| 2011 | ||
|---|---|---|
| j1 | Y. Ye, F. Liu, M. Chen, S. Nassif, Y. Cao: Statistical Modeling and Simulation of Threshold Variation Under Random Dopant Fluctuations and Line-Edge Roughness. IEEE Trans. VLSI Syst. 19(6): 987-996 (2011) | |
| 1 | Y. Cao | |
| 2 | M. Chen | |
| 3 | F. Liu | |
| 4 | Y. Ye |
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