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Andreas Martin

2010 – today

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2011
[c5]
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  - conf/aaaiss/BranderHMT11
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Simon Brander, Knut Hinkelmann, Andreas Martin, Barbara Thönssen: Mining of Agile Business Processes. AAAI Spring Symposium: AI for Business Agility 2011
[c4]
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  - conf/bpm/BranderHHMRTW11
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Simon Brander, Knut Hinkelmann, Bo Hu, Andreas Martin, Uwe V. Riss, Barbara Thönssen, Hans Friedrich Witschel: Refining Process Models through the Analysis of Informal Work Practice. BPM 2011: 116-131
2010
[j7]
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  - journals/mcma/PrigarinMW10
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Sergei Prigarin, Andreas Martin, Gerhard Winkler: Simulation of binary random fields with Gaussian numerical models. Monte Carlo Meth. and Appl. 16(2): 129-142 (2010)
[c3]
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  - conf/bpm/WitschelHRTBMH10
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Hans Friedrich Witschel, Bo Hu, Uwe V. Riss, Barbara Thönssen, Roman Brun, Andreas Martin, Knut Hinkelmann: A Collaborative Approach to Maturing Process-Related Knowledge. BPM 2010: 343-358
[c2]
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Andreas Martin, Roman Brun: Agile Process Execution with Kissmir. SBPM 2010: 36-41

2000 – 2009

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2006
[c1]
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  - conf/icsoc/WerthLDZM06
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Dirk Werth, Katrina Leyking, Florian Dreifus, Jörg Ziemann, Andreas Martin: Managing SOA Through Business Services - A Business-Oriented Approach to Service-Oriented Architectures. ICSOC Workshops 2006: 3-13
2005
[j6]
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  - journals/mr/Martin05
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Andreas Martin: Reliability of gate dielectrics and metal-insulator-metal capacitors. Microelectronics Reliability 45(5-6): 834-840 (2005)
2004
[j5]
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  - journals/mr/MartinV04
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Andreas Martin, Rolf-Peter Vollertsen: An introduction to fast wafer level reliability monitoring for integrated circuit mass production. Microelectronics Reliability 44(8): 1209-1231 (2004)
2003
[j4]
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  - journals/ijcm/MartinPW03
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Andreas Martin, Sergei Prigarin, Gerhard Winkler: Exact and fast numerical algorithms for the stochastic wave equation. Int. J. Comput. Math. 80(12): 1535-1541 (2003)
[j3]
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  - journals/mr/MartinHA03
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Andreas Martin, Jochen von Hagen, Glenn B. Alers: Ramped current stress for fast and reliable wafer level reliability monitoring of thin gate oxide reliability. Microelectronics Reliability 43(8): 1215-1220 (2003)
2001
[j2]
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  - journals/mr/Martin01
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Andreas Martin: Editorial. Microelectronics Reliability 41(7): 935 (2001)
[j1]
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  - journals/mr/DiestelMKSEMP01
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Gunnar Diestel, Andreas Martin, Martin Kerber, Alfred Schlemm, Horst Erlenmaier, Bernhard Murr, Andreas Preussger: Quality assessment of thin oxides using constant and ramped stress measurements. Microelectronics Reliability 41(7): 1019-1022 (2001)