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Nohpill Park
2010 – today
- 2012
[c44]Fabrizio Lombardi, Nohpill Park, Haider A. F. Almurib, T. Nandha Kumar: On the multiple fault detection of a nano crossbar. DFT 2012: 134-139- [i1]Mahesh Khadka, K. M. George, Nohpill Park: Performance Analysis of Hybrid Forecasting Model In Stock Market Forecasting. CoRR abs/1209.4608 (2012)
- 2011
- [c43]J. Seol, Noh-Jin Park, K. M. George, Nohpill Park: Modeling Yield of Self-Healing Carbon Nanotubes/Silicon-Nanowire FET-based Nanoarray. DFT 2011: 197-205
- 2010
- [j24]Tao Feng, Noh-Jin Park, Minsu Choi, Nohpill Park: Reliability Modeling and Analysis of Clockless Wave Pipeline Core for Embedded Combinational Logic Design. IEEE T. Instrumentation and Measurement 59(7): 1812-1824 (2010)
- [c42]Mahesh Khadka, Benjamin Popp, Kayikkalthop M. George, Nohpill Park: A New Approach for Time Series Forecasting based on Genetic Algorithm. CAINE 2010: 226-231
- [c41]Eung-Kyeu Kim, Soo-Jong Lee, Nohpill Park: An Extraction Method of Lip Movement Images from Successive Image Frames in the Speech Activity Extraction Process. ICEC 2010: 317-325
2000 – 2009
- 2009
- [j23]Sanghyun Ahn, Zachary D. Patitz, Noh-Jin Park, Hyoung Joong Kim, Nohpill Park: A Floorprint-Based Defect Tolerance for Nano-Scale Application-Specific IC. IEEE T. Instrumentation and Measurement 58(5): 1283-1290 (2009)
- [j22]Minsu Choi, Fabrizio Lombardi, Nohpill Park: Introduction to the Special Section on Nanocircuits and Systems. IEEE Trans. VLSI Syst. 17(4): 470-472 (2009)
- 2008
- [c40]Zachary D. Patitz, Nohpill Park: Modeling and Evaluation of Threshold Defect Tolerance. DFT 2008: 211-219
- [c39]Noh-Jin Park, K. M. George, Nohpill Park: A Probabilistic Risk Estimation with Multiple Regression Dependent Dummy Variable Method using Logit Transformation. MSV 2008: 165-169
- 2007
- [j21]Kyung Ki Kim, Yong-Bin Kim, Minsu Choi, Nohpill Park: Leakage Minimization Technique for Nanoscale CMOS VLSI. IEEE Design & Test of Computers 24(4): 322-330 (2007)
- [j20]Myungsu Choi, Zachary D. Patitz, Byoungjae Jin, Feng Tao, Nohpill Park, Minsu Choi: Designing layout-timing independent quantum-dot cellular automata (QCA) circuits by global asynchrony. Journal of Systems Architecture 53(9): 551-567 (2007)
- [j19]Shanrui Zhang, Minsu Choi, Nohpill Park, Fabrizio Lombardi: Cost-Driven Optimization of Coverage of Combined Built-In Self-Test/Automated Test Equipment Testing. IEEE T. Instrumentation and Measurement 56(3): 1094-1100 (2007)
- 2006
- [c38]Minsu Choi, Myungsu Choi, Zachary D. Patitz, Nohpill Park: Efficient and Robust Delay-Insensitive QCA (Quantum-Dot Cellular Automata) Design. DFT 2006: 80-88
- [c37]J. Y. Shin, Noh-Jin Park, Nohpill Park, K. M. George: Exploratory Data Analysis with Bivariate Dependence Functions. MSV 2006: 217-223
- 2005
- [j18]Noh-Jin Park, K. M. George, Nohpill Park, Minsu Choi, Yong-Bin Kim, Fabrizio Lombardi: Environmental-based characterization of SoC-based instrumentation systems for stratified testing. IEEE T. Instrumentation and Measurement 54(3): 1241-1248 (2005)
- [j17]Minsu Choi, Nohpill Park, Vincenzo Piuri, Fabrizio Lombardi: Reliability measurement of mass storage system for onboard instrumentation. IEEE T. Instrumentation and Measurement 54(6): 2297-2304 (2005)
- [c36]B. D. Gaston, K. M. George, Nohpill Park: An Approach to Protection Using a Non-Persistent Client-Side Page Proxy. Computers and Their Applications 2005: 226-231
- [c35]Zachary D. Patitz, Nohpill Park, Minsu Choi, Fred J. Meyer: QCA-Based Majority Gate Design under Radius of Effect-Induced Faults. DFT 2005: 217-228
- [c34]Minsu Choi, Nohpill Park: Teaching Nanotechnology by Introducing Crossbar-Based Architecture and Quantum-Dot Cellular Automata. MSE 2005: 29-30
- [c33]Srivastav Sethupathy, Nohpill Park, Marcin Paprzycki: Logic Restructuring for Delay Balancing in Wave-Pipelined Circuits: An Integer Programming Approach. SYNASC 2005: 182-188
- 2004
- [j16]Minsu Choi, Nohpill Park, Vincenzo Piuri, Yong-Bin Kim, Fabrizio Lombardi: Balanced dual-stage repair for dependable embedded memory cores. Journal of Systems Architecture 50(5): 281-285 (2004)
- [j15]Bin Liu, Fabrizio Lombardi, Nohpill Park, Minsu Choi: Testing Layered Interconnection Networks. IEEE Trans. Computers 53(6): 710-722 (2004)
- [j14]Minsu Choi, Nohpill Park, Vincenzo Piuri, Fabrizio Lombardi: Evaluating the repair of system-on-chip (SoC) using connectivity. IEEE T. Instrumentation and Measurement 53(6): 1464-1472 (2004)
- [j13]Jun Zhao, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi: Sequential diagnosis of processor array systems. IEEE Transactions on Reliability 53(4): 487-498 (2004)
- [c32]T. Feng, Byoungjae Jin, J. Wang, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi: Fault tolerant clockless wave pipeline design. Conf. Computing Frontiers 2004: 350-356
- [c31]Shanrui Zhang, Minsu Choi, Nohpill Park, Fabrizio Lombardi: Probabilistic Balancing of Fault Coverage and Test Cost in Combined Built-In Self-Test/Automated Test Equipment Testing Environment. DFT 2004: 48-56
- [c30]Shanrui Zhang, Minsu Choi, Nohpill Park: Modeling Yield of Carbon-Nanotube/Silicon-Nanowire FET-Based Nanoarray Architecture with h-hot Addressing Scheme. DFT 2004: 356-364
- [c29]T. Feng, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi, Fred J. Meyer: Reliability Modeling and Assurance of Clockless Wave Pipeline. DFT 2004: 442-450
- 2003
- [j12]Farzin Karimi, V. Swamy Irrinki, T. Crosby, Nohpill Park, Fabrizio Lombardi: Parallel testing of multi-port static random access memories. Microelectronics Journal 34(1): 3-21 (2003)
- [j11]Fred J. Meyer, Nohpill Park: Predicting Defect-Tolerant Yield in the Embedded Core Context. IEEE Trans. Computers 52(11): 1470-1479 (2003)
- [j10]Minsu Choi, Nohpill Park, Fabrizio Lombardi: Modeling and analysis of fault tolerant multistage interconnection networks. IEEE T. Instrumentation and Measurement 52(5): 1509-1519 (2003)
- [j9]Nohpill Park, Fabrizio Lombardi: Guest Editorial. IEEE T. Instrumentation and Measurement 52(6): 1694-1695 (2003)
- [j8]Byoungjae Jin, Nohpill Park, Kayikkalthop M. George, Minsu Choi, Mark B. Yeary: Modeling and analysis of soft-test/repair for CCD-based digital X-ray systems. IEEE T. Instrumentation and Measurement 52(6): 1713-1721 (2003)
- [j7]Jun Zhao, Fred J. Meyer, Fabrizio Lombardi, Nohpill Park: Maximal diagnosis of interconnects of random access memories. IEEE Transactions on Reliability 52(4): 423-434 (2003)
- [c28]Noh-Jin Park, Byoungjae Jin, K. M. George, Nohpill Park: Performance Modeling and Analysis of Distributed Web Server (DWS) System with Access Frequency Distribution (AFD). ISCA PDCS 2003: 224-229
- [c27]Wirachai Yanphanich, K. M. George, Nohpill Park: Multi-node Failure Detection and Recovery in a Pipeline Cluster. ISCA PDCS 2003: 244-249
- [c26]T. Feng, Nohpill Park, Yong-Bin Kim, Vincenzo Piuri: Yield Modeling and Analysis of a Clockless Asynchronous Wave Pipeline with Pulse Faults. DFT 2003: 34-
- [c25]Noh-Jin Park, Byoungjae Jin, K. M. George, Nohpill Park, Minsu Choi: Regressive Testing for System-on-Chip with Unknown-Good-Yield. DFT 2003: 393-400
- [c24]B. Jang, Nohpill Park, K. M. George, G. E. Hedrick: Modeling and Evaluation of the Interconnection-driven Repairability for Distributed Embedded Memory Cores on Chip. Modelling, Identification and Control 2003: 403-408
- [c23]Minsu Choi, Hardy J. Pottinger, Nohpill Park, Yong-Bin Kim: Need For Undergraduate And Graduate-Level Education In Testing Of Microelectronic Circuits And Systems. MSE 2003: 121-122
- [c22]Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-Bin Kim, Vincenzo Piuri: Optimal Spare Utilization in Repairable and Reliable Memory Cores. MTDT 2003: 64-71
- [c21]Minsu Choi, Noh-Jin Park, K. M. George, Byoungjae Jin, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi: Fault Tolerant Memory Design for HW/SW Co-Reliability in Massively Parallel Computing Systems. NCA 2003: 341-
- [c20]T. Feng, Nohpill Park, K. M. George: Hardware/Software Co-Reliability of Field Reconfigurable Multi-Processor-Memory Systems with Redundant Bus. PDPTA 2003: 1886-1890
- 2002
- [j6]Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Quality-effective repair of multichip module systems. Journal of Systems Architecture 47(10): 883-900 (2002)
- [j5]Minsu Choi, Nohpill Park, Fabrizio Lombardi, Vincenzo Piuri: Quality enhancement of reconfigurable multichip module systems by redundancy utilization. IEEE T. Instrumentation and Measurement 51(4): 740-749 (2002)
- [j4]Minsu Choi, Nohpill Park: Dynamic yield analysis and enhancement of FPGA reconfigurable memory systems. IEEE T. Instrumentation and Measurement 51(6): 1300-1311 (2002)
- [j3]Nohpill Park, Fabrizio Lombardi: Analysis of stratified testing for multichip module systems. IEEE Transactions on Reliability 51(1): 100-110 (2002)
- [c19]Hamidreza Hashempour, Yong-Bin Kim, Nohpill Park: A Test-Vector Generation Methodology for Crosstalk Noise Faults. DFT 2002: 40-50
- [c18]
- [c17]Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-Bin Kim, Vincenzo Piuri: Balanced Redundancy Utilization in Embedded Memory Cores for Dependable Systems. DFT 2002: 419-427
- [c16]Y. Chang, Minsu Choi, Nohpill Park, Fabrizio Lombardi: Repairability Evaluation of Embedded Multiple Region DRAMs. DFT 2002: 428-436
- [c15]Minsu Choi, Nohpill Park, Fabrizio Lombardi: Hardware-Software Co-Reliability in Field Reconfigurable Multi-Processor-Memory Systems. IPDPS 2002
- [c14]Wirachai Yanphanich, K. M. George, Nohpill Park: A Fault Tolerant Pipelined Cluster Model. IASTED PDCS 2002: 508-514
- [c13]
- [c12]Minsu Choi, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi: Hardware/Software Co-Reliability of Configurable Digital Systems. PRDC 2002: 67-74
- 2001
- [j2]Nohpill Park, Fabrizio Lombardi, Vincenzo Piuri: Testing and evaluating the quality-level of stratified multichip module instrumentation. IEEE T. Instrumentation and Measurement 50(6): 1615-1624 (2001)
- [c11]Xiao-Tao Chen, Wei-Kang Huang, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Novel Approaches for Fault Detection in Two-Dimensional Combinational Arrays. DFT 2001: 161-169
- [c10]Mohammad A. Al-Hashimi, Huay-min H. Pu, Nohpill Park, Fabrizio Lombardi: Dependability under Malicious Agreement in N-modular Redundancy-on-Demand Systems. NCA 2001: 80-93
- [c9]Minsu Choi, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Connectivity-Based Multichip Module Repair. PRDC 2001: 19-26
- [c8]Fabrizio Lombardi, Nohpill Park, Mohammad A. Al-Hashimi, Huay-min H. Pu: Modeling the Dependability of N-Modular Redundancy on Demand under Malicious Agreement. PRDC 2001: 68-75
- 2000
- [c7]Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Quality-Effective Repair of Multichip Module Systems. DFT 2000: 47-55
- [c6]Nohpill Park, S. J. Ruiwale, Fabrizio Lombardi: Testing the Configurability of Dynamic FPGAs. DFT 2000: 311-319
1990 – 1999
- 1999
- [j1]Xiao-Tao Chen, Wei-Kang Huang, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Design Verification of FPGA Implementations. IEEE Design & Test of Computers 16(2): 66-73 (1999)
- [c5]Nohpill Park, Fabrizio Lombardi: Stratified Testing of Multichip Module Systems under Uneven Known-Good-Yield. DFT 1999: 192-200
- 1997
- [c4]David Ashen, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi: Testing of programmable logic devices (PLD) with faulty resources. DFT 1997: 76-84
- [c3]X. Tan, J. Tong, P. Tan, Nohpill Park, Fabrizio Lombardi: An Efficient Multi-Way Algorithm for Balanced Partitioning of VLSI Circuits. ICCD 1997: 608-613
- 1996
- [c2]Yinan N. Shen, Nohpill Park, Fabrizio Lombardi: Space Cutting Approaches for Repairing Memories. ICCD 1996: 106-111
- [c1]José Salinas, Nohpill Park, U. Arunkumar, Fabrizio Lombardi: Conformance Testing of Time-Dependent Protocols. ICECCS 1996: 257-264
Coauthor Index
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last updated on 2013-01-31 19:41 CET by the dblp team