| 2005 | ||
|---|---|---|
| j1 | Lei Dong, John A. Patten, Jimmie A. Miller: In-situ infrared detection and heating of metallic phase of silicon during scratching test. IJMTM 7(5/6): 530-539 (2005) | |
| 1 | Lei Dong | |
| 2 | Jimmie A. Miller |
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