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 | 2002 | |
|---|---|---|
| c2 |      | Shigeki Tomishima, Hiroaki Tanizaki, Mitsutaka Niiro, Masanao Maruta, Hideto Hidaka, T. Tada, Kenji Gamo: A Variable Drivability (VD) Output Buffer for the System In a Package (SIP) and High Frequency Wafer Test. ITC 2002: 170-177 |
| 2000 | ||
| c1 | | Tomoya Kawagoe, Jun Ohtani, Mitsutaka Niiro, Tukasa Ooishi, Mitsuhiro Hamada, Hideto Hidaka: A built-in self-repair analyzer (CRESTA) for embedded DRAMs. ITC 2000: 567-574 |
| 1 | Kenji Gamo | |
| 2 | Mitsuhiro Hamada | |
| 3 | Hideto Hidaka | |
| 4 | Tomoya Kawagoe | |
| 5 | Masanao Maruta | |
| 6 | Jun Ohtani | |
| 7 | Tukasa Ooishi | |
| 8 | T. Tada | |
| 9 | Hiroaki Tanizaki | |
| 10 | Shigeki Tomishima |
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