- CSB - MetaPress - Google - Bing - Yahoo
 | 2012 | |
|---|---|---|
| c4 |      | C. Metzler, Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel: Through-Silicon-Via resistive-open defect analysis. European Test Symposium 2012: 1 |
| 2003 | ||
| c3 | | George Logothetis, Klaus Schneider, C. Metzler: Exact Low-Level Runtime Analysis of Synchronous Programs for Formal Verification of Real-Time Systems. FDL 2003: 385-405 |
| c2 | | George Logothetis, Klaus Schneider, C. Metzler: Generating Formal Models for Real-Time Verification by Exact Low-Level Runtime Analysis of Synchronous Programs. RTSS 2003: 256-264 |
| c1 | | George Logothetis, Klaus Schneider, C. Metzler: Runtime Analysis of Synchronous Programs for Low-Level Real-Time Verification. SBCCI 2003: 211-216 |
| 1 | Alberto Bosio | |
| 2 | Luigi Dilillo | |
| 3 | Patrick Girard | |
| 4 | George Logothetis | |
| 5 | Klaus Schneider | |
| 6 | Aida Todri (Aida Todri-Sanial) | |
| 7 | Arnaud Virazel |
Colors in the list of coauthors
Last update Mon May 20 21:00:19 2013 CET by the DBLP Team —
Data released under the ODC-BY 1.0 license — See also our legal information page