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Sule Ozev
2010 – today
- 2013
[j24]Ender Yilmaz, Sule Ozev, Kenneth M. Butler: Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring. IEEE Trans. VLSI Syst. 21(6): 1116-1128 (2013)- [c66]Chandra K. H. Suresh, Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu: Adaptive reduction of the frequency search space for multi-vdd digital circuits. DATE 2013: 292-295
- [c65]Ender Yilmaz, Geoff Shofner, LeRoy Winemberg, Sule Ozev: Fault analysis and simulation of large scale industrial mixed-signal circuits. DATE 2013: 565-570
- [c64]Lingfei Deng, Vinay Kundur, Naveen Sai Jangala Naga, Muhlis Kenan Ozel, Ender Yilmaz, Sule Ozev, Bertan Bakkaloglu, Sayfe Kiaei, Divya Pratab, Tehmoor Dar: Electrical calibration of spring-mass MEMS capacitive accelerometers. DATE 2013: 571-574
- 2012
- [j23]Afsaneh Nassery, Osman Emir Erol, Sule Ozev, Marian Verhelst: Test Signal Development and Analysis for OFDM Systems RF Front-End Parameter Extraction. IEEE Trans. on CAD of Integrated Circuits and Systems 31(6): 958-967 (2012)
- [j22]Ender Yilmaz, Sule Ozev: Test Application for Analog/RF Circuits With Low Computational Burden. IEEE Trans. on CAD of Integrated Circuits and Systems 31(6): 968-979 (2012)
- [c63]Afsaneh Nassery, Sule Ozev: An analytical technique for characterization of transceiver IQ imbalances in the loop-back mode. DATE 2012: 1084-1089
- [c62]Chandra K. H. Suresh, Ozgur Sinanoglu, Sule Ozev: Adaptive testing of chips with varying distributions of unknown response bits. European Test Symposium 2012: 1-6
- [c61]Ender Yilmaz, Sule Ozev: Adaptive multi-site testing for analog/mixed-signal circuits incorporating neighborhood information. European Test Symposium 2012: 1-6
- [c60]Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu, Peter Maxwell: Adaptive testing: Conquering process variations. European Test Symposium 2012: 1-6
- [c59]Afsaneh Nassery, Srinath Byregowda, Sule Ozev, Marian Verhelst, Mustapha Slamani: Built-in-Self Test of transmitter I/Q mismatch using self-mixing envelope detector. VTS 2012: 56-61
- 2011
- [j21]Gurusubrahmaniyan Subrahmaniyan Radhakrishnan, Sule Ozev: Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response Evaluation. J. Electronic Testing 27(4): 465-476 (2011)
- [j20]Erdem Serkan Erdogan, Sule Ozev: A Multi-Site Test Solution for Quadrature Modulation RF Transceivers. IEEE Trans. on CAD of Integrated Circuits and Systems 30(9): 1421-1425 (2011)
- [c58]Afsaneh Nassery, Sule Ozev, Marian Verhelst, Mustapha Slamani: Extraction of EVM from Transmitter System Parameters. European Test Symposium 2011: 75-80
- [c57]Ender Yilmaz, Sule Ozev: Fast and Accurate DPPM Computation Using Model Based Filtering. European Test Symposium 2011: 165-170
- [c56]Ramachandran Venkatasubramanian, Doohwang Chang, Sule Ozev: Analysis and Mitigation of Electromigration in RF Circuits: An LNA Case Study. European Test Symposium 2011: 215
- [c55]Ender Yilmaz, Sule Ozev, Kenneth M. Butler: Adaptive multidimensional outlier analysis for analog and mixed signal circuits. ITC 2011: 1-8
- [c54]Ender Yilmaz, Anne Meixner, Sule Ozev: An industrial case study of analog fault modeling. VTS 2011: 178-183
- 2010
- [j19]Erdem Serkan Erdogan, Sule Ozev: Detailed Characterization of Transceiver Parameters Through Loop-Back-Based BiST. IEEE Trans. VLSI Syst. 18(6): 901-911 (2010)
- [j18]Erkan Acar, Sule Ozev: Low Cost MIMO Testing for RF Integrated Circuits. IEEE Trans. VLSI Syst. 18(9): 1348-1356 (2010)
- [c53]Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev: Defect filter for alternate RF test. European Test Symposium 2010: 265-270
- [c52]Ender Yilmaz, Sule Ozev, Kenneth M. Butler: Adaptive test flow for mixed-signal/RF circuits using learned information from device under test. ITC 2010: 674-683
2000 – 2009
- 2009
- [j17]Erkan Acar, Sule Ozev: Low-Cost Characterization and Calibration of RF Integrated Circuits through I - Q Data Analysis. IEEE Trans. on CAD of Integrated Circuits and Systems 28(7): 993-1005 (2009)
- [j16]Sudarshan Bahukudumbi, Sule Ozev, Krishnendu Chakrabarty, Vikram Iyengar: Wafer-Level Defect Screening for "Big-D/Small-A" Mixed-Signal SoCs. IEEE Trans. VLSI Syst. 17(4): 587-592 (2009)
- [c51]
- [c50]Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev: Defect Filter for Alternate RF Test. European Test Symposium 2009: 101-106
- [c49]Ender Yilmaz, Sule Ozev: Defect-based test optimization for analog/RF circuits for near-zero DPPM applications. ICCD 2009: 313-318
- [c48]Ender Yilmaz, Afsaneh Nassery, Sule Ozev, Erkan Acar: Built-in EVM measurement for OFDM transceivers using all-digital DFT. ITC 2009: 1-10
- [c47]Erdem Serkan Erdogan, Sule Ozev: A Packet Based 2x-Site Test Solution for GSM Transceivers with Limited Tester Resources. VTS 2009: 303-308
- 2008
- [j15]Erkan Acar, Sule Ozev: Defect-Oriented Testing of RF Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 27(5): 920-931 (2008)
- [j14]Fang Liu, Sule Ozev, Plamen K. Nikolov: Parametric variability analysis for multistage analog circuits using analytical sensitivity modeling. ACM Trans. Design Autom. Electr. Syst. 13(2) (2008)
- [c46]Bogdan F. Romanescu, Michael E. Bauer, Sule Ozev, Daniel J. Sorin: Reducing the impact of intra-core process variability with criticality-based resource allocation and prefetching. Conf. Computing Frontiers 2008: 129-138
- [c45]Ender Yilmaz, Sule Ozev: Dynamic test scheduling for analog circuits for improved test quality. ICCD 2008: 227-233
- [c44]Erdem Serkan Erdogan, Sule Ozev, Philippe Cauvet: Diagnosis of assembly failures for System-in-Package RF tuners. ISCAS 2008: 2286-2289
- [c43]Erkan Acar, Sule Ozev, Ganesh Srinivasan, Friedrich Taenzler: Optimized EVM Testing for IEEE 802.11a/n RF ICs. ITC 2008: 1-10
- [c42]Erdem Serkan Erdogan, Sule Ozev: Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers. VTS 2008: 209-214
- 2007
- [j13]Bogdan F. Romanescu, Michael E. Bauer, Sule Ozev, Daniel J. Sorin: VariaSim: simulating circuits and systems in the presence of process variability. SIGARCH Computer Architecture News 35(5): 45-48 (2007)
- [j12]Fred A. Bower, Daniel J. Sorin, Sule Ozev: Online diagnosis of hard faults in microprocessors. TACO 4(2) (2007)
- [j11]Fang Liu, Sule Ozev: Statistical Test Development for Analog Circuits Under High Process Variations. IEEE Trans. on CAD of Integrated Circuits and Systems 26(8): 1465-1477 (2007)
- [j10]Erkan Acar, Sule Ozev: Go/No-Go Testing of VCO Modulation RF Transceivers Through the Delayed-RF Setup. IEEE Trans. VLSI Syst. 15(1): 37-47 (2007)
- [c41]Bogdan F. Romanescu, Michael E. Bauer, Daniel J. Sorin, Sule Ozev: Reducing the Impact of Process Variability with Prefetching and Criticality-Based Resource Allocation. PACT 2007: 424
- [c40]Sudarshan Bahukudumbi, Sule Ozev, Krishnendu Chakrabarty, Vikram Iyengar: AWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for "Big-D/Small-A" Mixed-Signal SoCs. ASP-DAC 2007: 823-828
- [c39]Erdem Serkan Erdogan, Sule Ozev: An ADC-BiST scheme using sequential code analysis. DATE 2007: 713-718
- [c38]Mahmut Yilmaz, Albert Meixner, Sule Ozev, Daniel J. Sorin: Lazy Error Detection for Microprocessor Functional Units. DFT 2007: 361-369
- [c37]Sule Ozev, Daniel J. Sorin, Mahmut Yilmaz: Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor. ICCD 2007: 317-324
- [c36]Erkan Acar, Sule Ozev: Digital calibration of RF transceivers for I-Q imbalances and nonlinearity. ICCD 2007: 512-517
- [c35]Erkan Acar, Sule Ozev: Low cost characterization of RF transceivers through IQ data analysis. ITC 2007: 1-10
- [c34]Fang Liu, Erkan Acar, Sule Ozev: Test yield estimation for analog/RF circuits over multiple correlated measurements. ITC 2007: 1-10
- [c33]
- [c32]Erkan Acar, Sule Ozev, Kevin B. Redmond: A Low-Cost RF MIMO Test Method Using a Single Measurement Set-up. VTS 2007: 3-8
- [i2]Anuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chakrabarty: Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores. CoRR abs/0710.4686 (2007)
- [i1]Jonathan R. Carter, Sule Ozev, Daniel J. Sorin: Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown. CoRR abs/0710.4715 (2007)
- 2006
- [j9]Fei Su, Sule Ozev, Krishnendu Chakrabarty: Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems. J. Electronic Testing 22(2): 199-210 (2006)
- [j8]Fang Liu, Sule Ozev, Martin A. Brooke: Identifying the Source of BW Failures in High-Frequency Linear Analog Circuits Based on S-Parameter Measurements. IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2594-2605 (2006)
- [j7]Fei Su, Sule Ozev, Krishnendu Chakrabarty: Concurrent testing of digital microfluidics-based biochips. ACM Trans. Design Autom. Electr. Syst. 11(2): 442-464 (2006)
- [j6]Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty: Test infrastructure design for mixed-signal SOCs with wrapped analog cores. IEEE Trans. VLSI Syst. 14(3): 292-304 (2006)
- [c31]Erkan Acar, Sule Ozev, Kevin B. Redmond: Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers. ICCAD 2006: 210-216
- [c30]Erkan Acar, Sule Ozev: Efficient Testing of RF MIMO Transceivers Used in WLAN Applications. ICCD 2006
- [c29]Erdem Serkan Erdogan, Sule Ozev: A Robust, Self-Tuning CMOS Circuit for Built-in Go/No-Go Testing of Synthesizer Phase Noise. ITC 2006: 1-10
- [c28]Mahmut Yilmaz, Derek Hower, Sule Ozev, Daniel J. Sorin: Self-Checking and Self-Diagnosing 32-bit Microprocessor Multiplier. ITC 2006: 1-10
- [c27]Fred A. Bower, Derek Hower, Mahmut Yilmaz, Daniel J. Sorin, Sule Ozev: Applying architectural vulnerability Analysis to hard faults in the microprocessor. SIGMETRICS/Performance 2006: 375-376
- [c26]Fang Liu, Plamen K. Nikolov, Sule Ozev: Parametric Fault Diagnosis for Analog Circuits Using a Bayesian Framework. VTS 2006: 272-277
- 2005
- [j5]Fred A. Bower, Sule Ozev, Daniel J. Sorin: Autonomic Microprocessor Execution via Self-Repairing Arrays. IEEE Trans. Dependable Sec. Comput. 2(4): 297-310 (2005)
- [c25]Fang Liu, Sule Ozev: Hierarchical analysis of process variation for mixed-signal systems. ASP-DAC 2005: 465-470
- [c24]Anuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chakrabarty: Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores. DATE 2005: 50-55
- [c23]Fang Liu, Jacob J. Flomenberg, Devaka V. Yasaratne, Sule Ozev: Hierarchical Variance Analysis for Analog Circuits Based on Graph Modelling and Correlation Loop Tracing. DATE 2005: 126-131
- [c22]Jonathan R. Carter, Sule Ozev, Daniel J. Sorin: Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown. DATE 2005: 300-305
- [c21]Erkan Acar, Sule Ozev: Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions. ICCAD 2005: 73-79
- [c20]Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty: A Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs. ICCD 2005: 137-142
- [c19]
- [c18]
- [c17]Fred A. Bower, Daniel J. Sorin, Sule Ozev: A Mechanism for Online Diagnosis of Hard Faults in Microprocessors. MICRO 2005: 197-208
- [c16]Erkan Acar, Sule Ozev: Diagnosis of Failing Component in RF Receivers through Adaptive Full-Path Measurements. VTS 2005: 374-379
- 2004
- [j4]Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu: Seamless Test of Digital Components in Mixed-Signal Paths. IEEE Design & Test of Computers 21(1): 44-55 (2004)
- [j3]Sule Ozev, Alex Orailoglu: Design of concurrent test Hardware for Linear analog circuits with constrained hardware overhead. IEEE Trans. VLSI Syst. 12(7): 756-765 (2004)
- [c15]Fred A. Bower, Paul G. Shealy, Sule Ozev, Daniel J. Sorin: Tolerating Hard Faults in Microprocessor Array Structures. DSN 2004: 51-60
- [c14]Fang Liu, Sule Ozev, Martin A. Brooke: Diagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutionary search. ICCAD 2004: 641-647
- [c13]Sule Ozev, Alex Orailoglu: End-to-End Testability Analysis and DfT Insertion for Mixed-Signal Paths. ICCD 2004: 72-77
- [c12]Erkan Acar, Sule Ozev: Delayed-RF Based Test Development for FM Transceivers Using Signature Analysis. ITC 2004: 783-792
- [c11]Sule Ozev, Christian Olgaard: Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures. VTS 2004: 217-222
- 2003
- [j2]Sule Ozev, Alex Orailoglu: Statistical Tolerance Analysis for Assured Analog Test Coverage. J. Electronic Testing 19(2): 173-182 (2003)
- [c10]Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty: TAM Optimization for Mixed-Signal SOCs using Analog Test Wrappers. ICCAD 2003: 95-99
- [c9]Fei Su, Sule Ozev, Krishnendu Chakrabarty: Testing of Droplet-Based Microelectrofluidic Systems. ITC 2003: 1192-1200
- 2002
- [j1]Sule Ozev, Christian Olgaard, Alex Orailoglu: Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers. IEEE Design & Test of Computers 19(5): 82-91 (2002)
- [c8]Sule Ozev, Alex Orailoglu: Cost-Effective Concurrent Test Hardware Design for Linear Analog Circuits. ICCD 2002: 258-264
- [c7]Sule Ozev, Alex Orailoglu, Hosam Haggag: Automated test development and test time reduction for RF subsystems. ISCAS (1) 2002: 581-584
- [c6]Sule Ozev, Alex Orailoglu: An Integrated Tool for Analog Test Generation and Fault Simulation. ISQED 2002: 267-272
- [c5]Sule Ozev, Alex Orailoglu: Boosting the Accuracy of Analog Test Coverage Computation through Statistical Tolerance Analysis. VTS 2002: 213-222
- 2001
- [c4]Christian Olgaard, Sule Ozev, Alex Orailoglu: Testability implications in low-cost integrated radio transceivers: a Bluetooth case study. ITC 2001: 965-974
- 2000
- [c3]Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu: Test Synthesis for Mixed-Signal SOC Paths. DATE 2000: 128-133
- [c2]Sule Ozev, Alex Orailoglu: Test Selection Based on High Level Fault Simulation for Mixed-Signal Systems. VTS 2000: 149-156
1990 – 1999
- 1999
- [c1]
Coauthor Index
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last updated on 2013-05-28 21:38 CEST by the dblp team