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 | 2012 | |
|---|---|---|
| j1 |      | Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez: Analysis and Fault Modeling of Actual Resistive Defects in ATMEL [InlineMediaObject not available: see fulltext.] eFlash Memories. J. Electronic Testing 28(2): 215-228 (2012) |
| 2011 | ||
| c3 | | Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez: On using a SPICE-like TSTAC™ eFlash model for design and test. DDECS 2011: 359-364 |
| 2010 | ||
| c2 | | Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez: A two-layer SPICE model of the ATMEL TSTACTM eFlash memory technology for defect injection and faulty behavior prediction. European Test Symposium 2010: 81-86 |
| 2009 | ||
| c1 | | Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard: NAND flash testing: A preliminary study on actual defects. ITC 2009: 1 |
| 1 | Alberto Bosio | |
| 2 | Luigi Dilillo | |
| 3 | Gilles Festes | |
| 4 | Patrick Girard | |
| 5 | Benoît Godard | |
| 6 | Serge Pravossoudovitch | |
| 7 | Laurent Vachez | |
| 8 | Arnaud Virazel |
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