Please note: This is a beta version of the new dblp website.
You can find the classic dblp view of this page here.
You can find the classic dblp view of this page here.
Lloyd W. Massengill
2010 – today
- 2011
[j2]Nadia Rezzak, Michael L. Alles, Ronald D. Schrimpf, Sarah Kalemeris, Lloyd W. Massengill, John Sochacki, Hugh J. Barnaby: The sensitivity of radiation-induced leakage to STI topology and sidewall doping. Microelectronics Reliability 51(5): 889-894 (2011)
2000 – 2009
- 2008
[j1]Patrick R. Fleming, Brian D. Olson, W. Timothy Holman, Bharat L. Bhuva, Lloyd W. Massengill: Design Technique for Mitigation of Soft Errors in Differential Switched-Capacitor Circuits. IEEE Trans. on Circuits and Systems 55-II(9): 838-842 (2008)
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last updated on 2012-12-02 21:36 CET by the dblp team



