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 | 2003 | |
|---|---|---|
| j2 |      | Masashi Hayashi, Shinji Nakano, Tetsuaki Wada: Dependence of copper interconnect electromigration phenomenon on barrier metal materials. Microelectronics Reliability 43(9-11): 1545-1550 (2003) |
| 1983 | ||
| j1 | | Eihachiro Nakamae, Hideo Yamashita, Nobuyuki Kawano, Shinji Nakano: Color computer graphics in magnetic field analysis by means of the finite element method. Computers & Graphics 7(3-4): 295-306 (1983) |
| 1 | Masashi Hayashi | |
| 2 | Nobuyuki Kawano | |
| 3 | Eihachiro Nakamae | |
| 4 | Tetsuaki Wada | |
| 5 | Hideo Yamashita |
Colors in the list of coauthors
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