Michael Nicolaidis

Said Hamdioui, Michael Nicolaidis, Dimitris Gizopoulos, Arnaud Grasset, Groeseneken Guido, Philippe Bonnot: Reliability challenges of real-time systems in forthcoming technology nodes. DATE 2013: 129-134

Vladimir Pasca, Lorena Anghel, Michael Nicolaidis, Mounir Benabdenbi: CSL: Configurable Fault Tolerant Serial Links for Inter-die Communication in 3D Systems. J. Electronic Testing 28(1): 137-150 (2012)

Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh, Yervant Zorian, Tanay Karnik, Keith A. Bowman, James Tschanz, Shih-Lien Lu, Carlos Tokunaga, Arijit Raychowdhury, Muhammad M. Khellah, Jaydeep Kulkarni, Vivek De, Dimiter Avresky: Design for test and reliability in ultimate CMOS. DATE 2012: 677-682

Michael Nicolaidis, Vladimir Pasca, Lorena Anghel: Through-silicon-via built-in self-repair for aggressive 3D integration. IOLTS 2012: 91-96

Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Dan Alexandrescu, Enrico Costenaro: RIIF - Reliability information interchange format. IOLTS 2012: 103-108

Panagiota Papavramidou, Michael Nicolaidis: Test algorithms for ECC-based memory repair in nanotechnologies. VTS 2012: 228-233

Fabien Chaix, Dimiter Avresky, Nacer-Eddine Zergainoh, Michael Nicolaidis: A fault-tolerant deadlock-free adaptive routing for on chip interconnects. DATE 2011: 909-912

Michael Nicolaidis, Thierry Bonnoit, Nacer-Eddine Zergainoh: Eliminating speed penalty in ECC protected memories. DATE 2011: 1614-1619

Dan Alexandrescu, Enrico Costenaro, Michael Nicolaidis: A Practical Approach to Single Event Transients Analysis for Highly Complex Designs. DFT 2011: 155-163

Hai Yu, Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh: Efficient Fault Detection Architecture Design of Latch-Based Low Power DSP/MCU Processor. European Test Symposium 2011: 93-98

Michael Nicolaidis, Vladimir Pasca, Lorena Anghel: I-BIRAS: Interconnect Built-In Self-Repair and Adaptive Serialization in 3D Integrated Systems. European Test Symposium 2011: 208

Thierry Bonnoit, Michael Nicolaidis, Nacer-Eddine Zergainoh: Towards a tool for implementing delay-free ECC in embedded memories. ICCD 2011: 441-442

Fabien Chaix, Gilles Bizot, Michael Nicolaidis, Nacer-Eddine Zergainoh: Variability-aware task mapping strategies for many-cores processor chips. IOLTS 2011: 55-60

Aymen Fradi, Michael Nicolaidis, Lorena Anghel: Memory BIST with address programmability. IOLTS 2011: 79-85

Gilles Bizot, Dimiter Avresky, Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis: Self-Recovering Parallel Applications in Multi-core Systems. NCA 2011: 51-58

Jean Arlat, Cristian Constantinescu, Ravishankar K. Iyer, Johan Karlsson, Michael Nicolaidis: Fourth workshop on dependable and secure nanocomputing. DSN 2010: 619-620

Michael Nicolaidis, Vladimir Pasca, Lorena Anghel: Interconnect Built-In Self-Repair and Adaptive-Serialization (I-BIRAS) for 3D integrated systems. IOLTS 2010: 218

Fabien Chaix, Dimiter Avresky, Nacer-Eddine Zergainoh, Michael Nicolaidis: Fault-Tolerant Deadlock-Free Adaptive Routing for Any Set of Link and Node Failures in Multi-cores Systems. NCA 2010: 52-59

Jean Arlat, Cristian Constantinescu, Ravishankar K. Iyer, Johan Karlsson, Michael Nicolaidis: Third workshop on dependable and secure nanocomputing. DSN 2009: 596-597

Eleftherios Kolonis, Michael Nicolaidis, Dimitris Gizopoulos, Mihalis Psarakis, Jacques Henri Collet, Piotr Zajac: Enhanced self-configurability and yield in multicore grids. IOLTS 2009: 75-80

Gilles Bizot, Nacer-Eddine Zergainoh, Michael Nicolaidis: Variability and reliability-aware application tasks scheduling and power control (Voltage and Frequency Scaling) in the future nanoscale multiprocessors system on chip. IOLTS 2009: 155

Hai Yu, Michael Nicolaidis, Lorena Anghel: An effective approach to detect logic soft errors in digital circuits based on GRAAL. ISQED 2009: 236-240

Eleftherios Kolonis, Michael Nicolaidis: Towards a holistic CAD platform for nanotechnologies. Microelectronics Journal 39(8): 1032-1040 (2008)

Jean Arlat, Cristian Constantinescu, Ravishankar K. Iyer, Michael Nicolaidis: Second workshop on dependable and secure nanocomputing. DSN 2008: 546-547

Michael Nicolaidis: Special Session 2: Benchmarking and Standardization in Software-Based SER Characterization: Towards an IEEE Task Force? IOLTS 2008: 105-106

Michael Nicolaidis, Renaud Perez, Dan Alexandrescu: Low-Cost Highly-Robust Hardened Cells Using Blocking Feedback Transistors. VTS 2008: 371-376

Jean Arlat, Ravishankar K. Iyer, Michael Nicolaidis: Workshop on Dependable and Secure Nanocomputing. DSN 2007: 809-810

Michael Nicolaidis: GRAAL: A Fault-Tolerant Architecture for Enabling Nanometric Technologies. IOLTS 2007: 255

Michael Nicolaidis: GRAAL: a new fault tolerant design paradigm for mitigating the flaws of deep nanometric technologies. ITC 2007: 1-10

Lorena Anghel, Michael Nicolaidis: Defects Tolerant Logic Gates for Unreliable Future Nanotechnologies. IWANN 2007: 422-429

Slimane Boutobza, Michael Nicolaidis, Kheiredine M. Lamara, Andrea Costa: A Transparent based Programmable Memory BIST. European Test Symposium 2006: 89-96

Lorena Anghel, Michael Nicolaidis, Nadine Buard: From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately? IOLTS 2006: 85

Michael Nicolaidis: A Low-Cost Single-Event Latchup Mitigation Sscheme. IOLTS 2006: 111-118

Michael Nicolaidis: Session Abstract. VTS 2006: 286-287

Michael Nicolaidis, Lorena Anghel, Nadir Achouri: Memory Defect Tolerance Architectures for Nanotechnologies. J. Electronic Testing 21(4): 445-455 (2005)

Balkaran S. Gill, Michael Nicolaidis, Francis G. Wolff, Christos A. Papachristou, Steven L. Garverick: An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories. DATE 2005: 592-597

Lorena Anghel, Michael Nicolaidis: Simulation and Mitigation of Single Event Effects. IOLTS 2005: 81

Michael Nicolaidis: Design for Mitigation of Single Event Effects. IOLTS 2005: 95-96

Balkaran S. Gill, Michael Nicolaidis, Christos A. Papachristou: Radiation Induced Single-Word Multiple-Bit Upsets Correction in SRAM. IOLTS 2005: 266-271

Slimane Boutobza, Michael Nicolaidis, Kheiredine M. Lamara, Andrea Costa: Programmable memory BIST. ITC 2005: 10

Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis: Simulating Single Event Transients in VDSM ICs for Ground Level Radiation. J. Electronic Testing 20(4): 413-421 (2004)

Lorena Anghel, Nadir Achouri, Michael Nicolaidis: Evaluation of Memory Built-in Self Repair Techniques for High Defect Density Technologie. PRDC 2004: 315-320

Michael Nicolaidis, Nadir Achouri, Lorena Anghel: A Diversified Memory Built-In Self-Repair Approach for Nanotechnologies. VTS 2004: 313-318

Michael Nicolaidis: Carry checking/parity prediction adders and ALUs. IEEE Trans. VLSI Syst. 11(1): 121-128 (2003)

Michael Nicolaidis, Nadir Achouri, Slimane Boutobza: Optimal Reconfiguration Functions for Column or Data-bit Built-In Self-Repair. DATE 2003: 10590-10595

Michael Nicolaidis, Nadir Achouri, Lorena Anghel: A Memory Built-In Self-Repair for High Defect Densities Based on Error Polarities. DFT 2003: 459-466

Michael Nicolaidis, Nadir Achouri, Slimane Boutobza: Dynamic Data-bit Memory Built-In Self- Repair. ICCAD 2003: 588-594

Michael Nicolaidis, Nadir Achouri, Lorena Anghel: Memory Built-In Self-Repair for Nanotechnologies. IOLTS 2003: 94-

Michael Nicolaidis: Reliability Threats in VDSM - Shortcomings in Conventional Test and Fault-Tolerance Alternatives. ITC 2003: 1282

Eric Dupont, Michael Nicolaidis, Peter Rohr: Embedded Robustness IPs for Transient-Error-Free ICs. IEEE Design & Test of Computers 19(3): 56-70 (2002)

Dimitris Nikolos, John P. Hayes, Michael Nicolaidis, Cecilia Metra: Guest Editorial. J. Electronic Testing 18(3): 259-260 (2002)

Michael Nicolaidis: IP for Embedded Robustness. DATE 2002: 240-241

Eric Dupont, Michael Nicolaidis, Peter Rohr: Embedded Robustness Ips. DATE 2002: 244-245

Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis: New Methods for Evaluating the Impact of Single Event Transients in VDSM ICs. DFT 2002: 99-107

Eric Dupont, Michael Nicolaidis: Robustness IPs for Reliability and Security of SoCs. ITC 2002: 357-364

Michael Nicolaidis: Soft Error Protection for Embedded Memories. MTDT 2002

Eleftherios Kolonis, Michael Nicolaidis: Fail-Safe Synchronization Circuit for Duplicated Systems. DFT 2001: 412-417

Jim Chung, N. Derhacobian, Jean Gasiot, Michael Nicolaidis, David Towne, Raoul Velazco: Soft Errors and Tolerance for Soft Errors. VTS 2001: 279-280

Yervant Zorian, Michael Nicolaidis, Peter Muhmenthaler, David Y. Lepejian, Chris W. H. Strolenberg, Kees Veelenturf: Tutorial Statement. DATE 2000: 66

Lorena Anghel, Michael Nicolaidis: Cost Reduction and Evaluation of a Temporary Faults Detecting Technique. DATE 2000: 591-598

Michael Nicolaidis, N. Zaidan, Th. Calin, D. Bied-Charreton: ISIS: A Fail-Safe Interface Realized in Smart Power Technology. IOLTW 2000: 191-

Lorena Anghel, Michael Nicolaidis, Issam Alzaher-Noufal: Self-Checking Circuits versus Realistic Faults in Very Deep Submicron. VTS 2000: 55-66

Michael Nicolaidis, Ricardo de Oliveira Duarte: Fault-Secure Parity Prediction Booth Multipliers. IEEE Design & Test of Computers 16(3): 90-101 (1999)

Michael Nicolaidis, Rob Roy: Guest Editorial. J. Electronic Testing 15(1-2): 9 (1999)

Issam Alzaher-Noufal, Michael Nicolaidis: A CAD Framework for Generating Self-Checking 1 Multipliers Based on Residue Codes. DATE 1999: 122-

Michael Nicolaidis, Yervant Zorian: Scaling Deeper to Submicron: On-Line Testing to the Rescue. DATE 1999: 432-

Iyad Rayane, Jaime Velasco-Medina, Michael Nicolaidis: A One-Bit-Signature BIST for Embedded Operational Amplifiers in Mixed-Signal Circuits Based on the Slew-Rate Detection. DATE 1999: 792-

Haridimos T. Vergos, Dimitris Nikolos, Y. Tsiatouhas, Th. Haniotakis, Michael Nicolaidis: On Path Delay Fault Testing of Multiplexer - Based Shifters. Great Lakes Symposium on VLSI 1999: 20-23

Jaime Velasco-Medina, Iyad Rayane, Michael Nicolaidis: On-Line BIST for Testing Analog Circuits. ICCD 1999: 330-

Fabien Clermidy, Thierry Collette, Michael Nicolaidis: A New Placement Algorithm Dedicated to Parallel Computers: Bases and Application. PRDC 1999: 242-

Michael Nicolaidis: Time Redundancy Based Soft-Error Tolerance to Rescue Nanometer Technologies. VTS 1999: 86-94

Th. Calin, Lorena Anghel, Michael Nicolaidis: Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS. VTS 1999: 135-142

Iyad Rayane, Jaime Velasco-Medina, Michael Nicolaidis: A Digital BIST for Operational Amplifiers Embedded in Mixed-Signal Circuits. VTS 1999: 304-310

Ramesh Karri, Michael Nicolaidis: Guest Editors' Introduction: Online VLSI Testing. IEEE Design & Test of Computers 15(4): 12-16 (1998)

Michael Nicolaidis, Yervant Zorian: On-Line Testing for VLSI - A Compendium of Approaches. J. Electronic Testing 12(1-2): 7-20 (1998)

Ricardo de Oliveira Duarte, Michael Nicolaidis, Hakim Bederr, Yervant Zorian: Efficient Totally Self-Checking Shifter Design. J. Electronic Testing 12(1-2): 29-39 (1998)

Michael Nicolaidis: On-line testing for VLSI: state of the art and trends. Integration 26(1-2): 197-209 (1998)

Michael Nicolaidis: Fail-Safe Interfaces for VLSI: Theoretical Foundations and Implementation. IEEE Trans. Computers 47(1): 62-77 (1998)

Jaime Velasco-Medina, Marcelo Lubaszewski, Michael Nicolaidis: An Approach to the On-Line Testing of Operational Amplifiers. Asian Test Symposium 1998: 290-295

Michael Nicolaidis, Ricardo de Oliveira Duarte: Design of Fault-Secure Parity-Prediction Booth Multipliers. DATE 1998: 7-14

Jaime Velasco-Medina, Th. Calin, Michael Nicolaidis: Fault Detection for Linear Analog Circuits Using Current Injection. DATE 1998: 987-988

Jaime Velasco-Medina, Michael Nicolaidis: Current-based testing for analog and mixed-signal circuits. ICCD 1998: 576-581

Michael Nicolaidis: Scaling Deeper to Submicron: On-Line Testing to the Rescue. ITC 1998: 1139

Michael Nicolaidis: Design for soft-error robustness to rescue deep submicron scaling. ITC 1998: 1140

Michael Nicolaidis, Ricardo de Oliveira Duarte, Salvador Manich, Joan Figueras: Fault-Secure Parity Prediction Arithmetic Operators. IEEE Design & Test of Computers 14(2): 60-71 (1997)

Ricardo de Oliveira Duarte, Michael Nicolaidis, Hakim Bederr, Yervant Zorian: Fault-secure shifter design: results and implementations. ED&TC 1997: 335-341

Michael Nicolaidis: On-Line Testing for VLSI. ITC 1997: 1042

Michael Nicolaidis: Theory of Transparent BIST for RAMs. IEEE Trans. Computers 45(10): 1141-1156 (1996)

Michael Nicolaidis, Rubin A. Parekhji, M. Boudjit: E-Groups: A New Technique for Fast Backward Propagation in System Level Test Generation. Asian Test Symposium 1996: 34-41

Salvador Manich, Michael Nicolaidis, Joan Figueras: Enhancing realistic fault secureness in parity prediction array arithmetic operators by I/sub DDQ/ monitoring. VTS 1996: 124-129

R. L. Campbell, P. Kuekes, David Y. Lepejian, W. Maly, Michael Nicolaidis, Alex Orailoglu: Can Defect-Tolerant Chips Better Meet the Quality Challenge? VTS 1996: 362-363

Michael Nicolaidis: Efficient UBIST implementation for microprocessor sequencing parts. J. Electronic Testing 6(3): 295-312 (1995)

Jien-Chung Lo, James C. Daly, Michael Nicolaidis: A strongly code disjoint built-in current sensor for strongly fault-secure static CMOS realizations. IEEE Trans. on CAD of Integrated Circuits and Systems 14(11): 1402-1407 (1995)

Michael Nicolaidis, Vladimir Castro Alves, Hakim Bederr: Testing complex couplings in multiport memories. IEEE Trans. VLSI Syst. 3(1): 59-71 (1995)

Hakim Bederr, Michael Nicolaidis, Alain Guyot: Analytic approach for error masking elimination in on-line multipliers. IEEE Symposium on Computer Arithmetic 1995: 30-37

O. Kebichi, Michael Nicolaidis, Vyacheslav N. Yarmolik: Exact Aliasing Computation for RAM BIST. ITC 1995: 13-22

Th. Calin, F. L. Vargas, Michael Nicolaidis: Upset-Tolerant CMOS SRAM Using Current Monitoring: Prototype and Test Experiments. ITC 1995: 45-53

Fabian Vargas, Michael Nicolaidis, Yervant Zorian: An Approach for Designing Total-Dose Tolerant MCMs Based on Current Monitoring. ITC 1995: 345-354

B. Hamdi, Hakim Bederr, Michael Nicolaidis: A tool for automatic generation of self-checking data paths. VTS 1995: 460-466

Michael Nicolaidis, O. Kebichi, Vladimir Castro Alves: Trade-offs in scan path and BIST implementations for RAMs. J. Electronic Testing 5(2-3): 273-283 (1994)

O. Kebichi, Vyacheslav N. Yarmolik, Michael Nicolaidis: Zero aliasing ROM BIST. J. Electronic Testing 5(4): 377-388 (1994)

Michael Nicolaidis: Fault secure property versus strongly code disjoint checkers. IEEE Trans. on CAD of Integrated Circuits and Systems 13(5): 651-658 (1994)

Michael Nicolaidis, Hakim Bederr: Efficient Implementations of Self-Checking Multiply and Divide Arrays. EDAC-ETC-EUROASIC 1994: 574-579

Ricardo de Oliveira Duarte, Michael Nicolaidis: A Test Methodology Applied to Cellular Logic Programmable Gate Arrays. FPL 1994: 11-22

F. L. Vargas, Michael Nicolaidis: SEU-Tolerant SRAM Design Based on Current Monitoring. FTCS 1994: 106-115

Vyacheslav N. Yarmolik, Michael Nicolaidis, O. Kebichi: Aliasing-free Signature Analysis for RAM BIST. ITC 1994: 368-377

Michael Nicolaidis: Efficient UBIST for RAMs. VTS 1994: 158-166

Hakim Bederr, Michael Nicolaidis, Alain Guyot: Design for testability of on-line multipliers. VTS 1994: 408-414

Michael Nicolaidis: Efficient Implementations of Self-Checking Adders and ALUs. FTCS 1993: 586-595

F. L. Vargas, Michael Nicolaidis, Bernard Courtois: Quiescent Current Monitoring to Improve the Reliability of Electronic Systems in Space Radiation Environments. ICCD 1993: 596-600

Jien-Chung Lo, Suchai Thanawastien, T. R. N. Rao, Michael Nicolaidis: An SFS Berger check prediction ALU and its application to self-checking processor designs. IEEE Trans. on CAD of Integrated Circuits and Systems 11(4): 525-540 (1992)

Jien-Chung Lo, James C. Daly, Michael Nicolaidis: Design of Static CMOS Self-Checking Circuits using Built-In Current Sensing. FTCS 1992: 104-111

O. Kebichi, Michael Nicolaidis: A Tool for Automatic Generation of BISTed and Transparent BISTed Rams. ICCD 1992: 570-575

Michael Nicolaidis: Transparent BIST for RAMs. ITC 1992: 598-607

Michael Nicolaidis: Shorts in self-checking circuits. J. Electronic Testing 1(4): 257-273 (1991)

Vladimir Castro Alves, Michael Nicolaidis, P. Lestrat, Bernard Courtois: Built-In Self-Test for Multi-Port RAMs. ICCAD 1991: 248-251

Michael Nicolaidis, M. Boudjit: New Implementations, Tools, and Experiments for Decreasing Self-Checking PLAs Area Overhead. ICCD 1991: 275-281

Michael Nicolaidis: Efficient UBIST implementation for microprocessor sequencing parts. ITC 1990: 316-326

Michael Nicolaidis: Self-exercising checkers for unified built-in self-test (UBIST). IEEE Trans. on CAD of Integrated Circuits and Systems 8(3): 203-218 (1989)

Michael Nicolaidis, S. Noraz, Bernard Courtois: A generalized theory of fail-safe systems. FTCS 1989: 398-406

Michael Nicolaidis, Bernard Courtois: Strongly Code Disjoint Checkers. IEEE Trans. Computers 37(6): 751-756 (1988)

Michael Nicolaidis: A unified built-in-test scheme: UBIST. FTCS 1988: 157-163