David Nairn

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	2013
j1		Haitham Eissa, Rami Fathy Salem, Ahmed Arafa, Sherif Hany, Abdelrahman ElMously, Mohamed Dessouky, David Nairn, Mohab H. Anis: Parametric DFM Solution for Analog Circuits: Electrical-Driven Hotspot Detection, Analysis, and Correction Flow. IEEE Trans. VLSI Syst. 21(5): 807-820 (2013)
	2012
c4		Jaspal Singh Shah, David Nairn, Manoj Sachdev: A soft error robust 32kb SRAM macro featuring access transistor-less 8T cell in 65-nm. VLSI-SoC 2012: 275-278
	2011
c3		David Li, Pierce Chuang, David Nairn, Manoj Sachdev: Design and analysis of metastable-hardened flip-flops in sub-threshold region. ISLPED 2011: 157-162
c2		David Li, David Rennie, Pierce Chuang, David Nairn, Manoj Sachdev: Design and analysis of metastable-hardened and soft-error tolerant high-performance, low-power flip-flops. ISQED 2011: 583-590
c1		Rami F. Salem, Ahmed Arafa, Sherif Hany, Abdelrahman ElMously, Haitham Eissa, Mohamed Dessouky, David Nairn, Mohab H. Anis: A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow. SoCC 2011: 231-236

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