Salvador Mir

Haralampos-G. D. Stratigopoulos, Salvador Mir: Adaptive Alternate Analog Test. IEEE Design & Test of Computers 29(4): 71-79 (2012)

Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir, Camelia Hora, Yizi Xing, Bram Kruseman: Diagnosis of Local Spot Defects in Analog Circuits. IEEE T. Instrumentation and Measurement 61(10): 2701-2712 (2012)

Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet: Testing RF circuits with true non-intrusive built-in sensors. DATE 2012: 1090-1095

Asma Laraba, Haralampos-G. D. Stratigopoulos, Salvador Mir, Herve Naudet, Christophe Forel: Enhanced reduced code linearity test technique for multi-bit/stage pipeline ADCs. European Test Symposium 2012: 1-6

Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma: Experiences with non-intrusive sensors for RF built-in test. ITC 2012: 1-8

Nourredine Akkouche, Salvador Mir, Emmanuel Simeu, Mustapha Slamani: Analog/RF test ordering in the early stages of production testing. VTS 2012: 25-30

Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma: RF Front-End Test Using Built-in Sensors. IEEE Design & Test of Computers 28(6): 76-84 (2011)

Ahcène Bounceur, Salvador Mir, Haralampos-G. D. Stratigopoulos: Estimation of Analog Parametric Test Metrics Using Copulas. IEEE Trans. on CAD of Integrated Circuits and Systems 30(9): 1400-1410 (2011)

Alexios Spyronasios, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir: On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study. Asian Test Symposium 2011: 365-370

Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir: Implicit test of high-speed analog circuits using non-intrusive sensors. ECCTD 2011: 652

Fabio Cenni, Jeremie Cazalbou, Salvador Mir, Libor Rufer: Design of a SAW-based chemical sensor with its microelectronics front-end interface. Microelectronics Journal 41(11): 723-732 (2010)

Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir: Bayesian Fault Diagnosis of RF Circuits Using Nonparametric Density Estimation. Asian Test Symposium 2010: 295-298

Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir: Fault diagnosis of analog circuits based on machine learning. DATE 2010: 1761-1766

Gustavo P. Rehder, Salvador Mir, Libor Rufer, Emmanuel Simeu, Hoang Nam Nguyen: Low Frequency Test for RF MEMS Switches. DELTA 2010: 350-354

Louay Abdallah, Haralampos-G. D. Stratigopoulos, Christophe Kelma, Salvador Mir: Sensors for built-in alternate RF test. European Test Symposium 2010: 49-54

Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev: Defect filter for alternate RF test. European Test Symposium 2010: 265-270

Haralampos-G. D. Stratigopoulos, Salvador Mir: Analog test metrics estimates with PPM accuracy. ICCAD 2010: 241-247

Rafik Khereddine, Louay Abdallah, Emmanuel Simeu, Salvador Mir, Fabio Cenni: Adaptive Logical Control of RF LNA Performances for Efficient Energy Consumption. VLSI-SoC (Selected Papers) 2010: 43-68

Rafik Khereddine, Louay Abdallah, Emmanuel Simeu, Salvador Mir, Fabio Cenni: Adaptive logical control of RF LNA performances for efficient energy consumption. VLSI-SoC 2010: 161-166

Salvador Mir, Haralampos-G. D. Stratigopoulos, Ahcène Bounceur: Density estimation for analog/RF test problem solving. VTS 2010: 41

Nourredine Akkouche, Salvador Mir, Emmanuel Simeu: Ordering of analog specification tests based on parametric defect level estimation. VTS 2010: 301-306

Achraf Dhayni, Salvador Mir, Libor Rufer, Ahcène Bounceur, Emmanuel Simeu: Pseudorandom BIST for test and characterization of linear and nonlinear MEMS. Microelectronics Journal 40(7): 1054-1061 (2009)

Haralampos-G. D. Stratigopoulos, Salvador Mir, Ahcène Bounceur: Evaluation of Analog/RF Test Measurements at the Design Stage. IEEE Trans. on CAD of Integrated Circuits and Systems 28(4): 582-590 (2009)

Haralampos-G. D. Stratigopoulos, Salvador Mir, Yiorgos Makris: Enrichment of limited training sets in machine-learning-based analog/RF test. DATE 2009: 1668-1673

Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev: Defect Filter for Alternate RF Test. European Test Symposium 2009: 101-106

Matthieu Dubois, Haralampos-G. D. Stratigopoulos, Salvador Mir: Hierarchical parametric test metrics estimation: A ΣΔ converter BIST case study. ICCD 2009: 78-83

Livier Lizarraga, Salvador Mir, Gilles Sicard: Experimental Validation of a BIST Techcnique for CMOS Active Pixel Sensors. VTS 2009: 189-194

Emmanuel Simeu, Hoang Nam Nguyen, Philippe Cauvet, Salvador Mir, Libor Rufer, Rafik Khereddine: Using Signal Envelope Detection for Online and Offline RF MEMS Switch Testing. VLSI Design 2008 (2008)

Haralampos-G. D. Stratigopoulos, Jeanne Tongbong, Salvador Mir: A General Method to Evaluate RF BIST Techniques Based on Non-parametric Density Estimation. DATE 2008: 68-73

Ahcène Bounceur, Salvador Mir, Emmanuel Simeu, Luís Rolíndez: Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing. J. Electronic Testing 23(6): 471-484 (2007)

Jeanne Tongbong, Salvador Mir, Jean-Louis Carbonéro: Interactive presentation: Evaluation of test measures for LNA production testing using a multinormal statistical model. DATE 2007: 731-736

Emmanuel Simeu, Salvador Mir, R. Kherreddine, Hoang Nam Nguyen: Envelope Detection Based Transition Time Supervision for Online Testing of RF MEMS Switches. IOLTS 2007: 237-243

Luís Rolíndez, Salvador Mir, Jean-Louis Carbonéro, Dimitri Goguet, Nabil Chouba: A stereo audio Σ∑ ADC architecture with embedded SNDR self-test. ITC 2007: 1-10

Salvador Mir, Kwang-Ting (Tim) Cheng, Andrew Richardson: Guest Editorial. J. Electronic Testing 22(4-6): 311 (2006)

Luís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro: A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting. J. Electronic Testing 22(4-6): 325-335 (2006)

Salvador Mir, Libor Rufer, Achraf Dhayni: Built-in-self-test techniques for MEMS. Microelectronics Journal 37(12): 1591-1597 (2006)

Achraf Dhayni, Salvador Mir, Libor Rufer, Ahcène Bounceur: Pseudorandom functional BIST for linear and nonlinear MEMS. DATE 2006: 664-669

Ahcène Bounceur, Salvador Mir, Luís Rolíndez, Emmanuel Simeu: CAT platform for analogue and mixed-signal test evaluation and optimization. VLSI-SoC 2006: 320-325

Livier Lizarraga, Salvador Mir, Gilles Sicard, Ahcène Bounceur: Study of a BIST Technique for CMOS Active Pixel Sensors. VLSI-SoC 2006: 326-331

Luís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro: A SNDR BIST for Sigma-Delta Analogue-to-Digital Converters. VTS 2006: 314-319

Libor Rufer, Salvador Mir, Emmanuel Simeu, C. Domingues: On-Chip Pseudorandom MEMS Testing. J. Electronic Testing 21(3): 233-241 (2005)

Bozena Kaminska, Stephen K. Sunter, Salvador Mir: Analog and mixed signal test techniques for SOC development. Microelectronics Journal 36(12): 1063 (2005)

Guillaume Prenat, Salvador Mir, Diego Vázquez, Luís Rolíndez: A low-cost digital frequency testing approach for mixed-signal devices using SigmaDelta modulation. Microelectronics Journal 36(12): 1080-1090 (2005)

Rabeb Kheriji, V. Danelon, Jean-Louis Carbonéro, Salvador Mir: Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach. DATE 2005: 170-171

Achraf Dhayni, Salvador Mir, Libor Rufer, Ahcène Bounceur: On-chip Pseudorandom Testing for Linear and Nonlinear MEMS. VLSI-SoC 2005: 245-266

Luís Rolíndez, Salvador Mir, Guillaume Prenat, Ahcène Bounceur: A 0.18 µm CMOS Implementation of On-chip Analogue Test Signal Generation from Digital Test Patterns. DATE 2004: 706-707

Salvador Mir, Benoît Charlot, Libor Rufer, Bernard Courtois: On-chip testing of embedded silicon transducers. SoCC 2004: 13-18

Salvador Mir, Libor Rufer, Bernard Courtois: On-chip testing of embedded transducers. VLSI Design 2004: 463-

C. Roman, Salvador Mir, Benoît Charlot: Building an analogue fault simulation tool and its application to MEMS. Microelectronics Journal 34(10): 897-906 (2003)

Salvador Mir, Luís Rolíndez, Christian Domigues, Libor Rufer: An implementation of memory-based on-chip analogue test signal generation. ASP-DAC 2003: 663-668

Mohammad A. Naal, Emmanuel Simeu, Salvador Mir: On-Line Testable Decimation Filter Design for AMS Systems. IOLTS 2003: 83-88

Salvador Mir, H. Bederr, R. D. (Shawn) Blanton, Hans G. Kerkhoff, H. J. Klim: SoCs with MEMS? Can We Include MEMS in the SoCs Design and Test Flow? VTS 2002: 449-450

Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois: Generation of Electrically Induced Stimuli for MEMS Self-Test. J. Electronic Testing 17(6): 459-470 (2001)

Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois: Electrically Induced Stimuli For MEMS Self-Test. VTS 2001: 210-217

Salvador Mir, Benoît Charlot, Bernard Courtois: Extending Fault-Based Testing to Microelectromechanical Systems. J. Electronic Testing 16(3): 279-288 (2000)

Marcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois: Design of self-checking fully differential circuits and boards. IEEE Trans. VLSI Syst. 8(2): 113-128 (2000)

Salvador Mir, Benoît Charlot, Gabriela Nicolescu, Philippe Coste, Fabien Parrain, Nacer-Eddine Zergainoh, Bernard Courtois, Ahmed Amine Jerraya, Márta Rencz: Towards design and validation of mixed-technology SOCs. ACM Great Lakes Symposium on VLSI 2000: 29-33

Salvador Mir, Benoît Charlot: On the Integration of Design and Test for Chips Embedding MEMS. IEEE Design & Test of Computers 16(4): 28-38 (1999)

Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois: Fault modeling of suspended thermal MEMS. ITC 1999: 319-328

Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: Design and Test of MEMs. VLSI Design 1999: 270-

Salvador Mir, Adoración Rueda, Diego Vázquez, José Luis Huertas: Switch-Level Fault Coverage Analysis for Switched-Capacitor Systems. DATE 1998: 810-814

A. Castillejo, D. Veychard, Salvador Mir, Jean-Michel Karam, Bernard Courtois: Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems. ITC 1998: 541-550

Salvador Mir, Adoración Rueda, Thomas Olbrich, Eduardo J. Peralías, José Luis Huertas: SWITTEST: Automatic Switch-Level Fault Simulation and Test Evaluation of Switched-Capacitor Systems. DAC 1997: 281-286

Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. J. Electronic Testing 9(1-2): 43-57 (1996)

Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Unified built-in self-test for fully differential analog circuits. J. Electronic Testing 9(1-2): 135-151 (1996)

Marcelo Lubaszewski, Salvador Mir, Leandro Pulz: ABILBO: Analog BuILt-in Block Observer. ICCAD 1996: 600-603

Vladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Analog checkers with absolute and relative tolerances. IEEE Trans. on CAD of Integrated Circuits and Systems 14(5): 607-612 (1995)

Salvador Mir, Nick Filer: Re-engineering hardware specifications by exploiting design semantics. EURO-DAC 1994: 336-341

Salvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois: Built-in self-test and fault diagnosis of fully differential analogue circuits. ICCAD 1994: 486-490