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 | 2006 | |
|---|---|---|
| j26 |      | Luca Schiano, Mariam Momenzadeh, Fengming Zhang, Young-Jun Lee, Thomas Kane, Solomon Max, Philip Perkins, Yong-Bin Kim, Fabrizio Lombardi, Fred J. Meyer: Measuring the timing jitter of ATE in the frequency domain. IEEE T. Instrumentation and Measurement 55(1): 280-289 (2006) |
| j25 | | Marco Ottavi, Luca Schiano, Xiaopeng Wang, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi: Evaluating the Yield of Repairable SRAMs for ATE. IEEE T. Instrumentation and Measurement 55(5): 1704-1712 (2006) |
| 2005 | ||
| j24 | | Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi: Analysis and evaluation of multisite testing for VLSI. IEEE T. Instrumentation and Measurement 54(5): 1770-1778 (2005) |
| c29 | | Zachary D. Patitz, Nohpill Park, Minsu Choi, Fred J. Meyer: QCA-Based Majority Gate Design under Radius of Effect-Induced Faults. DFT 2005: 217-228 |
| 2004 | ||
| j23 | | Cristiana Bolchini, Fred J. Meyer: Guest editorial. Journal of Systems Architecture 50(5): 237-238 (2004) |
| j22 | | Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi: Analysis and measurement of fault coverage in a combined ATE and BIST environment. IEEE T. Instrumentation and Measurement 53(2): 300-307 (2004) |
| j21 | | Jun Zhao, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi: Sequential diagnosis of processor array systems. IEEE Transactions on Reliability 53(4): 487-498 (2004) |
| c28 | | Xiaopeng Wang, Marco Ottavi, Fred J. Meyer, Fabrizio Lombardi: On The Yield of Compiler-Based eSRAMs. DFT 2004: 11-19 |
| c27 | | T. Feng, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi, Fred J. Meyer: Reliability Modeling and Assurance of Clockless Wave Pipeline. DFT 2004: 442-450 |
| c26 | | Marco Ottavi, Xiaopeng Wang, Fred J. Meyer, Fabrizio Lombardi: Simulation of reconfigurable memory core yield. ACM Great Lakes Symposium on VLSI 2004: 136-140 |
| 2003 | ||
| j20 | | Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi: Adaptive Algorithms for Maximal Diagnosis of Wiring Interconnects. IEEE Trans. Computers 52(10): 1259-1270 (2003) |
| j19 | | Fred J. Meyer, Nohpill Park: Predicting Defect-Tolerant Yield in the Embedded Core Context. IEEE Trans. Computers 52(11): 1470-1479 (2003) |
| j18 | | Young-Jun Lee, Thomas Kane, Jong-Jin Lim, Young Jun Schiano, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max: Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment. IEEE T. Instrumentation and Measurement 52(6): 1749-1755 (2003) |
| j17 | | Jun Zhao, Fred J. Meyer, Fabrizio Lombardi, Nohpill Park: Maximal diagnosis of interconnects of random access memories. IEEE Transactions on Reliability 52(4): 423-434 (2003) |
| c25 | | Fengming Zhang, Young-Jun Lee, Thomas Kane, Luca Schiano, Mariam Momenzadeh, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max, Phil Perkinson: A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment. DFT 2003: 159-166 |
| c24 | | Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi: Hybrid Multisite Testing at Manufacturing. ITC 2003: 927-936 |
| 2002 | ||
| j16 | | Jun Zhao, Fred J. Meyer, Fabrizio Lombardi: Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems. IEEE Design & Test of Computers 19(1): 54-64 (2002) |
| j15 | | Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Quality-effective repair of multichip module systems. Journal of Systems Architecture 47(10): 883-900 (2002) |
| c23 | | Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi: Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE. DFT 2002: 186-194 |
| c22 | | Farzin Karimi, Fred J. Meyer, Fabrizio Lombardi: Random Testing of Multi-Port Static Random Access Memories. MTDT 2002: 101-108 |
| 2001 | ||
| c21 | | Xiao-Tao Chen, Wei-Kang Huang, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Novel Approaches for Fault Detection in Two-Dimensional Combinational Arrays. DFT 2001: 161-169 |
| c20 | | Minsu Choi, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Connectivity-Based Multichip Module Repair. PRDC 2001: 19-26 |
| 2000 | ||
| j14 | | Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi: An Approach for Detecting Multiple Faulty FPGA Logic Blocks. IEEE Trans. Computers 49(1): 48-54 (2000) |
| j13 | | Tong Liu, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi: Testing and testable designs for one-time programmable FPGAs. IEEE Trans. on CAD of Integrated Circuits and Systems 19(11): 1370-1375 (2000) |
| c19 | | Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Quality-Effective Repair of Multichip Module Systems. DFT 2000: 47-55 |
| c18 | | Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi: Complexity Bounds for Lookup Table Implementation of Factored Forms in FPGA Technology Mapping. IPDPS Workshops 2000: 951-958 |
| c17 | | Jun Zhao, Fred J. Meyer, Fabrizio Lombardi: Diagnosing the Interconnect of Bus-Connected Multi-RAM Systems under Restricted and General Fault Models. MTDT 2000: 14-19 |
| 1999 | ||
| j12 |  | Bruce F. Cockburn, Fabrizio Lombardi, Fred J. Meyer: Guest Editors' Introduction: DRAM Architecture and Testing. IEEE Design & Test of Computers 16(1): 19-21 (1999) |
| j11 | | Xiao-Tao Chen, Wei-Kang Huang, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Design Verification of FPGA Implementations. IEEE Design & Test of Computers 16(2): 66-73 (1999) |
| j10 | | Jun Zhao, Fred J. Meyer, Fabrizio Lombardi: Adaptive Fault Detection and Diagnosis of RAM Interconnects. J. Electronic Testing 15(1-2): 157-171 (1999) |
| j9 | | Tong Liu, Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi: Test generation and scheduling for layout-based detection of bridge faults in interconnects. IEEE Trans. VLSI Syst. 7(1): 48-55 (1999) |
| c16 | | Wenyi Feng, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi: A BIST TPG Approach for Interconnect Testing With the IEEE 1149.1 STD. Asian Test Symposium 1999: 95-100 |
| c15 | | Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi: Novel Control Pattern Generators for Interconnect Testing with Boundary Scan. DFT 1999: 112-120 |
| c14 | | Fred J. Meyer, Fabrizio Lombardi, Jun Zhao: Good Processor Identification in Two-Dimensional Grids. DFT 1999: 348-356 |
| c13 | | Wenyi Feng, Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi: Reconfiguration of One-Time Programmable FPGAs with Faulty Logic Resources. DFT 1999: 368-376 |
| c12 | | Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi: Two-Step Algorithms for Maximal Diagnosis of Wiring Interconnects. FTCS 1999: 130-137 |
| c11 | | Jun Zhao, Fred J. Meyer, Fabrizio Lombardi: Interconnect Diagnosis of Bus-Connected Multi-RAM Systems. MTDT 1999: 40-47 |
| c10 | | Jun Zhao, Fred J. Meyer, Fabrizio Lombardi: Maximal Diagnosis of Interconnects of Random Access Memories. VTS 1999: 378-383 |
| 1998 | ||
| j8 | | Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi: Structural diagnosis of interconnects by coloring. ACM Trans. Design Autom. Electr. Syst. 3(2): 249-271 (1998) |
| j7 | | Wei-Kang Huang, Fred J. Meyer, Xiao-Tao Chen, Fabrizio Lombardi: Testing configurable LUT-based FPGA's. IEEE Trans. VLSI Syst. 6(2): 276-283 (1998) |
| c9 | | Wenyi Feng, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi: Fault Detection in a Tristate System Environment. Asian Test Symposium 1998: 253-258 |
| c8 | | Avinash Munshi, Fred J. Meyer, Fabrizio Lombardi: A New Method for Testing EEPLA's. DFT 1998: 146-154 |
| c7 | | Wenyi Feng, Fred J. Meyer, Wei-Kang Huang, Fabrizio Lombardi: On the Complexity of Sequential Testing in Configurable FPGAs. DFT 1998: 164- |
| c6 | | Jun Zhao, Fred J. Meyer, Fabrizio Lombardi: Fault Detection and Diagnosis of Interconnects of Random Access Memories. VTS 1998: 42-47 |
| 1997 | ||
| c5 | | Wei-Kang Huang, M. Y. Zhang, Fred J. Meyer, Fabrizio Lombardi: A XOR-Tree Based Technique for Constant Testability of Configurable FPGAs. Asian Test Symposium 1997: 248-253 |
| c4 | | David Ashen, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi: Testing of programmable logic devices (PLD) with faulty resources. DFT 1997: 76-84 |
| c3 | | Wei Liang Huang, Fred J. Meyer, Fabrizio Lombardi: Multiple fault detection in logic resources of FPGAs. DFT 1997: 186-194 |
| c2 | | Fred J. Meyer, Xiao-Tao Chen, Wei-Kang Huang, Fabrizio Lombardi: Using Virtual Links for Reliable Information Retrieval Across Point-to-Point Networks. FTCS 1997: 216-225 |
| c1 | | Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi: On the Fault Coverage of Interconnect Diagnosis. VTS 1997: 101-109 |
| 1993 | ||
| j6 | | Dhiraj K. Pradhan, Fred J. Meyer: Communication structures in fault-tolerant distributed systems. Networks 23(4): 379-389 (1993) |
| j5 | | D. D. Sharma, Fred J. Meyer, Dhiraj K. Pradhan: Yield optimization of modular and redundant multimegabit RAMs: a study of effectiveness of coding versus static redundancy using the center-satellite model. IEEE Trans. VLSI Syst. 1(4): 546-558 (1993) |
| 1991 | ||
| j4 | | Fred J. Meyer, Dhiraj K. Pradhan: Consensus With Dual Failure Modes. IEEE Trans. Parallel Distrib. Syst. 2(2): 214-222 (1991) |
| 1989 | ||
| j3 | | Fred J. Meyer, Dhiraj K. Pradhan: Dynamic Testing Strategy for Distributed Systems. IEEE Trans. Computers 38(3): 356-365 (1989) |
| j2 | | Fred J. Meyer, Dhiraj K. Pradhan: Modeling Defect Spatial Distribution. IEEE Trans. Computers 38(4): 538-546 (1989) |
| 1988 | ||
| j1 | | Fred J. Meyer, Dhiraj K. Pradhan: Flip-Trees: Fault-Tolerant Graphs with Wide Containers. IEEE Trans. Computers 37(4): 472-478 (1988) |
Colors in the list of coauthors
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