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 | 2005 | |
|---|---|---|
| j6 |      | Cezary Sydlo, Jochen Sigmund, Bastian Mottet, Hans L. Hartnagel: Reliability investigations on LTG-GaAs photomixers for THz generation based on optical heterodyning. Microelectronics Reliability 45(9-11): 1600-1604 (2005) |
| 2004 | ||
| j5 | | Stephan Biber, Oleg Cojocari, Günther Rehm, Bastian Mottet, Manuel Rodríguez-Gironés, Lorenz-Peter Schmidt, Hans L. Hartnagel: A novel system for systematic microwave noise and DC characterization of terahertz Schottky diodes. IEEE T. Instrumentation and Measurement 53(2): 581-587 (2004) |
| 2003 | ||
| j4 | | Cezary Sydlo, K. Mutamba, L. Divac Krnic, Bastian Mottet, Hans L. Hartnagel: Reliability studies on integrated GaAs power-sensor structures using pulsed electrical stress. Microelectronics Reliability 43(9-11): 1929-1933 (2003) |
| 2002 | ||
| j3 | | Cezary Sydlo, M. Saglam, Bastian Mottet, Manuel Rodríguez-Gironés, Hans L. Hartnagel: Reliability investigations on HBV using pulsed electrical stress. Microelectronics Reliability 42(9-11): 1563-1568 (2002) |
| j2 | | V. Ichizli, Manuel Rodríguez-Gironés, L. Marchand, C. Garden, Oleg Cojocari, Bastian Mottet, Hans L. Hartnagel: Process Control and Failure Analysis Implementation for THz Schottky-based components. Microelectronics Reliability 42(9-11): 1593-1596 (2002) |
| 2001 | ||
| j1 |  | Cezary Sydlo, Bastian Mottet, Husin Ganis, Hans L. Hartnagel, Viktor Krozer, S. L. Delage, Simone Cassette, Eric Chartier, D. Floriot, Steven Bland: Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT. Microelectronics Reliability 41(9-10): 1567-1571 (2001) |
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