Kenneth P. Parker Coauthor index pubzone.org

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c30Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker: Capacitive sensing testability in complex memory devices. ITC 2012: 1-6
2011
c29Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker, Shuichi Kameyama, David Dubberke: Surviving state disruptions caused by test: A case study. ITC 2011: 1-8
2010
c28Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird: Principal Component Analysis-based compensation for measurement errors due to mechanical misalignments in PCB testing. ITC 2010: 467-476
c27Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
C. J. Clark, Dave Dubberke, Kenneth P. Parker, Bill Tuthill: Solutions for undetected shorts on IEEE 1149.1 self-monitoring pins. ITC 2010: 563-570
c26Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker: Surviving state disruptions caused by test: The "Lobotomy Problem". ITC 2010: 571-578
2009
c25Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird: An outlier detection based approach for PCB testing. ITC 2009: 1-10
c24Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker, Jeff Burgess: What is IEEE P1149.8.1 and why? ITC 2009: 1
c23Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Steve Sunter, Kenneth P. Parker: Testing bridges to nowhere - combining Boundary Scan and capacitive sensing. ITC 2009: 1-10
2008
c22Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Dayton Norrgard, Kenneth P. Parker: Augmenting Boundary-Scan Tests for Enhanced Defect Coverage. ITC 2008: 1-8
c21Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker, Neil G. Jacobson: Boundary-Scan Testing of Power/Ground Pins. ITC 2008: 1-8
2007
c20Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker, Don DeMille: A bead probe CAD strategy for in-circuit test. ITC 2007: 1-8
c19Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker, Stephen Hird: Finding power/ground defects on connectors - a new approach. ITC 2007: 1-7
2005
c18Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker: The effects of defects on high-speed boards. ITC 2005: 8
c17Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker: Bead probes in practice. ITC 2005: 9
c16Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker: A new probing technique for high-speed/high-density printed circuit boards. ITC 2005: 10
2004
c15Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker: A New Probing Technique for High-Speed/High-Density Printed Circuit Boards. ITC 2004: 365-374
c14Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker: Board Test Coverage Needs to be Standardized. ITC 2004: 1426
2003
j9no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker: Testing for what? IEEE Design & Test of Computers 20(2): 96- (2003)
j8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Bill Eklow, Carl Barnhart, Kenneth P. Parker: IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks. IEEE Design & Test of Computers 20(5): 76-83 (2003)
c13Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker: Defect Coverage of Boundary-Scan Tests: What does it mean when a Boundary-Scan test passes? ITC 2003: 1268-1276
2002
c12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Bill Eklow, Carl Barnhart, Kenneth P. Parker: IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks. ITC 2002: 1056-1065
c11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kathy Hird, Kenneth P. Parker, Bill Follis: Test Coverage: What Does It Mean When a Board Test Passes?. ITC 2002: 1066-1074
c10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker: Board Test Is NOT Mature. ITC 2002: 1238
2001
c9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Young Kim, Benny Lai, Kenneth P. Parker, Jeff Rearick: Frequency detection-based boundary-scan testing of AC coupled nets. ITC 2001: 46-53
2000
c8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker: System issues in boundary-scan board test. ITC 2000: 724-728
1997
c7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa: Design, Fabrications and Use of Mixed-Signal IC Testability Structures. ITC 1997: 489-498
1996
c6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Mick Tegethoff, Kenneth P. Parker, Ken Lee: Opens Board Test Coverage: When is 99% Really 40%? ITC 1996: 333-339
c5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker: Introduction ITC 1996 Lecture Series on Unpowered Opens Testing. ITC 1996: 924
1995
j7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Mick Tegethoff, Kenneth P. Parker: IEEE Std 1149.1: Where Are We? Where From Here? IEEE Design & Test of Computers 12(2): 53-59 (1995)
c4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker, David Greene: The ITC Lecture Series: An Experiment. ITC 1995: 925
1994
c3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker: Observations on the 1149.x Family of Standards. ITC 1994: 1023
1993
c2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker, John E. McDermid, Stig Oresjo: Structure and Metrology for an Analog Testability Bus. ITC 1993: 309-322
1991
j6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker, Stig Oresjo: A language for describing boundary scan devices. J. Electronic Testing 2(1): 43-75 (1991)
1990
c1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker, Stig Oresjo: A language for describing boundary-scan devices. ITC 1990: 222-234
1982
j5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Thomas W. Williams, Kenneth P. Parker: Design for Testability - A Survey. IEEE Trans. Computers 31(1): 2-15 (1982)
1978
j4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Edward J. McCluskey, Kenneth P. Parker, John J. Shedletsky: Boolean Network Probabilities and Network Design. IEEE Trans. Computers 27(2): 187-189 (1978)
j3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker, Edward J. McCluskey: Sequential Circuit Output Probabilities From Regular Expressions. IEEE Trans. Computers 27(3): 222-231 (1978)
1975
j2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker, Edward J. McCluskey: Analysis of Logic Circuits with Faults Using Input Signal Probabilities. IEEE Trans. Computers 24(5): 573-578 (1975)
j1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
Kenneth P. Parker, Edward J. McCluskey: Probabilistic Treatment of General Combinational Networks. IEEE Trans. Computers 24(6): 668-670 (1975)

Coauthor Index

1Carl Barnhart
[j8] [c12]
2Rodney A. Browen
[c7]
3Jeff Burgess
[c24]
4C. J. Clark
[c27]
5Don DeMille
[c20]
6Dave Dubberke
[c27]
7David Dubberke
[c29]
8Bill Eklow (William Eklow)
[j8] [c12]
9Bill Follis
[c11]
10David Greene
[c4]
11Xin He
[c28] [c25]
12Katsuhiro Hirayama
[c7]
13Kathy Hird
[c11]
14Stephen Hird
[c28] [c25] [c19]
15Neil G. Jacobson
[c21]
16Anura P. Jayasumana
[c28] [c25]
17Shuichi Kameyama
[c29]
18Young Kim
[c9]
19Benny Lai
[c9]
20Ken Lee
[c6]
21Yashwant K. Malaiya
[c28] [c25]
22Akira Matsuzawa
[c7]
23Edward J. McCluskey
[j4] [j3] [j2] [j1]
24John E. McDermid
[c7] [c2]
25Dayton Norrgard
[c22]
26Kozo Nuriya
[c7]
27Stig Oresjo
[c2] [j6] [c1]
28Jeff Rearick
[c9]
29John J. Shedletsky
[j4]
30Stephen K. Sunter (Steve Sunter)
[c23]
31Mick Tegethoff
[c6] [j7]
32Bill Tuthill
[c27]
33Thomas W. Williams
[j5]

Colors in the list of coauthors

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