Frédéric Overney

Frédéric Overney, Alain Rüfenacht, J. Braun, Blaise Jeanneret, P. S. Wright: Characterization of Metrological Grade Analog-to-Digital Converters Using a Programmable Josephson Voltage Standard. IEEE T. Instrumentation and Measurement 60(7): 2172-2177 (2011)

Alain Rüfenacht, Frédéric Overney, Alessandro Mortara, Blaise Jeanneret: Thermal-Transfer Standard Validation of the Josephson-Voltage-Standard-Locked Sine-Wave Synthesizer. IEEE T. Instrumentation and Measurement 60(7): 2372-2377 (2011)

Frédéric Overney, Blaise Jeanneret: RLC Bridge Based on an Automated Synchronous Sampling System. IEEE T. Instrumentation and Measurement 60(7): 2393-2398 (2011)

Blaise Jeanneret, Frédéric Overney, Alain Rüfenacht, Jaani Nissilä: Strong Attenuation of the Transients' Effect in Square Waves Synthesized With a Programmable Josephson Voltage Standard. IEEE T. Instrumentation and Measurement 59(7): 1894-1899 (2010)

Blaise Jeanneret, Frédéric Overney, Luca Callegaro, Alessandro Mortara, Alain Rüfenacht: Josephson-Voltage-Standard-Locked Sine Wave Synthesizer: Margin Evaluation and Stability. IEEE T. Instrumentation and Measurement 58(4): 791-796 (2009)

Blaise Jeanneret, Frédéric Overney: Phenomenological Model for Frequency-Related Dissipation in the Quantized Hall Resistance. IEEE T. Instrumentation and Measurement 56(2): 431-434 (2007)

Jürgen Schurr, Barry M. Wood, Frédéric Overney: Linear frequency dependence in AC resistance measurement. IEEE T. Instrumentation and Measurement 54(2): 512-515 (2005)

Frédéric Overney, Blaise Jeanneret, Barry M. Wood, Jürgen Schurr: Influence of the dissipation in AC measurements of the quantized Hall resistance. IEEE T. Instrumentation and Measurement 54(2): 658-661 (2005)

Christian Hof, Blaise Jeanneret, Ali L. Eichenberger, Frédéric Overney, Mark W. Keller, M. J. Dalberth: Manipulating single electrons with a seven-junction pump. IEEE T. Instrumentation and Measurement 54(2): 670-672 (2005)

Jürgen Melcher, Jürgen Schurr, Klaus Pierz, Jonathan M. Williams, Stephen P. Giblin, F. Cabiati, Luca Callegaro, Giancarlo Marullo-Reedtz, Cristina Cassiago, Beat Jeckelmann, Blaise Jeanneret, Frédéric Overney, Jaroslav Bohacek, J. Riha, O. Power, J. Murray, Mario Nunes, M. Lobo, I. Godinho: The European ACQHE project: modular system for the calibration of capacitance standards based on the quantum Hall effect. IEEE T. Instrumentation and Measurement 52(2): 563-568 (2003)

Frédéric Overney, Blaise Jeanneret, Beat Jeckelmann: Effects of metallic gates on AC measurements of the quantum Hall resistance. IEEE T. Instrumentation and Measurement 52(2): 574-578 (2003)

Helko E. van den Brom, Oswin Kerkhof, Sergey V. Lotkhov, Sergey. A. Bogoslovsky, Gerd-Dietmar Willenberg, Hansjörg Scherer, Alexander B. Zorin, S. Pedersen, C. Kristoffersson, A. Aassime, Per Delsing, Marian A. Taslakov, Z. Ivanov, Håkan Nilsson, Stephen P. Giblin, Peter Kleinschmidt, Christian Hof, Ali L. Eichenberger, Frédéric Overney, Blaise Jeanneret, Gérard Genevès, Nicolas Feltin, Laurent Devoille, Frederic Gay, François P. M. Piquemal: Counting electrons one by one-overview of a joint European research project. IEEE T. Instrumentation and Measurement 52(2): 584-589 (2003)

Christian Hof, Blaise Jeanneret, Ali L. Eichenberger, Frédéric Overney, Sergey V. Lotkhov: First steps toward a quantum capacitance standard at METAS. IEEE T. Instrumentation and Measurement 52(2): 604-607 (2003)

Beat Jeckelmann, Alain Rüfenacht, Blaise Jeanneret, Frédéric Overney, Klaus Pierz, Aurel von Campenhausen, Günter Hein: Optimization of QHE-devices for metrological applications. IEEE T. Instrumentation and Measurement 50(2): 218-222 (2001)