Franco Motika

G. Salem, D. W. Wittig, Thomas G. Foote, Bryan J. Robbins, C. Hirko, Donato O. Forlenza, Franco Motika, J. A. Kyle, Mary P. Kusko, Orazio P. Forlenza, R. J. Frishmuth, Rona Yaari, S. Michnowski, U. Baur: Structural and functional test of IBM System z10 chips. IBM Journal of Research and Development 53(1): 5 (2009)

Peilin Song, Franco Motika, Daniel R. Knebel, Richard F. Rizzolo, Mary P. Kusko: S/390 G5 CMOS microprocessor diagnostics. IBM Journal of Research and Development 43(5): 899-914 (1999)

Peilin Song, Franco Motika, Daniel R. Knebel, Rick Rizzolo, Mary P. Kusko, Julie Lee, Moyra K. McManus: Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor. ITC 1999: 1073-1082

Phil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato O. Forlenza, Ray Kurtulik, Wendy Chong: Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. ITC 1999: 1152-1161

Daniel R. Knebel, Pia Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika: Diagnosis and characterization of timing-related defects by time-dependent light emission. ITC 1998: 733-739

Phil Nigh, Donato O. Forlenza, Franco Motika: Application and Analysis of IDDQ Diagnostic Software. ITC 1997: 319-327

Franco Motika, John A. Waicukauski, Edward B. Eichelberger, Eric Lindbloom: An LSSD Pseudo Random Pattern Test System. ITC 1983: 283-288