Giovanna Mura
List of publications from the DBLP Bibliography Server - FAQ
- CSB - MetaPress - Google - Bing - Yahoo
 | 2012 | |
|---|---|---|
| j15 |      | Matteo Meneghini, Matteo Dal Lago, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni: Chip and package-related degradation of high power white LEDs. Microelectronics Reliability 52(5): 804-812 (2012) |
| j14 | | Jia Lu, BoCheng Cao, WenShe Wu, YuFeng Dai, ChuangJun Huang, G. Mura: MIM capacitor-related early-stage field failures. Microelectronics Reliability 52(9-10): 2073-2076 (2012) |
| j13 | | Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni: Phosphors for LED-based light sources: Thermal properties and reliability issues. Microelectronics Reliability 52(9-10): 2164-2167 (2012) |
| 2011 | ||
| j12 | | Massimo Vanzi, G. Mura, G. Martines: DC parameters for laser diodes from experimental curves. Microelectronics Reliability 51(9-11): 1752-1756 (2011) |
| 2010 | ||
| j11 | | G. Mura, Massimo Vanzi: The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis. Microelectronics Reliability 50(4): 471-478 (2010) |
| 2009 | ||
| j10 | | G. Mura, Massimo Vanzi: Lot reliability issues in commercial off the shelf (COTS) microelectronic devices. Microelectronics Reliability 49(9-11): 1196-1199 (2009) |
| 2008 | ||
| j9 | | G. Mura, G. Cassanelli, Fausto Fantini, Massimo Vanzi: Sulfur-contamination of high power white LED. Microelectronics Reliability 48(8-9): 1208-1211 (2008) |
| 2007 | ||
| j8 | | Matteo Meneghini, L. Trevisanello, C. Sanna, G. Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni: High temperature electro-optical degradation of InGaN/GaN HBLEDs. Microelectronics Reliability 47(9-11): 1625-1629 (2007) |
| 2006 | ||
| j7 | | G. Cassanelli, G. Mura, Fausto Fantini, Massimo Vanzi, B. Plano: Failure Analysis-assisted FMEA. Microelectronics Reliability 46(9-11): 1795-1799 (2006) |
| 2005 | ||
| j6 | | G. Cassanelli, G. Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini: Reliability predictions in electronic industrial applications. Microelectronics Reliability 45(9-11): 1321-1326 (2005) |
| 2003 | ||
| j5 | | Gaudenzio Meneghesso, S. Levada, Enrico Zanoni, G. Scamarcio, G. Mura, Simona Podda, Massimo Vanzi, S. Du, I. Eliashevich: Reliability of visible GaN LEDs in plastic package. Microelectronics Reliability 43(9-11): 1737-1742 (2003) |
| j4 | | G. Mura, Massimo Vanzi, Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner: On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. Microelectronics Reliability 43(9-11): 1771-1776 (2003) |
| 2002 | ||
| j3 | | Gaudenzio Meneghesso, A. Cocco, G. Mura, Simona Podda, Massimo Vanzi: Backside Failure Analysis of GaAs ICs after ESD tests. Microelectronics Reliability 42(9-11): 1293-1298 (2002) |
| j2 | | L. Sponton, L. Cerati, G. Croce, G. Mura, Simona Podda, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni: ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology. Microelectronics Reliability 42(9-11): 1303-1306 (2002) |
| j1 | | M. Giglio, G. Martines, G. Mura, Simona Podda, Massimo Vanzi: An automated lifetest equipment for optical emitters. Microelectronics Reliability 42(9-11): 1311-1315 (2002) |
Colors in the list of coauthors
Last update Sun May 19 11:48:23 2013 CET by the DBLP Team —
Data released under the ODC-BY 1.0 license — See also our legal information page