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 | 2005 | |
|---|---|---|
| j3 |      | J. M. Decams, H. Guillon, C. Jiménez, M. Audier, J. P. Sénateur, C. Dubourdieu, O. Cadix, B. J. O'Sullivan, M. Modreanu, P. K. Hurley: Electrical characterization of HfO2 films obtained by UV assisted injection MOCVD. Microelectronics Reliability 45(5-6): 929-932 (2005) |
| j2 | | Q. Fang, I. Liaw, M. Modreanu, P. K. Hurley, I. W. Boyd: Post deposition UV-induced O2 annealing of HfO2 thin films. Microelectronics Reliability 45(5-6): 957-960 (2005) |
| j1 | | E. Halova, S. Alexandrova, A. Szekeres, M. Modreanu: LPCVD-silicon oxynitride films: interface properties. Microelectronics Reliability 45(5-6): 982-985 (2005) |
| 1 | S. Alexandrova | |
| 2 | M. Audier | |
| 3 | I. W. Boyd | |
| 4 | O. Cadix | |
| 5 | J. M. Decams | |
| 6 | C. Dubourdieu | |
| 7 | Q. Fang | |
| 8 | H. Guillon | |
| 9 | E. Halova | |
| 10 | P. K. Hurley | |
| 11 | C. Jiménez | |
| 12 | I. Liaw | |
| 13 | B. J. O'Sullivan | |
| 14 | A. Szekeres | |
| 15 | J. P. Sénateur |
Colors in the list of coauthors
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