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Kazuhiko Okada
2000 – 2009
- 2006
[j1]Takashi Ohzone, Kazuhiko Okada, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata: A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET. IEICE Transactions 89-C(9): 1351-1357 (2006)
1980 – 1989
- 1986
[c1]Masato Suyama, Kazuhiko Okada, Seiichi Nakajima: Impact of ISDN on Networks Configuration. ICC 1986: 397-401
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last updated on 2012-12-02 20:33 CET by the dblp team



