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 | 2012 | |
|---|---|---|
| j15 |      | Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer: EDT Bandwidth Management in SoC Designs. IEEE Trans. on CAD of Integrated Circuits and Systems 31(12): 1894-1907 (2012) |
| c26 | | Jakub Janicki, Jerzy Tyszer, Grzegorz Mrugalski, Janusz Rajski: Bandwidth-aware test compression logic for SoC designs. European Test Symposium 2012: 1-6 |
| c25 | | Jedrzej Solecki, Jerzy Tyszer, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski: Low power programmable PRPG with enhanced fault coverage gradient. ITC 2012: 1-9 |
| c24 | | Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Benoit Nadeau-Dostie: Test generator with preselected toggling for low power built-in self-test. VTS 2012: 1-6 |
| 2011 | ||
| j14 | | Nilanjan Mukherjee, Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer: Ring Generator: An Ultimate Linear Feedback Shift Register. IEEE Computer 44(6): 64-71 (2011) |
| j13 | | Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer: Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs. J. Electronic Testing 27(5): 599-609 (2011) |
| j12 | | Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, P. Szczerbicki, Jerzy Tyszer: Deterministic Clustering of Incompatible Test Cubes for Higher Power-Aware EDT Compression. IEEE Trans. on CAD of Integrated Circuits and Systems 30(8): 1225-1238 (2011) |
| c23 | | Michal Filipek, Yoshiaki Fukui, Hiroyuki Iwata, Grzegorz Mrugalski, Janusz Rajski, Masahiro Takakura, Jerzy Tyszer: Low Power Decompressor and PRPG with Constant Value Broadcast. Asian Test Symposium 2011: 84-89 |
| c22 | | Grzegorz Mrugalski, Artur Pogiel, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Pawel Urbanek: Fault Diagnosis in Memory BIST Environment with Non-march Tests. Asian Test Symposium 2011: 419-424 |
| c21 | | Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer: Diagnosis of Failing Scan Cells through Orthogonal Response Compaction. European Test Symposium 2011: 1-6 |
| c20 | | Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer: Reduced ATE Interface for High Test Data Compression. European Test Symposium 2011: 99-104 |
| c19 | | Jakub Janicki, Jerzy Tyszer, Avijit Dutta, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski: EDT channel bandwidth management in SoC designs with pattern-independent test access mechanism. ITC 2011: 1-9 |
| 2010 | ||
| j11 | | Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer: On Compaction Utilizing Inter and Intra-Correlation of Unknown States. IEEE Trans. on CAD of Integrated Circuits and Systems 29(1): 117-126 (2010) |
| c18 | | Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer: Diagnosis of failing scan cells through orthogonal response compaction. European Test Symposium 2010: 221-226 |
| c17 | | Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jakub Janicki, Jerzy Tyszer: Dynamic channel allocation for higher EDT compression in SoC designs. ITC 2010: 265-274 |
| c16 | | Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, P. Szczerbicki, Jerzy Tyszer: Low power compression of incompatible test cubes. ITC 2010: 704-713 |
| 2009 | ||
| j10 | | Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: Low-Power Scan Operation in Test Compression Environment. IEEE Trans. on CAD of Integrated Circuits and Systems 28(11): 1742-1755 (2009) |
| c15 | | Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer: Compression based on deterministic vector clustering of incompatible test cubes. ITC 2009: 1-10 |
| c14 | | Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer: Highly X-Tolerant Selective Compaction of Test Responses. VTS 2009: 245-250 |
| 2008 | ||
| j9 | | Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee, Mark Kassab: X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector. IEEE Trans. on CAD of Integrated Circuits and Systems 27(1): 147-159 (2008) |
| j8 | | Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: Low-Power Test Data Application in EDT Environment Through Decompressor Freeze. IEEE Trans. on CAD of Integrated Circuits and Systems 27(7): 1278-1290 (2008) |
| c13 | | Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: Low Power Scan Shift and Capture in the EDT Environment. ITC 2008: 1-10 |
| 2007 | ||
| j7 | | Jerzy Tyszer, Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee, Mark Kassab, Wu-Tung Cheng, Manish Sharma, Liyang Lai: X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis. IEEE Design & Test of Computers 24(5): 476-485 (2007) |
| j6 | | Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, Jerzy Tyszer: Isolation of Failing Scan Cells through Convolutional Test Response Compaction. J. Electronic Testing 23(1): 35-45 (2007) |
| j5 | | Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer: Fault Diagnosis With Convolutional Compactors. IEEE Trans. on CAD of Integrated Circuits and Systems 26(8): 1478-1494 (2007) |
| c12 | | Grzegorz Mrugalski, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer: New Test Data Decompressor for Low Power Applications. DAC 2007: 539-544 |
| c11 | | Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: Low Power Embedded Deterministic Test. VTS 2007: 75-83 |
| 2006 | ||
| j4 | | Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer: High Performance Dense Ring Generators. IEEE Trans. Computers 55(1): 83-87 (2006) |
| c10 | | Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: Test response compactor with programmable selector. DAC 2006: 1089-1094 |
| c9 | | Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee, Mark Kassab: X-Press Compactor for 1000x Reduction of Test Data. ITC 2006: 1-10 |
| 2005 | ||
| c8 | | Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer: Diagnosis with convolutional compactors in presence of unknown states. ITC 2005: 10 |
| 2004 | ||
| j3 | | Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: Ring generators - new devices for embedded test applications. IEEE Trans. on CAD of Integrated Circuits and Systems 23(9): 1306-1320 (2004) |
| c7 | | Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski: Fault Diagnosis in Designs with Convolutional Compactors. ITC 2004: 498-507 |
| c6 | | Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer: Planar High Performance Ring Generators. VTS 2004: 193-198 |
| 2003 | ||
| j2 | | Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski: 2D Test Sequence Generators. IEEE Design & Test of Computers 20(1): 51-59 (2003) |
| c5 | | Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: High Speed Ring Generators and Compactors of Test Data. VTS 2003: 57-62 |
| 2002 | ||
| c4 | | Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian: Embedded Deterministic Test for Low-Cost Manufacturing Test. ITC 2002: 301-310 |
| 2000 | ||
| j1 | | Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: Cellular automata-based test pattern generators with phase shifters. IEEE Trans. on CAD of Integrated Circuits and Systems 19(8): 878-893 (2000) |
| c3 | | Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski: Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators. VTS 2000: 377-388 |
| 1999 | ||
| c2 | | Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski: Synthesis of pattern generators based on cellular automata with phase shifters. ITC 1999: 368-377 |
| c1 | | Janusz Rajski, Grzegorz Mrugalski, Jerzy Tyszer: Comparative Study of CA-based PRPGs and LFSRs with Phase Shifters. VTS 1999: 236-245 |
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