Nobuaki Otsuka

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	2010
j1		Kenichi Agawa, Shin-ichiro Ishizuka, Hideaki Majima, Hiroyuki Kobayashi, Masayuki Koizumi, Takeshi Nagano, Makoto Arai, Yutaka Shimizu, Asuka Maki, Go Urakawa, Tadashi Terada, Nobuyuki Itoh, Mototsugu Hamada, Fumie Fujii, Tadamasa Kato, Sadayuki Yoshitomi, Nobuaki Otsuka: A 0.13 µm CMOS Bluetooth EDR Transceiver with High Sensitivity over Wide Temperature Range and Immunity to Process Variation. IEICE Transactions 93-C(6): 803-811 (2010)
	2008
c2		Akira Katayama, Tomoaki Yabe, Osamu Hirabayashi, Yasuhisa Takeyama, Keiichi Kushida, Takahiko Sasaki, Nobuaki Otsuka: Direct Cell-Stability Test Techniques for an SRAM Macro with Asymmetric Cell-Bias-Voltage Modulation. ITC 2008: 1-7
	2002
c1		Osamu Hirabayashi, Azuma Suzuki, Tomoaki Yabe, Atsushi Kawasumi, Yasuhisa Takeyama, Keiichi Kushida, A. Tohata, Nobuaki Otsuka: DFT Techniques for Wafer-Level At-Speed Testing of High-Speed SRAMs. ITC 2002: 164-169

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