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 | 2012 | |
|---|---|---|
| c4 |      | Anthony S. Oates: Reliability challenges for the continued scaling of IC technologies. CICC 2012: 1-4 |
| 2011 | ||
| c3 | | Jason T. Ryan, Lan Wei, Jason P. Campbell, Ricki G. Southwick, Kin P. Cheung, Anthony S. Oates, H.-S. Philip Wong, John Suehle: Circuit-aware device reliability criteria methodology. ESSCIRC 2011: 255-258 |
| 2009 | ||
| c2 | | Balaji Vaidyanathan, Anthony S. Oates, Yuan Xie: Intrinsic NBTI-variability aware statistical pipeline performance assessment and tuning. ICCAD 2009: 164-171 |
| c1 | | Balaji Vaidyanathan, Anthony S. Oates, Yuan Xie, Yu Wang: NBTI-aware statistical circuit delay assessment. ISQED 2009: 13-18 |
| 1 | Jason P. Campbell | |
| 2 | Kin P. Cheung | |
| 3 | Jason T. Ryan | |
| 4 | Ricki G. Southwick | |
| 5 | John Suehle | |
| 6 | Balaji Vaidyanathan | |
| 7 | Yu Wang 0002 | |
| 8 | Lan Wei | |
| 9 | H.-S. Philip Wong | |
| 10 | Yuan Xie |
Colors in the list of coauthors
Last update Mon May 20 20:30:08 2013 CET by the DBLP Team —
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