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment. J. Electronic Testing 27(1): 19-30 (2011)

Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, M. Hommel, Wolfgang Fichtner: A new built-in screening methodology for Successive Approximation Register Analog to Digital Converters. Microelectronics Reliability 50(9-11): 1750-1757 (2010)

Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner: Novel built-in methodology for defect testing of capacitor oxide in SAR analog to digital converters for critical automotive applications. European Test Symposium 2010: 170-174

Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, Wolfgang Fichtner: A new built-in screening methodology to achieve zero defects in the automotive environment. Microelectronics Reliability 49(9-11): 1334-1340 (2009)

Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner: Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications. European Test Symposium 2009: 67-72