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 | 2009 | |
|---|---|---|
| j2 |      | Michele Piazza, Christian Dua, Mourad Oualli, Erwan Morvan, Dominique Carisetti, Frédéric Wyczisk: Degradation of TiAlNiAu as ohmic contact metal for GaN HEMTs. Microelectronics Reliability 49(9-11): 1222-1225 (2009) |
| 2005 | ||
| j1 | | A. Sozza, Christian Dua, Erwan Morvan, B. Grimber, S. L. Delage: A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications. Microelectronics Reliability 45(9-11): 1617-1621 (2005) |
| 1 | Dominique Carisetti | |
| 2 | S. L. Delage | |
| 3 | Christian Dua | |
| 4 | B. Grimber | |
| 5 | Mourad Oualli | |
| 6 | Michele Piazza | |
| 7 | A. Sozza | |
| 8 | Frédéric Wyczisk |
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