Fidel Muradali

Fidel Muradali: Business constraints drive test decisions. ITC 2005: 1

Carol Stolicny, Mustapha Slamani, Fidel Muradali, Geir Eide, Mike Li: ITC 2003 panels: Part 2. IEEE Design & Test of Computers 21(3): 175-176, 261-262 (2004)

Robert C. Aitken, Fidel Muradali: From Working Design Flow to Working Chips: Dependencies and Impacts of Methodology Decisions. DATE 2004: 2

Fidel Muradali: Future ATE: Perspectives & Requirements. ITC 2003: 1297

Fidel Muradali: Diagnosis in Modern Design - Just the Tip of the Iceberg. ITC 2003: 1302

Fidel Muradali: The Impact of Outsourcing on Test. ITC 2002: 1216

Adam Osseiran, William De Wilkins, Barry Baril, Sassan Tabatabaei, Fidel Muradali, Ken Posse, Lee Song: Analog and Mixed Signal BIST: Too Much, Too Little, Too Late? VTS 2002: 175-176

Fidel Muradali, Mike Ricchetti, Bart Vermeulen, Bulent I. Dervisoglu, Bob Gottlieb, Bernd Koenemann, C. J. Clark: Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer? VTS 2002: 445-446

Chintan Patel, Fidel Muradali, James F. Plusquellic: Power supply transient signal integration circuit. ITC 2001: 704-712

Fidel Muradali, André Ivanov: Do I Need this Tool for My Chips to Work? VTS 2000: 471-472

Amy Germida, Zheng Yan, James F. Plusquellic, Fidel Muradali: Defect detection using power supply transient signal analysis. ITC 1999: 67-76

Robert C. Aitken, Fidel Muradali: Trends in SLI design and their effect on test. ITC 1999: 628-637

Fidel Muradali, Janusz Rajski: A self-driven test structure for pseudorandom testing of non-scan sequential circuits. VTS 1996: 17-25

Fidel Muradali, Takao Nishida, Tsuguo Shimizu: A structure and technique for pseudorandom-based testing of sequential circuits. J. Electronic Testing 6(1): 107-115 (1995)

Fidel Muradali, Vinod K. Agarwal, Benoit Nadeau-Dostie: A new procedure for weighted random built-in self-test. ITC 1990: 660-669