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K. Ozaki
1990 – 1999
- 1997
[c3]K. Ozaki, H. Sekiguchi, S. Wakana, Y. Goto, Y. Umehara, J. Matsumoto: Novel Optical Probing System for Quarter-micron VLSI Circuits. Asian Test Symposium 1997: 208-213- 1996
[c2]K. Ozaki, H. Sekiguchi, S. Wakana, Y. Goto, Y. Umehara, J. Matsumoto: Novel Optical Probing System with Submicron Spatial Resolution for Internal Diagnosis of VLSI Circuits. ITC 1996: 269-275- 1994
[j1]Y. Miyazaki, M. Terakado, K. Ozaki, H. Nozaki: Robust regression for developing software estimation models. Journal of Systems and Software 27(1): 3-16 (1994)
1980 – 1989
- 1984
[c1]Y. Goto, K. Ozaki, T. Ishizuka, A. Ito, Y. Furukawa, T. Inagaki: Electron Beam Prober for LSI Testing with 100ps Time Resolution. ITC 1984: 543-549
Coauthor Index
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last updated on 2012-12-02 20:59 CET by the dblp team



