A. Muehlhoff

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	2002
j2		A. Muehlhoff: Inversion of degradation direction of n-channel MOS-FETs in off-state operation. Microelectronics Reliability 42(9-11): 1453-1456 (2002)
	2001
j1		A. Muehlhoff: An Extrapolation Model for Lifetime Prediction for Off-State - Degradation of MOS-FETs. Microelectronics Reliability 41(9-10): 1289-1293 (2001)

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