Michael Pecht

Francesco Di Maio, J. Hu, Peter W. Tse, Michael Pecht, K. Tsui, Enrico Zio: Ensemble-approaches for clustering health status of oil sand pumps. Expert Syst. Appl. 39(5): 4847-4859 (2012)

Sachin Kumar, Nikhil M. Vichare, Eli Dolev, Michael Pecht: A health indicator method for degradation detection of electronic products. Microelectronics Reliability 52(2): 439-445 (2012)

Michael Pecht: Nvidia's GPU failures: A case for prognostics and health management. Microelectronics Reliability 52(6): 953-957 (2012)

Xiaohang Jin, Eden W. M. Ma, L. L. Cheng, Michael Pecht: Health Monitoring of Cooling Fans Based on Mahalanobis Distance With mRMR Feature Selection. IEEE T. Instrumentation and Measurement 61(8): 2222-2229 (2012)

Jon G. Elerath, Michael Pecht: IEEE 1413: A Standard for Reliability Predictions. IEEE Transactions on Reliability 61(1): 125-129 (2012)

Kirk A. Gray, Michael Pecht: Long-Term Thermal Overstressing of Computers. IEEE Design & Test of Computers 28(6): 58-65 (2011)

C.-H. Wu, C.-H. Yang, S.-C. Lo, Nikhil M. Vichare, E. Rhem, Michael Pecht: Automatic data mining for telemetry database of computer systems. Microelectronics Reliability 51(2): 263-269 (2011)

Gang Niu, Satnam Singh, Steven W. Holland, Michael Pecht: Health monitoring of electronic products based on Mahalanobis distance and Weibull decision metrics. Microelectronics Reliability 51(2): 279-284 (2011)

Mohammed A. Alam, Michael H. Azarian, Michael D. Osterman, Michael Pecht: Temperature and voltage aging effects on electrical conduction mechanism in epoxy-BaTiO₃ composite dielectric used in embedded capacitors. Microelectronics Reliability 51(5): 946-952 (2011)

Sachin Kumar, Eli Dolev, Michael Pecht: Parameter selection for health monitoring of electronic products. Microelectronics Reliability 50(2): 161-168 (2010)

Michael Pecht, Rubyca Jaai: A prognostics and health management roadmap for information and electronics-rich systems. Microelectronics Reliability 50(3): 317-323 (2010)

Gang Niu, Bo-Suk Yang, Michael Pecht: Development of an optimized condition-based maintenance system by data fusion and reliability-centered maintenance. Rel. Eng. & Sys. Safety 95(7): 786-796 (2010)

Vasilis A. Sotiris, Peter W. Tse, Michael Pecht: Anomaly Detection Through a Bayesian Support Vector Machine. IEEE Transactions on Reliability 59(2): 277-286 (2010)

Jon G. Elerath, Michael Pecht: A Highly Accurate Method for Assessing Reliability of Redundant Arrays of Inexpensive Disks (RAID). IEEE Trans. Computers 58(3): 289-299 (2009)

Shuang Yang, Ji Wu, Michael Pecht: Reliability Assessment of Land Grid Array Sockets Subjected to Mixed Flowing Gas Environment. IEEE Transactions on Reliability 58(4): 634-640 (2009)

Chaitanya Sankavaram, Bharath R. Pattipati, Anuradha Kodali, Krishna R. Pattipati, Mohammad Azam, Sachin Kumar, Michael Pecht: Model-based and data-driven prognosis of automotive and electronic systems. CASE 2009: 96-101

Sachin Kumar, Myra Torres, Y. C. Chan, Michael Pecht: A hybrid prognostics methodology for electronic products. IJCNN 2008: 3479-3485

Jie Gu, Donald Barker, Michael Pecht: Prognostics implementation of electronics under vibration loading. Microelectronics Reliability 47(12): 1849-1856 (2007)

Mohammadreza Keimasi, Michael H. Azarian, Michael Pecht: Isothermal aging effects on flex cracking of multilayer ceramic capacitors with standard and flexible terminations. Microelectronics Reliability 47(12): 2215-2225 (2007)

Jon G. Elerath, Michael Pecht: Enhanced Reliability Modeling of RAID Storage Systems. DSN 2007: 175-184

Michael Pecht, Yuliang Deng: Electronic device encapsulation using red phosphorus flame retardants. Microelectronics Reliability 46(1): 53-62 (2006)