Stig Oresjo

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	1997
c4		Stig Oresjo: Unpowered Opens Test with X-Ray Laminography. ITC 1997: 276
	1996
c3		Stig Oresjo: Unpowered Opens Test with X-Ray Laminography. ITC 1996: 929
	1993
c2		Kenneth P. Parker, John E. McDermid, Stig Oresjo: Structure and Metrology for an Analog Testability Bus. ITC 1993: 309-322
	1991
j1		Kenneth P. Parker, Stig Oresjo: A language for describing boundary scan devices. J. Electronic Testing 2(1): 43-75 (1991)
	1990
c1		Kenneth P. Parker, Stig Oresjo: A language for describing boundary-scan devices. ITC 1990: 222-234

Coauthor Index

1	John E. McDermid	[c2]
2	Kenneth P. Parker	[c2] [j1] [c1]

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