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Meryem Marzouki
2000 – 2009
- 2007
[j5]Meryem Marzouki: Identity control, activity control: from trust to suspicion. Annales des Télécommunications 62(11-12): 1207-1222 (2007)- 2002
[j4]Mounir Benabdenbi, Walid Maroufi, Meryem Marzouki: CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing. J. Electronic Testing 18(4-5): 455-473 (2002)- 2001
[j3]P. Bukovjan, L. Ducerf-Bourbon, Meryem Marzouki: Cost/Quality Trade-off in Synthesis for BIST. J. Electronic Testing 17(2): 109-119 (2001)
[c5]Mounir Benabdenbi, Walid Maroufi, Meryem Marzouki: Testing TAPed cores and wrapped cores with the same test access mechanism. DATE 2001: 150-155- 2000
[c4]Mounir Benabdenbi, Walid Maroufi, Meryem Marzouki: CAS-BUS: A Scalable and Reconfigurable Test Access Mechanism for Systems on a Chip. DATE 2000: 141-145
1990 – 1999
- 1997
[c3]J. Abraham, P. Frankl, Christian Landrault, Meryem Marzouki, Paolo Prinetto, Chantal Robach, Pascale Thévenod-Fosse: Hardware Test: Can We Learn from Software Testing? VTS 1997: 320-321- 1996
[j2]Firas Mohamed, Meryem Marzouki: Test and diagnosis of analog circuits: When fuzziness can lead to accuracy. J. Electronic Testing 9(1-2): 203-216 (1996)
[c2]Vladimir Castro Alves, A. Ribeiro Antunes, Meryem Marzouki: A Pragmatic, Systematic And Flexible Synthesis For Testability Methodology. Asian Test Symposium 1996: 263-268- 1993
[c1]Meryem Marzouki, Marcelo Lubaszewski, Mohamed Hedi Touati: Unifying test and diagnosis of interconnects and logic clusters in partial boundary scan boards. ICCAD 1993: 654-657- 1991
[j1]Meryem Marzouki: Model-based reasoning for electron-beam debugging of VLSI circuits. J. Electronic Testing 2(4): 385-394 (1991)
Coauthor Index
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last updated on 2012-12-02 21:32 CET by the dblp team



